Statistical Quality Technologies - ICSA Book Series in Statistics
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Published By Springer International Publishing

9783030207083, 9783030207090

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Enhanced Cumulative Sum Charts Based on Ranked Set Sampling

Statistical Quality Technologies - ICSA Book Series in Statistics ◽

10.1007/978-3-030-20709-0_4 ◽

2019 ◽

pp. 79-108 ◽

Cited By ~ 1

Author(s):

Mu’azu Ramat Abujiya ◽

Muhammad Hisyam Lee

Keyword(s):

Ranked Set Sampling ◽

Cumulative Sum ◽

Cumulative Sum Charts

Statistical System Monitoring (SSM) for Enterprise-Level Quality Control

Statistical Quality Technologies - ICSA Book Series in Statistics ◽

10.1007/978-3-030-20709-0_3 ◽

2019 ◽

pp. 55-78

Author(s):

Siim Koppel ◽

Shing I Chang

Keyword(s):

Quality Control ◽

Statistical System ◽

System Monitoring ◽

Enterprise Level

Defects Driven Yield and Reliability Modeling for Semiconductor Manufacturing

Statistical Quality Technologies - ICSA Book Series in Statistics ◽

10.1007/978-3-030-20709-0_16 ◽

2019 ◽

pp. 375-393

Author(s):

Tao Yuan ◽

Suk Joo Bae ◽

Yue Kuo

Keyword(s):

Semiconductor Manufacturing ◽

Reliability Modeling

Bayesian Sequential Design Based on Dual Objectives for Accelerated Life Tests

Statistical Quality Technologies - ICSA Book Series in Statistics ◽

10.1007/978-3-030-20709-0_11 ◽

2019 ◽

pp. 257-275 ◽

Cited By ~ 1

Author(s):

Lu Lu ◽

I-Chen Lee ◽

Yili Hong

Keyword(s):

Sequential Design ◽

Accelerated Life Tests ◽

Accelerated Life ◽

Life Tests ◽

Dual Objectives

Some Recent Studies in Statistical Process Control

Statistical Quality Technologies - ICSA Book Series in Statistics ◽

10.1007/978-3-030-20709-0_1 ◽

2019 ◽

pp. 3-19 ◽

Cited By ~ 4

Author(s):

Peihua Qiu

Keyword(s):

Process Control ◽

Statistical Process Control ◽

Statistical Process

Time Truncated Life Tests Using the Generalized Multiple Dependent State Sampling Plans for Various Life Distributions

Statistical Quality Technologies - ICSA Book Series in Statistics ◽

10.1007/978-3-030-20709-0_7 ◽

2019 ◽

pp. 153-182

Author(s):

Muhammad Aslam ◽

Gadde Srinivasa Rao ◽

Mohammed Albassam

Keyword(s):

Sampling Plans ◽

Life Tests ◽

Life Distributions ◽

Dependent State

A Degradation Model Based on the Wiener Process Assuming Non-Normal Distributed Measurement Errors

Statistical Quality Technologies - ICSA Book Series in Statistics ◽

10.1007/978-3-030-20709-0_13 ◽

2019 ◽

pp. 297-329

Author(s):

Yan Shen ◽

Li-Juan Shen ◽

Wang-Tu Xu

Keyword(s):

Wiener Process ◽

Measurement Errors ◽

Degradation Model ◽

Model Based ◽

Distributed Measurement

Statistical Quality Control and Reliability Analysis Using the Birnbaum-Saunders Distribution with Industrial Applications

Statistical Quality Technologies - ICSA Book Series in Statistics ◽

10.1007/978-3-030-20709-0_2 ◽

2019 ◽

pp. 21-53 ◽

Cited By ~ 1

Author(s):

Víctor Leiva ◽

Carolina Marchant ◽

Fabrizio Ruggeri ◽

Helton Saulo

Keyword(s):

Quality Control ◽

Reliability Analysis ◽

Industrial Applications ◽

Statistical Quality Control ◽

Statistical Quality

An Introduction of Generalized Linear Model Approach to Accelerated Life Test Planning with Type-I Censoring

Statistical Quality Technologies - ICSA Book Series in Statistics ◽

10.1007/978-3-030-20709-0_14 ◽

2019 ◽

pp. 331-346

Author(s):

Rong Pan ◽

Kangwon Seo

Keyword(s):

Linear Model ◽

Generalized Linear Model ◽

Accelerated Life Test ◽

Type I ◽

Life Test ◽

Test Planning ◽

Type I Censoring ◽

Accelerated Life ◽

Model Approach

Economical Sampling Plans with Warranty

Statistical Quality Technologies - ICSA Book Series in Statistics ◽

10.1007/978-3-030-20709-0_9 ◽

2019 ◽

pp. 211-230

Author(s):

Jyun-You Chiang ◽

Hon Keung Tony Ng ◽

Tzong-Ru Tsai ◽

Yuhlong Lio ◽

Ding-Geng Chen

Keyword(s):

Sampling Plans

Statistical Quality Technologies - ICSA Book Series in StatisticsLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By Springer International Publishing

Enhanced Cumulative Sum Charts Based on Ranked Set Sampling

Statistical System Monitoring (SSM) for Enterprise-Level Quality Control

Defects Driven Yield and Reliability Modeling for Semiconductor Manufacturing

Bayesian Sequential Design Based on Dual Objectives for Accelerated Life Tests

Some Recent Studies in Statistical Process Control

Time Truncated Life Tests Using the Generalized Multiple Dependent State Sampling Plans for Various Life Distributions

A Degradation Model Based on the Wiener Process Assuming Non-Normal Distributed Measurement Errors

Statistical Quality Control and Reliability Analysis Using the Birnbaum-Saunders Distribution with Industrial Applications

An Introduction of Generalized Linear Model Approach to Accelerated Life Test Planning with Type-I Censoring

Economical Sampling Plans with Warranty

Statistical Quality Technologies - ICSA Book Series in Statistics
Latest Publications