Reflection, Scattering, and Diffraction from Surfaces VII
Latest Publications

TOTAL DOCUMENTS

(FIVE YEARS 19)

H-INDEX

(FIVE YEARS 0)

Published By SPIE

9781510637764, 9781510637771

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Front Matter: Volume 11485

Reflection, Scattering, and Diffraction from Surfaces VII ◽

10.1117/12.2581570 ◽

2020 ◽

Keyword(s):

Matter Volume

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Augmenting CASI® BRDF measurement device to measure out-of-plane scatter with CCD pixel array

Reflection, Scattering, and Diffraction from Surfaces VII ◽

10.1117/12.2568050 ◽

2020 ◽

Author(s):

Todd V. Small ◽

Samuel D. Butler ◽

Michael A. Marciniak

Keyword(s):

Measurement Device ◽

Pixel Array ◽

Out Of Plane

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Development of a new image based BRDF measurement system using a semicircular ring

Reflection, Scattering, and Diffraction from Surfaces VII ◽

10.1117/12.2568347 ◽

2020 ◽

Author(s):

Seul Ki Yang ◽

In-Ung Song ◽

Eunsong Oh ◽

Ho-Soon Yang ◽

Sug-Whan Kim

Keyword(s):

Measurement System

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Performance enhancement of WDM-PONs: Interferometric noise reduction

Reflection, Scattering, and Diffraction from Surfaces VII ◽

10.1117/12.2568330 ◽

2020 ◽

Author(s):

Martina N. Wadie ◽

Moustafa H. Aly

Keyword(s):

Noise Reduction ◽

Performance Enhancement ◽

Interferometric Noise

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Biomedical diagnostics with multi-wavelength wide-field imaging Mueller polarimetry

Reflection, Scattering, and Diffraction from Surfaces VII ◽

10.1117/12.2567960 ◽

2020 ◽

Author(s):

Tatiana Novikova

Keyword(s):

Wide Field ◽

Multi Wavelength ◽

Biomedical Diagnostics ◽

Field Imaging ◽

Wide Field Imaging

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BSDF measurements and analyses of specular samples using a table-top goniometer in support of remote sensing instruments

Reflection, Scattering, and Diffraction from Surfaces VII ◽

10.1117/12.2569290 ◽

2020 ◽

Author(s):

Jinan Zeng ◽

James J. Butler ◽

Xiaoxiong Xiong ◽

Anita K. Thompson ◽

Robert R. Bousquet

Keyword(s):

Remote Sensing

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Induced polarization response within a spheroidal particle from an incident electromagnetic wave

Reflection, Scattering, and Diffraction from Surfaces VII ◽

10.1117/12.2570530 ◽

2020 ◽

Author(s):

Michael E. Thomas ◽

Richard I. Joseph

Keyword(s):

Electromagnetic Wave ◽

Induced Polarization ◽

Spheroidal Particle ◽

Incident Electromagnetic Wave ◽

Polarization Response

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Direct method of extracting complex refractive index from routine Fourier transform infrared reflectance/transmittance measurements

Reflection, Scattering, and Diffraction from Surfaces VII ◽

10.1117/12.2568502 ◽

2020 ◽

Author(s):

Braden Czapla ◽

Leonard M. Hanssen

Keyword(s):

Refractive Index ◽

Fourier Transform ◽

Direct Method ◽

Complex Refractive Index ◽

Fourier Transform Infrared ◽

Infrared Reflectance

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Spatial frequency domain Mueller matrix imaging to distinguish between birefringent materials in depth

Reflection, Scattering, and Diffraction from Surfaces VII ◽

10.1117/12.2568553 ◽

2020 ◽

Author(s):

Joseph Chue-Sang ◽

Thomas A. Germer

Keyword(s):

Spatial Frequency ◽

Frequency Domain ◽

Mueller Matrix ◽

Spatial Frequency Domain

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Comparison of the accuracy of Rayleigh-Rice polarization factors to improve microfacet pBRDF models

Reflection, Scattering, and Diffraction from Surfaces VII ◽

10.1117/12.2568042 ◽

2020 ◽

Author(s):

Rachel L. Wolfgang ◽

Samuel D. Butler ◽

Michael A. Marciniak

Download Full-text

Reflection, Scattering, and Diffraction from Surfaces VIILatest Publications

TOTAL DOCUMENTS

H-INDEX

Published By SPIE

Front Matter: Volume 11485

Augmenting CASI® BRDF measurement device to measure out-of-plane scatter with CCD pixel array

Development of a new image based BRDF measurement system using a semicircular ring

Performance enhancement of WDM-PONs: Interferometric noise reduction

Biomedical diagnostics with multi-wavelength wide-field imaging Mueller polarimetry

BSDF measurements and analyses of specular samples using a table-top goniometer in support of remote sensing instruments

Induced polarization response within a spheroidal particle from an incident electromagnetic wave

Direct method of extracting complex refractive index from routine Fourier transform infrared reflectance/transmittance measurements

Spatial frequency domain Mueller matrix imaging to distinguish between birefringent materials in depth

Comparison of the accuracy of Rayleigh-Rice polarization factors to improve microfacet pBRDF models

Reflection, Scattering, and Diffraction from Surfaces VII
Latest Publications