Springer Proceedings in Physics - Semiconductor Interfaces
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28

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Published By Springer Berlin Heidelberg

9783642729690, 9783642729676

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Recent Progress in Electron Spectroscopy: Application to the Local Geometry Determination at Surfaces and Interfaces

Springer Proceedings in Physics - Semiconductor Interfaces ◽

10.1007/978-3-642-72967-6_8 ◽

1987 ◽

pp. 102-108

Author(s):

J. Derrien

Keyword(s):

Electron Spectroscopy ◽

Recent Progress ◽

Local Geometry ◽

Surfaces And Interfaces

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XANES and XARS for Semiconductor Interface Studies

Springer Proceedings in Physics - Semiconductor Interfaces ◽

10.1007/978-3-642-72967-6_7 ◽

1987 ◽

pp. 88-101

Author(s):

G. Rossi

Keyword(s):

Semiconductor Interface

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Atomic Structure of Semiconductor Surfaces

Springer Proceedings in Physics - Semiconductor Interfaces ◽

10.1007/978-3-642-72967-6_4 ◽

1987 ◽

pp. 48-65

Author(s):

G. Le Lay

Keyword(s):

Atomic Structure ◽

Semiconductor Surfaces

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Formation of Semiconductor Interfaces During Molecular Beam Epitaxy

Springer Proceedings in Physics - Semiconductor Interfaces ◽

10.1007/978-3-642-72967-6_2 ◽

1987 ◽

pp. 10-42 ◽

Author(s):

K. Ploog

Keyword(s):

Molecular Beam Epitaxy ◽

Molecular Beam ◽

Semiconductor Interfaces

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Surface Characterization by Low-Energy Ion Scattering

Springer Proceedings in Physics - Semiconductor Interfaces ◽

10.1007/978-3-642-72967-6_14 ◽

1987 ◽

pp. 150-159

Author(s):

E. Taglauer

Keyword(s):

Surface Characterization ◽

Ion Scattering ◽

Low Energy Ion Scattering

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Surface and Interface Studies with MeV Ion Beams

Springer Proceedings in Physics - Semiconductor Interfaces ◽

10.1007/978-3-642-72967-6_13 ◽

1987 ◽

pp. 134-149

Author(s):

C. Cohen

Keyword(s):

Ion Beams ◽

Surface And Interface

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Field Emission Microscopy for Analysis of Semiconductor Surfaces

Springer Proceedings in Physics - Semiconductor Interfaces ◽

10.1007/978-3-642-72967-6_12 ◽

1987 ◽

pp. 126-133 ◽

Author(s):

V. T. Binh

Keyword(s):

Field Emission ◽

Semiconductor Surfaces ◽

Field Emission Microscopy ◽

Emission Microscopy

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Scanning Tunneling Microscopy and Spectroscopy

Springer Proceedings in Physics - Semiconductor Interfaces ◽

10.1007/978-3-642-72967-6_11 ◽

1987 ◽

pp. 119-125

Author(s):

F. Salvan

Keyword(s):

Scanning Tunneling Microscopy ◽

Scanning Tunneling ◽

Tunneling Microscopy

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Admittance Spectroscopy of Interface States in Metal/Semiconductor Contacts

Springer Proceedings in Physics - Semiconductor Interfaces ◽

10.1007/978-3-642-72967-6_22 ◽

1987 ◽

pp. 282-287

Author(s):

P. Muret

Keyword(s):

Interface States ◽

Admittance Spectroscopy ◽

Semiconductor Contacts

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Perspectives on Formation and Properties of Semiconductor Interfaces

Springer Proceedings in Physics - Semiconductor Interfaces ◽

10.1007/978-3-642-72967-6_28 ◽

1987 ◽

pp. 372-388 ◽

Author(s):

R. S. Bauer ◽

R. H. Miles ◽

T. C. McGill

Keyword(s):

Semiconductor Interfaces

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