2009 25th Annual IEEE Semiconductor Thermal Measurement and Management Symposium
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9781424436644

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Notes

2009 25th Annual IEEE Semiconductor Thermal Measurement and Management Symposium ◽

10.1109/stherm.2009.4810732 ◽

2009 ◽

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Adaptive multiple cooling surfaces Compact Thermal Model (CTM), and boundary condition independent multiple heat sources CTM

2009 25th Annual IEEE Semiconductor Thermal Measurement and Management Symposium ◽

10.1109/stherm.2009.4810769 ◽

2009 ◽

Cited By ~ 1

Author(s):

Patrick Tounsi ◽

Jean-Baptiste Sauveplane ◽

Jerzy Piotr Nowakowski ◽

Francesc Madrid ◽

Jean-Marie Dorkel

Keyword(s):

Boundary Condition ◽

Thermal Model ◽

Heat Sources

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Notes

2009 25th Annual IEEE Semiconductor Thermal Measurement and Management Symposium ◽

10.1109/stherm.2009.4810786 ◽

2009 ◽

Download Full-text

Welcome to SEMI-THERM'25

2009 25th Annual IEEE Semiconductor Thermal Measurement and Management Symposium ◽

10.1109/stherm.2009.4810727 ◽

2009 ◽

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Performance characterization of pressure sensitive adhesive thermal interface materials

2009 25th Annual IEEE Semiconductor Thermal Measurement and Management Symposium ◽

10.1109/stherm.2009.4810779 ◽

2009 ◽

Author(s):

Herman Chu ◽

Anusha Selvakumar

Keyword(s):

Thermal Interface Materials ◽

Pressure Sensitive Adhesive ◽

Performance Characterization ◽

Thermal Interface ◽

Pressure Sensitive ◽

Interface Materials

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Transient thermal imaging of pulsed-operation superlattice micro-refrigerators

2009 25th Annual IEEE Semiconductor Thermal Measurement and Management Symposium ◽

10.1109/stherm.2009.4810741 ◽

2009 ◽

Cited By ~ 9

Author(s):

J. Christofferson ◽

Y. Ezzahri ◽

K. Maize ◽

A. Shakouri

Keyword(s):

Thermal Imaging ◽

Transient Thermal

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SEMI-THERM® proceedings 2009

2009 25th Annual IEEE Semiconductor Thermal Measurement and Management Symposium ◽

10.1109/stherm.2009.4810787 ◽

2009 ◽

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Validation and sensitivity analysis of an image processing technique to derive thermal conductivity variation within a printed circuit board

2009 25th Annual IEEE Semiconductor Thermal Measurement and Management Symposium ◽

10.1109/stherm.2009.4810746 ◽

2009 ◽

Cited By ~ 5

Author(s):

Byron Blackmore

Keyword(s):

Thermal Conductivity ◽

Image Processing ◽

Sensitivity Analysis ◽

Printed Circuit Board ◽

Processing Technique ◽

Circuit Board ◽

Image Processing Technique ◽

Printed Circuit ◽

Conductivity Variation ◽

Thermal Conductivity Variation

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Nozzle track and CHF prediction of spray cooling for inclined sprays

2009 25th Annual IEEE Semiconductor Thermal Measurement and Management Symposium ◽

10.1109/stherm.2009.4810764 ◽

2009 ◽

Author(s):

Yong-xian Guo ◽

Jian-yuan Jia ◽

Jian-tao Chang ◽

Huan-ling Liu ◽

Shao-rong Zhou

Keyword(s):

Spray Cooling

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Pressure drop for laminar flow in microchannels of arbitrary cross-sections

2009 25th Annual IEEE Semiconductor Thermal Measurement and Management Symposium ◽

10.1109/stherm.2009.4810751 ◽

2009 ◽

Cited By ~ 3

Author(s):

Zhipeng Duan ◽

M. M. Yovanovich

Keyword(s):

Pressure Drop ◽

Laminar Flow ◽

Cross Sections

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2009 25th Annual IEEE Semiconductor Thermal Measurement and Management SymposiumLatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By IEEE

Notes

Adaptive multiple cooling surfaces Compact Thermal Model (CTM), and boundary condition independent multiple heat sources CTM

Notes

Welcome to SEMI-THERM'25

Performance characterization of pressure sensitive adhesive thermal interface materials

Transient thermal imaging of pulsed-operation superlattice micro-refrigerators

SEMI-THERM® proceedings 2009

Validation and sensitivity analysis of an image processing technique to derive thermal conductivity variation within a printed circuit board

Nozzle track and CHF prediction of spray cooling for inclined sprays

Pressure drop for laminar flow in microchannels of arbitrary cross-sections

2009 25th Annual IEEE Semiconductor Thermal Measurement and Management Symposium
Latest Publications