2012 IEEE 30th VLSI Test Symposium (VTS)
Latest Publications

TOTAL DOCUMENTS

60

(FIVE YEARS 0)

H-INDEX

10

(FIVE YEARS 0)

Published By IEEE

9781467310741, 9781467310734, 9781467310727

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Transition delay fault testing of 3D ICs with IR-drop study

2012 IEEE 30th VLSI Test Symposium (VTS) ◽

10.1109/vts.2012.6231065 ◽

2012 ◽

Cited By ~ 4

Author(s):

Shreepad Panth ◽

Sung Kyu Lim

Keyword(s):

Fault Testing ◽

Delay Fault ◽

Delay Fault Testing ◽

Ir Drop ◽

3D Ics ◽

Transition Delay

Download Full-text

A Bayesian-based process parameter estimation using IDDQ current signature

2012 IEEE 30th VLSI Test Symposium (VTS) ◽

10.1109/vts.2012.6231085 ◽

2012 ◽

Cited By ~ 5

Author(s):

Michihiro Shintani ◽

Takashi Sato

Keyword(s):

Parameter Estimation ◽

Process Parameter ◽

Current Signature

Download Full-text

Ping-pong test: Compact test vector generation for reversible circuits

2012 IEEE 30th VLSI Test Symposium (VTS) ◽

10.1109/vts.2012.6231097 ◽

2012 ◽

Cited By ~ 10

Author(s):

Masoud Zamani ◽

Mehdi B. Tahoori ◽

Krishnendu Chakrabarty

Keyword(s):

Test Vector ◽

Reversible Circuits ◽

Vector Generation ◽

Ping Pong ◽

Test Vector Generation ◽

Compact Test

Download Full-text

Derating based hardware optimizations in soft error tolerant designs

2012 IEEE 30th VLSI Test Symposium (VTS) ◽

10.1109/vts.2012.6231067 ◽

2012 ◽

Cited By ~ 1

Author(s):

V Prasanth ◽

Virendra Singh ◽

Rubin Parekhji

Keyword(s):

Soft Error ◽

Hardware Optimizations

Download Full-text

VTS 2011 Best Paper Award

2012 IEEE 30th VLSI Test Symposium (VTS) ◽

10.1109/vts.2012.6231109 ◽

2012 ◽

Author(s):

Paolo Prinetto ◽

Peter Maxwell ◽

Prab Varma ◽

Adit Singh ◽

Claude Thibeault

Keyword(s):

Paper Award

Download Full-text

Test generation for subtractive specification errors

2012 IEEE 30th VLSI Test Symposium (VTS) ◽

10.1109/vts.2012.6231063 ◽

2012 ◽

Author(s):

Patricia S. Lee ◽

Ian G. Harris

Keyword(s):

Test Generation ◽

Specification Errors

Download Full-text

Foreword

2012 IEEE 30th VLSI Test Symposium (VTS) ◽

10.1109/vts.2012.6231110 ◽

2012 ◽

Author(s):

Cecilia Metra ◽

Claude Thibeault

Download Full-text

Net diagnosis using stuck-at and transition fault models

2012 IEEE 30th VLSI Test Symposium (VTS) ◽

10.1109/vts.2012.6231106 ◽

2012 ◽

Cited By ~ 2

Author(s):

Lixing Zhao ◽

Vishwani D. Agrawal

Keyword(s):

Fault Models ◽

Transition Fault

Download Full-text

Self-adaptive power gating with test circuit for on-line characterization of energy inflection activity

2012 IEEE 30th VLSI Test Symposium (VTS) ◽

10.1109/vts.2012.6231077 ◽

2012 ◽

Cited By ~ 1

Author(s):

Amit Ranjan Trivedi ◽

Saibal Mukhopadhyay

Keyword(s):

Power Gating ◽

Test Circuit ◽

On Line ◽

Adaptive Power ◽

Self Adaptive

Download Full-text

Test of phase interpolators in high speed I/Os using a sliding window search

2012 IEEE 30th VLSI Test Symposium (VTS) ◽

10.1109/vts.2012.6231092 ◽

2012 ◽

Author(s):

Ji Hwan Chun ◽

Siew Mooi Lim ◽

Shao Chee Ong ◽

Jae Wook Lee ◽

Jacob A. Abraham

Keyword(s):

High Speed ◽

Sliding Window

Download Full-text