Mitigating Harmful Effects of Climate Warming on Ceiling Paintings by Ceiling Insulation: An Evaluation Using Timed IR Imaging and Numeric Modelling

Due to climate change, ceiling paintings in many historic buildings are subjected to increasingly high short-term temperature change, resulting in high thermal tension caused by the construction assembly. This article focuses on the combined use of timed IR imaging and numeric modelling to evaluate insulation measures on the upper side of a ceiling to reduce thermal tensions in the painting layers, overheating in summer as well as cooling down in winter. As a model room, the southern splendour stair hall in the Burgtheater Vienna was chosen. Famous ceiling paintings created from 1886 to 1888 by Gustav Klimt and his brother Ernst Klimt can be found on this ceiling. The results show that timed IR imaging is an adequate tool to study the transient thermal behaviour of ceiling paintings which are not accessible to standard sensor measurements. Moreover, it could be shown that the presented measurement technique is well suited to validate a numeric model. The latter was applied to evaluate the potential insulation on the top of the ceiling. It was shown that cooling loads and energy loss in the room underneath can be reduced and most importantly the thermal stress in painting layers is reduced. The findings are relevant as, due to global warming, the current situation in many buildings is worsening. Considering the great intangible cultural value of many ceiling paintings, the application of the presented evaluation strategy for building physical boundaries on a ceiling with paintings seems to be appropriate.

Effects of Transient Thermal Shock on the Microstructure and Mechanical Properties of CoCrFeNiMn High-Entropy Alloy Coatings

CoCrFeNiMn high-entropy alloy (HEA) has great potential for engineering application due to its good ductility and high fracture toughness at low temperature. It can be deposited on components as coatings to take advantage of its excellent properties and reduce the cost. In this study, CoCrFeNiMn HEA coatings were deposited on 316L stainless steel substrates by atmospheric plasma spraying (APS) technique, and a series of transient thermal shock tests were performed. It was found that the coatings contained two main phases: a face-centered cubic (FCC) solid solution phase and a flocculent oxides phase. The elemental contents of Co, Cr, Fe, and Ni were close to equal atomic percentage in the coating, while Mn was reduced significantly. The oxygen was mainly distributed in the dark flocculent oxides phase. After transient thermal shock tests, these two phases remained stable, but some tiny cracks appeared on the surface. Meanwhile, the microhardness of the coating after transient thermal shock tests also showed stable, ∼ 420 HV. Weibull statistics were used to analyze the reliability of the microhardness, and the Weibull modulus m was distributed from 9 to 15. The CoCrFeNiMn HEA coating exhibited high phase stability and excellent properties under transient thermal shock, making it have service advantages in extreme environments, especially in the fields of the development of future nuclear and aerospace structural materials.

Selected Problems of Power MOSFETs Thermal Parameters Measurements

In the paper, selected problems that are related to the measurements of thermal parameters of power MOSFETs that are placed on a common heat sink are analysed. The application of the indirect electrical method, the contact method, and the optical method in measuring self and mutual transient thermal impedances of these transistors is presented. The circuits that are required to perform measurements are presented and described. The errors of measurements are assessed for each of the considered methods. In the case of the indirect electrical method, an additional influence of the selection of a thermo-sensitive parameter and the function approximating thermometric characteristics on the measurement error are taken into consideration. The measurement results of the thermal parameters of the investigated transistors that were obtained using the considered measurement methods in various supply conditions are presented and discussed.