High-Resolution X-Ray Diffraction Techniques for Structural Characterization of Silicon and Other Advanced Materials

2004 ◽  
pp. 93-114
Author(s):  
Krishan Lal
Keyword(s):  
High Resolution ◽  
Structural Characterization ◽  
Advanced Materials ◽  
X Ray Diffraction ◽  
X Ray

Structural characterization of La2−xMxCuO4 (M = Sr,Ba) samples by synchrotron x-ray and neutron powder diffraction techniques

1988 ◽  
Vol 3 (6) ◽  
pp. 1327-1335 ◽  
Author(s):  
D. E. Cox ◽  
S. C. Moss ◽  
R. L. Meng ◽  
P. H. Hor ◽  
C. W. Chu
Keyword(s):  
High Resolution ◽  
Rietveld Refinement ◽  
Powder Diffraction ◽  
Structural Characterization ◽  
Neutron Powder Diffraction ◽  
Superconducting Properties ◽  
X Ray Diffraction ◽  
Neutron Data ◽  
X Ray

High-resolution synchrotron x-ray powder diffraction studies on samples of La2−xMxCuO4 (M = Sr,Ba) prepared by standard ceramic techniques show that macroscopic compositional inhomogeneities may exist that are unlikely to be revealed by conventional x-ray diffraction methods. Rietveld refinement of neutron data collected at 200, 50, and 11 K from one such sample, nominally La1.8Sr0.2CuO4, gave satisfactory fits to a tetragonal structure of K2NiF4 type at all three temperatures. However, careful individual peak fits revealed that part of the sample transforms to orthorhombic between 200 and 50 K. It is suggested that this multiphase character has an important influence on the superconducting properties.

Compositional and Structural Characterization of Heterostructure InGaN-Based Light-Emitting Diode by High Resolution X-Ray Diffraction

2012 ◽  
Vol 620 ◽  
pp. 22-27 ◽  
Author(s):  
Ahmad Hadi Ali ◽  
Ahmad Shuhaimi ◽  
Hassan Zainuriah ◽  
Yushamdan Yusof
Keyword(s):  
High Resolution ◽  
Dislocation Density ◽  
Structural Characterization ◽  
Light Emitting Diode ◽  
X Ray Diffraction ◽  
Rocking Curve ◽  
Light Emitting ◽  
X Ray ◽  
Multi Quantum Well

This paper focuses on the compositional and structural characterization of InGaN-based light-emitting diode (LED) using high resolution x-ray diffraction (HRXRD) system. The LED was epitaxially grown on Si (111) substrate that comprises of In0.11Ga0.89N multi-quantum-well (MQW) active layer. Phase analysis 2θ-scan proved the composition of GaN (0002) and (0004) at 34.63oand 72.98o, respectively. Rocking curveφ-scan showed six significant peaks of the hexagonal GaN structures with consistent angular gaps of ~60o. From x-ray rocking curve (XRC)ω-scan, screw and mix dislocation density is found as 2.85 × 109cm-2, while pure edge dislocation density is found as 2.23 × 1011cm-2.

Structural characterization of Si1 − x Gex ultrathin quantum wells in a Si matrix by high-resolution X-ray diffraction

2002 ◽  
Vol 47 (6) ◽  
pp. 1058-1062
Author(s):  
A. M. Afanas’ev ◽  
M. A. Chuev ◽  
R. M. Imamov ◽  
É. Kh. Mukhamedzhanov ◽  
M. M. Rzaev ◽  
...  
Keyword(s):  
High Resolution ◽  
Quantum Wells ◽  
Structural Characterization ◽  
X Ray Diffraction ◽  
X Ray

Structural Characterization of InAs/(GaIn)Sb Superlattices for IR Optoelectronics

1996 ◽  
Vol 421 ◽  
Author(s):  
J. Wagner ◽  
J. Schmitz ◽  
F. Fuchs ◽  
U. Weimar ◽  
N. Herres ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
High Resolution ◽  
Molecular Beam Epitaxy ◽  
Structural Characterization ◽  
Molecular Beam ◽  
Alloy Composition ◽  
Structural Quality ◽  
X Ray Diffraction ◽  
X Ray

AbstractWe report on the structural characterization of InAs/(GaIn)Sb superlattices (SL) grown by solid-source molecular-beam epitaxy. SL periodicity and overall structural quality were assessed by high-resolution X-ray diffraction and Raman spectroscopy. Spectroscopic ellipsometry was found to be sensitive to the (GaIn)Sb alloy composition.

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