Measurement Accuracy and Sources of Error

2021 ◽  
pp. 345-357
Methodology ◽  
2007 ◽  
Vol 3 (1) ◽  
pp. 14-23 ◽  
Author(s):  
Juan Ramon Barrada ◽  
Julio Olea ◽  
Vicente Ponsoda

Abstract. The Sympson-Hetter (1985) method provides a means of controlling maximum exposure rate of items in Computerized Adaptive Testing. Through a series of simulations, control parameters are set that mark the probability of administration of an item on being selected. This method presents two main problems: it requires a long computation time for calculating the parameters and the maximum exposure rate is slightly above the fixed limit. Van der Linden (2003) presented two alternatives which appear to solve both of the problems. The impact of these methods in the measurement accuracy has not been tested yet. We show how these methods over-restrict the exposure of some highly discriminating items and, thus, the accuracy is decreased. It also shown that, when the desired maximum exposure rate is near the minimum possible value, these methods offer an empirical maximum exposure rate clearly above the goal. A new method, based on the initial estimation of the probability of administration and the probability of selection of the items with the restricted method ( Revuelta & Ponsoda, 1998 ), is presented in this paper. It can be used with the Sympson-Hetter method and with the two van der Linden's methods. This option, when used with Sympson-Hetter, speeds the convergence of the control parameters without decreasing the accuracy.


2020 ◽  
pp. 30-35
Author(s):  
Gurami N. Akhobadze

In the age of digital transformation of production processes in industry and science the development and design of intelligent flow sensors for granular and liquid substances transferring through pipelines becomes more important. With this in view new approaches for improving the accuracy of microwave flowmeters are proposed. Taking into account the characteristics ofelectromagnetic waves propagating through a pipeline, a wave scattered by inhomogeneities of the controlled medium is analyzed. Features of the transformation of the polarized scattered wave limiting the geometric dimensions of the pipeline and optimizing the values of the useful scattered signal are revealed. Expediency of collection of the information signal with orthogonal polarization of the scattered wave and through a directional coupler is substantiated. The method of estimating the measurement accuracy with reference to the signal-to-noise ratio at the input of the processing device is given. The research results can be used in cryogenic machine engineering to measure volume and mass flows of liquid cryogenic products.


Diabetes ◽  
2019 ◽  
Vol 68 (Supplement 1) ◽  
pp. 94-LB
Author(s):  
GUIDO FRECKMANN ◽  
STEFAN PLEUS ◽  
PETER WINTERGERST ◽  
DELIA WALDENMAIER ◽  
NINA R. JENDRIKE ◽  
...  

2020 ◽  
Vol 24 (1) ◽  
pp. 39-47
Author(s):  
A. P. Gonchar ◽  
V. A. Gombolevskij ◽  
A. B. Elizarov ◽  
N. S. Kulberg ◽  
V. G. Klyashtorny ◽  
...  

1954 ◽  
Vol 13 (4) ◽  
pp. 832-842 ◽  
Author(s):  
Joe V. Whiteman ◽  
P. F. Loggins ◽  
Doyle Chambers ◽  
L. S. Pope ◽  
D. F. Stephens
Keyword(s):  

Author(s):  
Dima A. Smolyansky

Abstract The visual nature of Time Domain Reflectometry (TDR) makes it a very natural technology that can assist with fault location in BGA packages, which typically have complex interweaving layouts that make standard failure analysis techniques, such as acoustic imaging and X-ray, less effective and more difficult to utilize. This article discusses the use of TDR for package failure analysis work. It analyzes in detail the TDR impedance deconvolution algorithm as applicable to electronic packaging fault location work, focusing on the opportunities that impedance deconvolution and the resulting true impedance profile opens up for such work. The article examines the TDR measurement accuracy and the comparative package failure analysis, and presents three main considerations for package failure analysis. It also touches upon the goal and the task of the failure analysts and TDR's specific signatures for the open and short connections.


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