ICMTS 1998. Proceedings of 1998 International Conference on Microelectronic Test Structures (Cat. No.98CH36157)
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Strategy to disentangle multiple faults to identify random defects within test structures

ICMTS 1998. Proceedings of 1998 International Conference on Microelectronic Test Structures (Cat. No.98CH36157) ◽

10.1109/icmts.1998.688058 ◽

2002 ◽

Cited By ~ 6

Author(s):

C. Hess ◽

L.H. Weiland

Keyword(s):

Multiple Faults ◽

Random Defects

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A new characterization method for accurate capacitor matching measurements using pseudo-floating gate test structures in submicron CMOS and BiCMOS technologies

ICMTS 1998. Proceedings of 1998 International Conference on Microelectronic Test Structures (Cat. No.98CH36157) ◽

10.1109/icmts.1998.688096 ◽

2002 ◽

Cited By ~ 3

Author(s):

O. Roux dit Buisson ◽

G. Morin ◽

F. Paillardet ◽

E. Mazaleyrat

Keyword(s):

Floating Gate ◽

Submicron Cmos

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Requirements and challenges for lithography...beyond 193 nm optics

ICMTS 1998. Proceedings of 1998 International Conference on Microelectronic Test Structures (Cat. No.98CH36157) ◽

10.1109/icmts.1998.688029 ◽

2002 ◽

Author(s):

J. Canning

Keyword(s):

193 Nm

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300 mm evaluation activities in Selete

ICMTS 1998. Proceedings of 1998 International Conference on Microelectronic Test Structures (Cat. No.98CH36157) ◽

10.1109/icmts.1998.688022 ◽

2002 ◽

Cited By ~ 2

Author(s):

K. Fujiwara

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Prediction of AC performance of double-polysilicon bipolar transistors from e-test parameters: An experiment

ICMTS 1998. Proceedings of 1998 International Conference on Microelectronic Test Structures (Cat. No.98CH36157) ◽

10.1109/icmts.1998.688059 ◽

2002 ◽

Author(s):

S.C. Kelly ◽

E.C. Griffith ◽

J.A. Power ◽

M. O'Neill

Keyword(s):

Bipolar Transistors ◽

Test Parameters

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Direct extraction of SPICE Gummel-Poon parameters for high frequency modeling

ICMTS 1998. Proceedings of 1998 International Conference on Microelectronic Test Structures (Cat. No.98CH36157) ◽

10.1109/icmts.1998.688047 ◽

2002 ◽

Cited By ~ 2

Author(s):

J.W. Breti ◽

J.D. Kendall ◽

L. Nathawad

Keyword(s):

High Frequency ◽

Direct Extraction

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Statistical characterization of 0.18 μm low-power CMOS process using efficient parameter extraction

ICMTS 1998. Proceedings of 1998 International Conference on Microelectronic Test Structures (Cat. No.98CH36157) ◽

10.1109/icmts.1998.688055 ◽

2002 ◽

Author(s):

K.G. McCarthy ◽

E.V. Saavedra Diaz ◽

D.B.M. Klaassen ◽

A. Mathewson

Keyword(s):

Low Power ◽

Parameter Extraction ◽

Cmos Process ◽

Statistical Characterization ◽

Low Power Cmos

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A new test structure for evaluation of extrinsic oxide breakdown

ICMTS 1998. Proceedings of 1998 International Conference on Microelectronic Test Structures (Cat. No.98CH36157) ◽

10.1109/icmts.1998.688068 ◽

2002 ◽

Cited By ~ 1

Author(s):

K. Shiga ◽

J. Komori ◽

M. Katsumata ◽

A. Teramoto ◽

M. Sekine

Keyword(s):

Test Structure ◽

Oxide Breakdown

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New method for monitoring of analogue processes-evaluation of the impact of metalisation on the performance of precise analogue resistors

ICMTS 1998. Proceedings of 1998 International Conference on Microelectronic Test Structures (Cat. No.98CH36157) ◽

10.1109/icmts.1998.688026 ◽

2002 ◽

Author(s):

A. Pergoot ◽

P. Cox ◽

P. Vercruysse ◽

I. Wuyts ◽

P. Raes

Keyword(s):

New Method ◽

The Impact

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Measurement of '1/f' noise in narrow poly-silicon emitter bipolar transistor structures

ICMTS 1998. Proceedings of 1998 International Conference on Microelectronic Test Structures (Cat. No.98CH36157) ◽

10.1109/icmts.1998.688060 ◽

2002 ◽

Author(s):

S.D. Connor

Keyword(s):

Bipolar Transistor ◽

Poly Silicon

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ICMTS 1998. Proceedings of 1998 International Conference on Microelectronic Test Structures (Cat. No.98CH36157)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Strategy to disentangle multiple faults to identify random defects within test structures

A new characterization method for accurate capacitor matching measurements using pseudo-floating gate test structures in submicron CMOS and BiCMOS technologies

Requirements and challenges for lithography...beyond 193 nm optics

300 mm evaluation activities in Selete

Prediction of AC performance of double-polysilicon bipolar transistors from e-test parameters: An experiment

Direct extraction of SPICE Gummel-Poon parameters for high frequency modeling

Statistical characterization of 0.18 μm low-power CMOS process using efficient parameter extraction

A new test structure for evaluation of extrinsic oxide breakdown

New method for monitoring of analogue processes-evaluation of the impact of metalisation on the performance of precise analogue resistors

Measurement of '1/f' noise in narrow poly-silicon emitter bipolar transistor structures

ICMTS 1998. Proceedings of 1998 International Conference on Microelectronic Test Structures (Cat. No.98CH36157)
Latest Publications