Advances in X-Ray Analysis
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56

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6

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Published By Springer US

9781461399926, 9781461399902

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Compression and Compressibility Studies of Plutonium and a Plutonium-Gallium Alloy

Advances in X-Ray Analysis ◽

10.1007/978-1-4613-9990-2_27 ◽

1981 ◽

pp. 221-230 ◽

Author(s):

R. B. Roof

Keyword(s):

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NBS*AIDS80: A Fortran Program to Evaluate Crystallographic Data

Advances in X-Ray Analysis ◽

10.1007/978-1-4613-9990-2_9 ◽

1981 ◽

pp. 99-109 ◽

Author(s):

C. R. Hubbard ◽

J. K. Stalick ◽

A. D. Mighell

Keyword(s):

Fortran Program ◽

Crystallographic Data

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Glass and Glass Raw Materials Analysis Using a Philips PW1600 Wavelength Dispersive X-ray Spectrometer

Advances in X-Ray Analysis ◽

10.1007/978-1-4613-9990-2_53 ◽

1981 ◽

pp. 399-400

Author(s):

D. R. Jones ◽

G. D. Bowling

Keyword(s):

Raw Materials ◽

Materials Analysis ◽

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Monte Carlo Determinations of Optimal Photon Energies for XRF Analysis of Iodine in Vivo

Advances in X-Ray Analysis ◽

10.1007/978-1-4613-9990-2_49 ◽

1981 ◽

pp. 371-376 ◽

Author(s):

T. Grönberg ◽

S. Mattsson

Keyword(s):

Monte Carlo ◽

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Improving the Detection Limit in Wavelength Dispersive XRF

Advances in X-Ray Analysis ◽

10.1007/978-1-4613-9990-2_43 ◽

1981 ◽

pp. 333-335 ◽

Author(s):

Heikki Sipilä

Keyword(s):

Detection Limit

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Use of Compton Scattering in X-ray Fluorescence for Determination of Ash in Indian Coal

Advances in X-Ray Analysis ◽

10.1007/978-1-4613-9990-2_41 ◽

1981 ◽

pp. 323-327 ◽

Author(s):

H. D. Pandey ◽

R. Haque ◽

V. Ramaswamy

Keyword(s):

Compton Scattering ◽

X Ray ◽

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Porotectosilicate Structure Determination from Model Building

Advances in X-Ray Analysis ◽

10.1007/978-1-4613-9990-2_4 ◽

1981 ◽

pp. 49-61 ◽

Author(s):

George T. Kokotailo ◽

John L. Schlenker

Keyword(s):

Structure Determination ◽

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Stress Measurement in Stainless Steel by Use of Monochromatic Cr-Kβ X-rays and a Position Sensitive Detector

Advances in X-Ray Analysis ◽

10.1007/978-1-4613-9990-2_18 ◽

1981 ◽

pp. 167-172 ◽

Author(s):

Yasuo Yoshioka ◽

Ken-ichi Hasegawa ◽

Koh-ichi Mochiki

Keyword(s):

Stainless Steel ◽

Stress Measurement ◽

Position Sensitive Detector ◽

X Rays ◽

Sensitive Detector ◽

Position Sensitive

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Reproducibility and Precision of Measurements of Guinier Powder Patterns Using Powdered Silicon Calibrant

Advances in X-Ray Analysis ◽

10.1007/978-1-4613-9990-2_10 ◽

1981 ◽

pp. 111-120 ◽

Author(s):

A. Brown ◽

J. W. Edmonds ◽

C. M. Foris

Keyword(s):

Powdered Silicon

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Qualitative Phase Analysis Using an X-Ray Powder Diffractometer

Advances in X-Ray Analysis ◽

10.1007/978-1-4613-9990-2_8 ◽

1981 ◽

pp. 91-97 ◽

Author(s):

W. N. Schreiner ◽

C. Surdukowski ◽

R. Jenkins

Keyword(s):

Phase Analysis ◽

X Ray ◽

Powder Diffractometer ◽

Qualitative Phase

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