Stress Measurement in Stainless Steel by Use of Monochromatic Cr-Kβ X-rays and a Position Sensitive Detector

1981 ◽  
pp. 167-172 ◽  
Author(s):  
Yasuo Yoshioka ◽  
Ken-ichi Hasegawa ◽  
Koh-ichi Mochiki
Keyword(s):  
Stainless Steel ◽  
Stress Measurement ◽  
Position Sensitive Detector ◽  
X Rays ◽  
Sensitive Detector ◽  
Position Sensitive

Stress Measurement in Stainless Steel by use of Monochromatic Cr-Kβ X-Rays and a Position Sensitive Detector

1980 ◽  
Vol 24 ◽  
pp. 167-172 ◽  
Author(s):  
Yasuo Yoshioka ◽  
Ken-ichi Hasegawa ◽  
Koh-ichi Mochiki
Keyword(s):  
Residual Stress ◽  
Stainless Steel ◽  
Stress Measurement ◽  
Diffraction Peak ◽  
X Rays ◽  
High Contrast ◽  
Sensitive Detector ◽  
X Ray ◽  
Position Sensitive ◽  
Martensite Structure

X-ray stress analysis in austenltic stainless steel is generally carried out on the ϒFe(311) diffraction line produced by Cr- Kβ X-rays. However, it is often pointed out that not much reliance can be placed on the precision of the stress because the contrast between a diffraction peak and its background is poor. In addition, to measure the stress is sometimes impossible on a specimen which has martensite structure produced by thes train induced transformation, because the ϒFe(211) line appears in the neighborhood of the desired ϒFe(311) line, since Cr-K6 X-rays accompany Cr-Ka from a conventional X-ray source. If Cr-Ka X-rays can be eliminated and only Cr-KB X-rays directed on the specimen, only the λe(311) line with high contrast will be obtained and one can expect to measure the residual stress with high precision.

The Use of Mn-Kα X-Rays and a New Model of PSPC in Stress Analysis of Stainless Steel

1982 ◽  
Vol 26 ◽  
pp. 209-216 ◽  
Author(s):  
Yasuo Yoshioka ◽  
Ken-ichi Hasegawa ◽  
Koh-ichi Mochiki
Keyword(s):  
Stainless Steel ◽  
Stress Analysis ◽  
High Precision ◽  
Proportional Counter ◽  
Stress Measurement ◽  
X Rays ◽  
New Model ◽  
Major Disadvantage ◽  
Position Sensitive

The authors previously reported stress measurement in stainless steel by the use of monochromatic Cr-Kβ X-rays and a position sensitive proportional counter. Results indicated that a stress value can be obtained with high precision on account of the subtraction of background and the elimination of αFe(211) peak by Cr-Kα X-rays. The major disadvantage of this method, however, is that the intensity of Kβ X-rays monochromatized is essentially weak and it is complicated to eliminate Kα X-rays for practical use.

Flat-cone diffractometer utilizing a linear position-sensitive detector

1978 ◽  
Vol 11 (3) ◽  
pp. 173-178 ◽  
Author(s):  
E. Prince ◽  
A. Wlodawer ◽  
A. Santoro
Keyword(s):  
Data Collection ◽  
Position Sensitive Detector ◽  
X Rays ◽  
Sensitive Detector ◽  
Diffraction Geometry ◽  
Data Rates ◽  
Common Plane ◽  
Mathematical Formulas ◽  
Position Sensitive ◽  
Position Sensitive Detectors

The recent development of linear position-sensitive detectors for neutrons and X-rays leads to the possibility of large improvements in the efficiency of data collection in single-crystal diffractometers. In order to take advantage of the properties of a linear position-sensitive detector it is desirable to use a diffraction geometry which causes the diffracted beams from many different reflecting planes to lie in a common plane. A design for a diffractometer utilizing the flat-cone geometry is described, and the relevant mathematical formulas are summarized. An instrument using this design has been constructed as a modification to an existing four-circle diffractometer and is now operating. Practical details of its construction, of the collection and handling of data, and of data rates are discussed.

A New Position Sensitive Detector for X-Ray Diffractometry

1992 ◽  
Vol 36 ◽  
pp. 617-622
Author(s):  
J. L. Radtke ◽  
D. W. Beard
Keyword(s):  
Position Sensitive Detector ◽  
Data Sets ◽  
X Rays ◽  
Sensitive Detector ◽  
Detector Performance ◽  
X Ray ◽  
Time Quantum ◽  
Position Sensitive ◽  
Diffraction Patterns ◽  
The Impact

AbstractPosition sensitive detectors provide efficient X-ray detection over large solid angles; this capability has revolutionized X-ray diffractometry by reducing data collection time. This paper describes testing of a new single-axis position sensitive detector designed to locate 0.6-2 Angstrom X-rays. Dead time, quantum efficiency, energy resolution, and spatial resolution were measured. Standard powder diffraction patterns were observed with the detector, and data sets are presented. The impact of detector performance parameters on diffraction experiments is discussed.

Use of Cr K-Beta X-Rays and Position Sensitive Detector for Residual Stress Measurement in Stainless Steel Pipe

1978 ◽  
Vol 22 ◽  
pp. 247-249 ◽  
Author(s):  
C. O. Ruud ◽  
C. S. Barrett
Keyword(s):  
Stainless Steel ◽  
Stress Measurement ◽  
Steel Pipe ◽  
X Rays ◽  
University Of Denver ◽  
Stainless Steel Pipe ◽  
Position Sensitive ◽  
The University ◽  
Research Institute

Residual stresses on the inner surface of stainless steel pipe used in nuclear reactors are of exceptional importance. Apparatus for measuring these in situ, in welded lengths of 10-inch diameter austenitic (304) stainless pipe has been developed at the University of Denver Research Institute under the sponsorship of the Electric Power Research Institute.

Comparison of Stress Measurements by X-Rays with Three Different Detectors and a Strongly Fluorescing Specimen

1978 ◽  
Vol 22 ◽  
pp. 241-246 ◽  
Author(s):  
M. R. James ◽  
J. B. Cohen
Keyword(s):  
Solid State ◽  
Scintillation Detector ◽  
Position Sensitive Detector ◽  
X Rays ◽  
Sensitive Detector ◽  
Diffraction Profile ◽  
High Background ◽  
Solid State Detector ◽  
Position Sensitive ◽  
State Detector

Measurements on the heat affected zone of a weldment are presented using a gas filled position sensitive detector and a normal diffractometer equipped with a scintillation detector and a solid state detector. The sample, a surface ground titanium alloy, provided a difficult application for the X-ray technique from which a test of the real usefulness of the position sensitive detector could be made. The diffraction profile from the Ti alloy is very broad and the fluorescence produces a high background. The fluorescence is easily rejected using a solid state detector; however, the time of analysis is very long. With the position sensitive detector, the combination of increased energy discrimination over the scintillation detector and the simultaneous measurement of many data points over the broad peak enabled the measurements to be made for the same accuracy in much shorter times than for either the solid state detector or the scintillation detector.

Crystal structure determination of lithium diborate hydrate, LiB2O3(OH).H2O, from X-ray powder diffraction data collected with a curved position-sensitive detector

1992 ◽  
Vol 25 (5) ◽  
pp. 617-623 ◽  
Author(s):  
D. Louër ◽  
M. Louër ◽  
M. Touboul
Keyword(s):  
Crystal Structure ◽  
Powder Diffraction ◽  
Diffraction Data ◽  
Structural Model ◽  
Rietveld Method ◽  
Position Sensitive Detector ◽  
X Rays ◽  
Sensitive Detector ◽  
Powder Diffraction Data ◽  
Position Sensitive

The crystal structure of lithium diborate hydrate, LiB2O3(OH).H2O, has been solved ab initio and refined by the Rietveld method from powder diffraction data collected with a curved position-sensitive detector (INEL CPS120) using Debye–Scherrer diffraction geometry with monochromatic X-rays. In the first stage the indexing of the powder pattern was performed by the successive dichotomy method from data collected with a diffractometer using Bragg–Brentano geometry. The lattice parameters are a = 9.7984 (10), b = 8.2759 (7) and c = 9.6138 (8) Å and the space group is Pnna. The structural model was obtained from direct methods and two difference Fourier maps. The Rietveld refinement converged to final crystal structure and profile indicators RF = 0.05, RB = 0.05, Rp = 0.03 and Rwp = 0.04. The structure consists of BO4 tetrahedra (T) and BO2(OH) triangles (Δ) sharing corners in order to form infinite chains along [010], with the shorthand notation 3:∞1(Δ + 2T). The particular linkage of the B3O3 rings leads to a new diborate anion {[B2O3(OH)] n− n }, in which two tetrahedral B atoms have an occupation factor of 0.5. Li atoms, tetrahedrally surrounded by four O atoms, three belonging to separate chains and one to a water molecule maintain the cohesion of the structure.

TOXIC CHROMIUM ANALYSED BY PIXE

1992 ◽  
Vol 02 (03) ◽  
pp. 305-308 ◽  
Author(s):  
FINN FOLKMANN
Keyword(s):  
High Resolution ◽  
Heavy Ions ◽  
Chemical Compounds ◽  
Position Sensitive Detector ◽  
X Rays ◽  
Sensitive Detector ◽  
Position Sensitive

Exciting different Cr-containing chemical compounds with heavy ions, e.g. 1.4 MeV/u 12C16O and 35Cl K x rays from Cr were measured with high resolution by diffraction in a curved crystal and with a position sensitive detector. Small differences are seen for different compounds and valancy states 3 and 6 of Cr (6 is toxic).

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