Neutral Scattering Centers Near the Si/SiO2-Interface of MOSFET Devices Prepared by TCE Oxidation
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1989 ◽
Vol 6
(2)
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pp. 153-156
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2005 ◽
Vol 80
(6)
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pp. 1517-1522
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2017 ◽
Vol 9
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pp. 1339-1343
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