Use of Compton Scattering in X-ray Fluorescence for Determination of Ash in Indian Coal

1981 ◽  
pp. 323-327 ◽  
Author(s):  
H. D. Pandey ◽  
R. Haque ◽  
V. Ramaswamy
Keyword(s):  
Compton Scattering ◽  
X Ray ◽  
Indian Coal

Use of Compton Scattering in X-Ray Fluorescence for Determination of Ash in Indian Coal

1980 ◽  
Vol 24 ◽  
pp. 323-327
Author(s):  
H. D. Pandey ◽  
R. Haque ◽  
V. Ramaswamy
Keyword(s):  
Compton Scattering ◽  
Regression Equation ◽  
Fluorescence Method ◽  
Fluorescent Intensity ◽  
X Ray ◽  
Indian Coal ◽  
Conventional Methods

AbstractX-ray fluorescence method using Compton scattering for the determination of ash in coal has been systematically studied for application to Indian Coal. Fluorescent intensities from major constituents such as Al2O3, SiO2, TiO2, Fe2O3, CaO and their various combinations were used in conjunction with the reciprocal of the Cr Kα Compton intensity in a regression equation. Varying degrees of correlations were obtained between the values of ash determined by conventional methods and those calculated from X-ray data. It is found that Ti fluorescent intensity plays a major role in the regression equation and its contribution cannot be ignored if the Cr X-ray tube is used.

Rapid Determination of Ash in Coal by Compton Scattering, Ca, and Fe X-Ray Fluorescence

1979 ◽  
Vol 23 ◽  
pp. 45-55 ◽  
Author(s):  
Jacques Renault
Keyword(s):  
New Mexico ◽  
Fluorescence Spectroscopy ◽  
Absorption Coefficient ◽  
Compton Scattering ◽  
Rapid Determination ◽  
Ash Content ◽  
Average Error ◽  
Compton Wavelength ◽  
X Ray

AbstractThe intensity of Compton scattering, Fe, and Ca chatacteristic radiation can be used to estimate the amount of ash in coal by Xray fluorescence spectroscopy. Mo, W, and Cr radiation were used to study a suite of New Mexico coals, and the best results were obtained with Mo and W X-ray tubes. If the actual concentrations of Fe2O3 and CaO and the mass absorption coefficient, μ*, at the Compton wavelength of scattered Mo K radiation can be determined, the regression equation:%Ash - 24.2μ* - 6.28(%Fe2O3) - 1.96(%CaO) - 3.4estimates the ash content with an average error of 0.5% ash at 0.71Å.

Bestimmung der Röntgen-Debye-Temperatur aus dem Borrmann-Effekt in Germanium / Determination of the X-ray Debye Temperature in Germanium by Means of the Borrmann Effect

1973 ◽  
Vol 28 (7) ◽  
pp. 1204-1213 ◽  
Author(s):  
J. Ludewig
Keyword(s):  
Temperature Dependence ◽  
Compton Scattering ◽  
Debye Temperature ◽  
Low Temperatures ◽  
Room Temperature ◽  
Perfect Crystal ◽  
Photoelectric Absorption ◽  
Temperature Dependent ◽  
X Ray

The anomal transmission of CuK radiation through "thick"' perfect crystal slices of Germanium is strongly temperature dependent. This temperature dependence was measured between 293 and 6 K in the (220) symmetric Laue case and used to evaluate the Debye temperature θM . The wellknown uncorrected value θ′M = 290K was obtained near room temperature. Taking into account TDS and Compton scattering in addition to the photoelectric absorption the corrected value θM = 294 or 296 K was found, depending on the source of data. With decreasing temperature the corrected θM increases slightly up to a maximum at very low temperatures, as predicted by Batterman and Chipman and by Salter.

Use of Compton scattering measurements for attenuation corrections in Rietveld phase analysis with an external standard

1998 ◽  
Vol 13 (3) ◽  
pp. 166-170 ◽  
Author(s):  
S. Pratapa ◽  
B. H. O’Connor ◽  
I-M. Low
Keyword(s):  
Compton Scattering ◽  
Phase Analysis ◽  
Ceramic Composite ◽  
Internal Standard ◽  
Mass Attenuation Coefficient ◽  
Typical Application ◽  
X Ray ◽  
External Standard ◽  
Zirconia Powders

Mass attenuation coefficient corrections, for Rietveld phase analysis with an external compositional calibration standard, may be made using Compton scattering intensities measured by X-ray fluorescence spectrometry. The method is mainly useful for Rietveld phase analysis when mixing an internal standard is impossible or undesirable. The validity of the method has been demonstrated using a suite of alumina-zirconia powders of known composition. Also presented are results for a typical application—determination of phase composition depth profiles defining the graded compositional character of an aluminium titanate/zirconia-alumina ceramic composite.

Calibration of the monochromator bandpass function for the X-ray Rietveld analysis

1997 ◽  
Vol 12 (3) ◽  
pp. 160-166 ◽  
Author(s):  
P. Riello ◽  
P. Canton ◽  
G. Fagherazzi
Keyword(s):  
Experimental Determination ◽  
Compton Scattering ◽  
Rietveld Analysis ◽  
Experimental Setup ◽  
X Ray ◽  
Fitting Procedure ◽  
Present Procedure ◽  
Graphite Monochromator

In this paper we propose a fitting procedure to describe the bandpass effect on all x radiation that passes through a focusing graphite monochromator used on the diffracted beam. The proposed bandpass function is: M(2θ)=1/(1+Kmon1sKmon2), with s=(2 sin θ)/λ, where Kmon1 and Kmon2 are constants which have been refined by means of a Rietveld analysis, using a physically modeled background (Riello et al., J. Appl. Crystallogr. 28, 115–120). We have investigated two polycrystalline powders: α-Al2O3 and a mixture of α and β-Si3N4. The so-obtained bandpass functions for these materials are close enough to conclude that they depend only on the used experimental setup (in the present case the X-Pert-Philips diffractometer with a graphite focusing monochromator). Knowledge of the bandpass function is important to suitably model the Compton scattering, which is a component of the background scattering. The present procedure allows one to avoid the direct experimental determination of the bandpass function, which requires the use of another monochromator (analyzer) and another tube with an intense white spectrum.

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