Eleventh IEEE European Test Symposium (ETS'06)
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scholarly journals Retention-Aware Test Scheduling for BISTed Embedded SRAMs

2006 ◽  
Author(s):  
Qiang Xu ◽  
Baosheng Wang ◽  
F.Y. Young
Keyword(s):  
Test Scheduling

scholarly journals Enhancing Delay Fault Coverage through Low Power Segmented Scan

2006 ◽  
Author(s):  
Zhuo Zhang ◽  
S.M. Reddy ◽  
I. Pomeranz ◽  
Pomeranz ◽  
J. Rajski ◽  
...  
Keyword(s):  
Low Power ◽  
Fault Coverage ◽  
Delay Fault

scholarly journals Single-Event Upset Analysis and Protection in High Speed Circuits

2006 ◽  
Author(s):  
M. Hosseinabady ◽  
P. Lotfi-Kamran ◽  
G. Di Natale ◽  
S. Di Carlo ◽  
A. Benso ◽  
...  
Keyword(s):  
High Speed ◽  
Single Event Upset ◽  
Single Event

Fault Injection-based Reliability Evaluation of SoPCs

2006 ◽  
Author(s):  
M.S. Reorda ◽  
L. Sterpone ◽  
M. Violante ◽  
M. Portela-Garcia ◽  
C. Lopez-Ongil ◽  
...  
Keyword(s):  
Fault Injection ◽  
Reliability Evaluation

Low Cost Parametric Failure Diagnosis of RF Transceivers

2006 ◽  
Author(s):  
Donghoon Han ◽  
S. Goyal ◽  
S. Bhattacharya ◽  
A. Chatterjee
Keyword(s):  
Low Cost ◽  
Failure Diagnosis ◽  
Rf Transceivers ◽  
Parametric Failure

Convolutional Compactors with Variable Polynomials

2006 ◽  
Author(s):  
A. Pogiel ◽  
J. Rajski ◽  
J. Tyszer
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