Nano-CMOS and Post-CMOS Electronics: Devices and Modelling
Latest Publications

TOTAL DOCUMENTS

14

(FIVE YEARS 0)

H-INDEX

1

(FIVE YEARS 0)

Published By Institution Of Engineering And Technology

9781849199971, 9781849199988

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Timing driven buffer insertion for carbon nanotube interconnects

Nano-CMOS and Post-CMOS Electronics: Devices and Modelling ◽

10.1049/pbcs029e_ch10 ◽

2016 ◽

pp. 287-312 ◽

Author(s):

Lin Liu ◽

Shiyan Hu ◽

Yuchen Zhou

Keyword(s):

Carbon Nanotube ◽

Buffer Insertion

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Back Matter

Nano-CMOS and Post-CMOS Electronics: Devices and Modelling ◽

10.1049/pbcs029e_bm ◽

2016 ◽

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FinFET and reliability considerations of next-generation processors

Nano-CMOS and Post-CMOS Electronics: Devices and Modelling ◽

10.1049/pbcs029e_ch7 ◽

2016 ◽

pp. 213-236

Author(s):

Ying Zhang ◽

Shaoming Chen ◽

Sui Chen ◽

Lu Peng

Keyword(s):

Next Generation

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Nanoscale high-κ/metal-gate CMOS and FinFET based logic libraries

Nano-CMOS and Post-CMOS Electronics: Devices and Modelling ◽

10.1049/pbcs029e_ch6 ◽

2016 ◽

pp. 169-212

Author(s):

Yanambaka ◽

Mohanty ◽

Kougianos ◽

Ghai

Keyword(s):

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Junction and doping-free transistors for future computing

Nano-CMOS and Post-CMOS Electronics: Devices and Modelling ◽

10.1049/pbcs029e_ch5 ◽

2016 ◽

pp. 139-168

Author(s):

Sahu ◽

Singh

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Anodic metal-insulator-metal (MIM) capacitors

Nano-CMOS and Post-CMOS Electronics: Devices and Modelling ◽

10.1049/pbcs029e_ch3 ◽

2016 ◽

pp. 61-98

Author(s):

Kannadassan ◽

Mallick ◽

Baghini

Keyword(s):

Metal Insulator ◽

Metal Insulator Metal ◽

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Front Matter

Nano-CMOS and Post-CMOS Electronics: Devices and Modelling ◽

10.1049/pbcs029e_fm ◽

2016 ◽

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High mobility n and p channels on gallium arsenide and silicon substrates using interfacial misfit dislocation arrays

Nano-CMOS and Post-CMOS Electronics: Devices and Modelling ◽

10.1049/pbcs029e_ch2 ◽

2016 ◽

pp. 35-60

Keyword(s):

Gallium Arsenide ◽

Misfit Dislocation ◽

High Mobility ◽

Silicon Substrates ◽

Dislocation Arrays

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High-κ dielectrics and device reliability

Nano-CMOS and Post-CMOS Electronics: Devices and Modelling ◽

10.1049/pbcs029e_ch1 ◽

2016 ◽

pp. 1-34

Author(s):

Bhuyian ◽

Misra

Keyword(s):

Device Reliability

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Multiple-independent-gate nanowire transistors: from technology to advanced SoC design

Nano-CMOS and Post-CMOS Electronics: Devices and Modelling ◽

10.1049/pbcs029e_ch8 ◽

2016 ◽

pp. 237-264

Author(s):

Gaillardon ◽

Amaru ◽

Jian Zhang ◽

De Micheli

Keyword(s):

Nanowire Transistors ◽

Independent Gate

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