Advances in X-Ray Analysis
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76

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3

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Published By Springer US

9781461366676, 9781461537441

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

A Method for X-Ray Stress Analysis of Thin Films and Its Application to Zinc-Nickel-Alloy Electroplated Steel

Advances in X-Ray Analysis ◽

10.1007/978-1-4615-3744-1_74 ◽

1991 ◽

pp. 699-709

Author(s):

Toshihiko Sasaki ◽

Makoto Kuramoto ◽

Yasuo Yoshioka

Keyword(s):

Thin Films ◽

Stress Analysis ◽

Nickel Alloy ◽

X Ray ◽

Zinc Nickel

X-Ray Elastic Constants for β-SiC and Residual Stress Anisotropy in a Hot-Pressed Al2O3/SiC(Whisker) Composite

Advances in X-Ray Analysis ◽

10.1007/978-1-4615-3744-1_68 ◽

1991 ◽

pp. 643-650

Author(s):

Paul Predecki ◽

Alias Abuhasan ◽

Charles S. Barrett

Keyword(s):

Residual Stress ◽

Elastic Constants ◽

X Ray ◽

Stress Anisotropy

Use of X-Ray Diffraction Using Gaussian Curve Method for Measuring Plastic Strain of Steels

Advances in X-Ray Analysis ◽

10.1007/978-1-4615-3744-1_67 ◽

1991 ◽

pp. 633-642

Author(s):

Masanori Kurita ◽

Kenzo Chiaki

Keyword(s):

Plastic Strain ◽

X Ray Diffraction ◽

X Ray ◽

Gaussian Curve ◽

Curve Method

The Thickness Measurements of Thin Bulk Film By X-Ray Method

Advances in X-Ray Analysis ◽

10.1007/978-1-4615-3744-1_61 ◽

1991 ◽

pp. 567-575 ◽

Cited By ~ 1

Author(s):

Y. Hirose ◽

N. Takano ◽

Y. Nanayama ◽

T. Mura

Keyword(s):

Ray Method ◽

X Ray ◽

Bulk Film ◽

Thickness Measurements

Substructure-Magnetic Property Correlation in Fe/Ag Composite Thin Films

Advances in X-Ray Analysis ◽

10.1007/978-1-4615-3744-1_60 ◽

1991 ◽

pp. 557-565

Author(s):

C. P. Reed ◽

R. J. DeAngelis ◽

Y. X. Zhang ◽

S. H. Liou ◽

R. J. Jacob

Keyword(s):

Thin Films ◽

Magnetic Property ◽

Composite Thin Films ◽

Property Correlation

High-Temperature XRD Analysis of Polymers

Advances in X-Ray Analysis ◽

10.1007/978-1-4615-3744-1_50 ◽

1991 ◽

pp. 459-463

Author(s):

Robert W. Green

Keyword(s):

High Temperature ◽

Xrd Analysis ◽

High Temperature Xrd

Quantification of Carbamazepine in Tablets by Powder X-Ray Diffractometry

Advances in X-Ray Analysis ◽

10.1007/978-1-4615-3744-1_46 ◽

1991 ◽

pp. 417-427

Author(s):

R. Suryanarayanan

Keyword(s):

X Ray

Wide Angle and Small Angle X-Ray Scattering Applications Using a Two-Dimensional Area Detector

Advances in X-Ray Analysis ◽

10.1007/978-1-4615-3744-1_40 ◽

1991 ◽

pp. 363-368

Author(s):

B. G. Landes ◽

R. A. Newman ◽

P. R. Rudolf

Keyword(s):

Small Angle ◽

Wide Angle ◽

Two Dimensional ◽

X Ray ◽

Area Detector ◽

X Ray Scattering ◽

Ray Scattering

Measurement of Mass Absorption Coefficients Using Compton-Scattered Cu Radiation in X-Ray Diffraction Analysis

Advances in X-Ray Analysis ◽

10.1007/978-1-4615-3744-1_36 ◽

1991 ◽

pp. 325-335 ◽

Cited By ~ 3

Author(s):

Steve J. Chipera ◽

David L. Bish

Keyword(s):

Diffraction Analysis ◽

X Ray Diffraction ◽

Absorption Coefficients ◽

X Ray ◽

Mass Absorption

Secondary Target X-Ray Excitation for in Vivo Measurement of Lead in Bone

Advances in X-Ray Analysis ◽

10.1007/978-1-4615-3744-1_31 ◽

1991 ◽

pp. 293-298

Author(s):

P. A. Pella ◽

C. G. Soares

Keyword(s):

X Ray ◽

Secondary Target ◽

In Vivo Measurement