Insulating Films on Semiconductors
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Published By Springer Berlin Heidelberg

9783642682490, 9783642682476
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SiO2 Interface Degradation and Minority Carrier Lifetime Effects of Laser Beam Processing

1981 ◽  
pp. 238-241
Author(s):  
V. G. I. Deshmukh ◽  
A. G. Cullis ◽  
H. C. Webber ◽  
N. G. Chew ◽  
D. V. McCaughan
Keyword(s):  
Laser Beam ◽  
Carrier Lifetime ◽  
Minority Carrier ◽  
Minority Carrier Lifetime ◽  
Lifetime Effects

Buried Oxide Layers Formed by Oxygen Implantation for Potential Use in Dielectrically Isolated ICs

1981 ◽  
pp. 228-231
Author(s):  
K. V. Anand ◽  
P. Pang ◽  
J. B. Butcher ◽  
K. Das ◽  
E. Franks ◽  
...  
Keyword(s):  
Oxide Layers ◽  
Oxygen Implantation ◽  
Buried Oxide ◽  
Potential Use

EPR on MOS Interface States

1981 ◽  
pp. 150-160 ◽  
Author(s):  
Edward H. Poindexter ◽  
Philip J. Caplan
Keyword(s):  
Interface States
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