2020 13th International Conference on Advanced Semiconductor Devices And Microsystems (ASDAM)
Latest Publications

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(FIVE YEARS 44)

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Published By IEEE

9781728197760

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Special oscillators

2020 13th International Conference on Advanced Semiconductor Devices And Microsystems (ASDAM) ◽

10.1109/asdam50306.2020.9393848 ◽

2020 ◽

Author(s):

Julius Foit ◽

Miroslav Husak

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Trends in Fan Out Wafer Level Packaging

2020 13th International Conference on Advanced Semiconductor Devices And Microsystems (ASDAM) ◽

10.1109/asdam50306.2020.9393840 ◽

2020 ◽

Author(s):

Horst Theuss ◽

Christian Geissler ◽

Walter Hartner

Keyword(s):

Wafer Level ◽

Wafer Level Packaging

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The novel concept of a portable human stress-meter

2020 13th International Conference on Advanced Semiconductor Devices And Microsystems (ASDAM) ◽

10.1109/asdam50306.2020.9393870 ◽

2020 ◽

Author(s):

E. Vavrinsky ◽

H. Svobodova ◽

M. Kopani ◽

V. Stopjakova

Keyword(s):

The Novel ◽

Human Stress ◽

Novel Concept

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Incremental Capacity Analysis for Prediction of Li-Ion Battery Degradation Mechanisms: Simulation Study

2020 13th International Conference on Advanced Semiconductor Devices And Microsystems (ASDAM) ◽

10.1109/asdam50306.2020.9393834 ◽

2020 ◽

Author(s):

M. Kemeny ◽

P. Ondrejka ◽

M. Mikolasek

Keyword(s):

Simulation Study ◽

Capacity Analysis ◽

Li Ion Battery ◽

Degradation Mechanisms ◽

Battery Degradation ◽

Incremental Capacity ◽

Li Ion

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Gamma spectrometry of semi-insulating GaAs detectors degraded by 5 MeV electrons up to 2 MGy

2020 13th International Conference on Advanced Semiconductor Devices And Microsystems (ASDAM) ◽

10.1109/asdam50306.2020.9393842 ◽

2020 ◽

Author(s):

A. Sagatova ◽

B. Zat'ko ◽

E. Kovacova ◽

V. Necas

Keyword(s):

Gamma Spectrometry

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Organic pentacene and fullerene C60 inverters: the influence of gate dielectric

2020 13th International Conference on Advanced Semiconductor Devices And Microsystems (ASDAM) ◽

10.1109/asdam50306.2020.9393844 ◽

2020 ◽

Author(s):

Miroslav Novota ◽

Michal Sobota ◽

Michal Micjan ◽

Martin Weis

Keyword(s):

Gate Dielectric ◽

Fullerene C60

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Title Page

2020 13th International Conference on Advanced Semiconductor Devices And Microsystems (ASDAM) ◽

10.1109/asdam50306.2020.9393853 ◽

2020 ◽

Keyword(s):

Title Page

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Investigation of Mg contact on SI-GaAs

2020 13th International Conference on Advanced Semiconductor Devices And Microsystems (ASDAM) ◽

10.1109/asdam50306.2020.9393847 ◽

2020 ◽

Author(s):

F. Dubecky ◽

P. Hubik ◽

G. Vanko ◽

B. Zatko ◽

P. Bohacek ◽

...

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Copper oxide field-effect transistor fabricated by sol-gel method

2020 13th International Conference on Advanced Semiconductor Devices And Microsystems (ASDAM) ◽

10.1109/asdam50306.2020.9393830 ◽

2020 ◽

Author(s):

Tomas Vincze ◽

Michal Micjan ◽

Martin Weis

Keyword(s):

Copper Oxide ◽

Field Effect ◽

Field Effect Transistor ◽

Sol Gel ◽

Gel Method ◽

Sol Gel Method ◽

Effect Transistor

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Flexible inkjet sensor fabricated by inkjet printing

2020 13th International Conference on Advanced Semiconductor Devices And Microsystems (ASDAM) ◽

10.1109/asdam50306.2020.9393831 ◽

2020 ◽

Author(s):

Adam Vadzak ◽

Juraj Nevrela ◽

Michal Micjan ◽

Martin Weis

Keyword(s):

Inkjet Printing

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2020 13th International Conference on Advanced Semiconductor Devices And Microsystems (ASDAM)Latest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Special oscillators

Trends in Fan Out Wafer Level Packaging

The novel concept of a portable human stress-meter

Incremental Capacity Analysis for Prediction of Li-Ion Battery Degradation Mechanisms: Simulation Study

Gamma spectrometry of semi-insulating GaAs detectors degraded by 5 MeV electrons up to 2 MGy

Organic pentacene and fullerene C60 inverters: the influence of gate dielectric

Title Page

Investigation of Mg contact on SI-GaAs

Copper oxide field-effect transistor fabricated by sol-gel method

Flexible inkjet sensor fabricated by inkjet printing

2020 13th International Conference on Advanced Semiconductor Devices And Microsystems (ASDAM)
Latest Publications