Optimization of flexible printed circuit board’s cooling with air flow and thermal effects using response surface methodology

Purpose This study aims to investigate the interaction of independent variables [Reynolds number (Re), thermal power and the number of ball grid array (BGA) packages] and the relation of the variables with the responses [Nusselt number ((Nu) ¯ ), deflection/FPCB’s length (d/L) and von Mises stress]. The airflow and thermal effects were considered for optimizing the Re of various numbers of BGA packages with thermal power attached on flexible printed circuit board (FPCB) for optimum cooling performance with least deflection and stress by using the response surface method (RSM). Design/methodology/approach Flow and thermal effects on FPCB with heat source generated in the BGA packages have been examined in the simulation. The interactive relationship between factors (i.e. Re, thermal power and number of BGA packages) and responses (i.e. deflection over FPCB length ratio, stress and average Nusselt number) were analysed using analysis of variance. RSM was used to optimize the Re for the different number of BGA packages attached to the FPCB. Findings It is important to understand the behaviour of FPCB when exposed to both flow and thermal effects simultaneously under the operating conditions. Maximum d/L and von Misses stress were significantly affected by all parametric factors whilst (Nu)¯ is significantly affected by Re and thermal power. Optimized Re for 1–3 BGA packages with maximum thermal power applied has been identified as 21,364, 23,858 and 29,367, respectively. Practical implications This analysis offers a better interpretation of the parameter control in FPCB with optimized Re for the use of force convection electronic cooling. Optimal Re could be used as a reference in the thermal management aspect in designing the BGA package. Originality/value This research presents the parameters’ effects on the reliability and heat transfer in FPCB design. It also presents a method to optimize Re for the different number of BGA packages attached to increase the reliability in FPCB’s design.

Microstructure and Damage Evolution During Thermal Cycling of Sn-Ag-Cu Solders Containing Antimony

Antimony is attracting interest as an addition to Pb-free solders to improve thermal cycling performance in harsher conditions. Here, we investigate microstructure evolution and failure in harsh accelerated thermal cycling (ATC) of a Sn-3.8Ag-0.9Cu solder with 5.5 wt.% antimony as the major addition in two ball grid array (BGA) packages. SbSn particles are shown to precipitate on both Cu6Sn5 and as cuboids in β-Sn, with reproducible orientation relationships and a good lattice match. Similar to Sn-Ag-Cu solders, the microstructure and damage evolution were generally localised in the β-Sn near the component side where localised β-Sn misorientations and subgrains, accelerated SbSn and Ag3Sn particle coarsening, and β-Sn recrystallisation occurred. Cracks grew along the network of recrystallised grain boundaries to failure. The improved ATC performance is mostly attributed to SbSn solid-state precipitation within β-Sn dendrites, which supplements the Ag3Sn that formed in a eutectic reaction between β-Sn dendrites, providing populations of strengthening particles in both the dendritic and eutectic β-Sn.

Two-Layer Solder Resist Film with Low Young’s Modulus for High Reliability

In this paper, we reveal the development of a novel two-layer Solder Resist (SR) film with low young’s modulus which consists of low young’s modulus layer that possesses excellent adhesion to substrate and thermal resistance layer which is composed of resins with high thermal resistance and great toughness. This novel two-layer SR film exhibits superior resolution and crack resistance. Furthermore, the amount of warpage is extremely low. In general, the material with low young’s modulus and high elongation is caused from weak cross-link density, resulting in poor thermal resistance and delamination which occurs when mounting at high temperature. Herein, we can inhibit delamination successfully by this new two-layer structure film with superior thermal resistance. The Coefficient of Thermal Expansion (CTE) of conventional SR for FC-BGA is 35 ppm, and modulus is 4.5 GPa, whereas, this advanced two-layer SR film exhibits CTE of 66 ppm, and modulus of 2.3 GPa. In order to compare the crack resistance between conventional SR and newly developed two-layer SR film, the film was laminated on BGA substrate (substrate size is 50 mm × 50 mm), patterned by photolithography and cured, and then, 25 mm × 25 mm chip was mounted on a BGA substrate by flip-chip bonder. Conducting thermal cycle test (TCT) and observing the number of cracks after 1000 cycles of TCT. The crack occurrence frequency of the conventional SR is 65 %, whereas that of the new two-layer SR film is 4 %. We proved clearly that high CTE and low young’s modulus demonstrate overwhelmingly high crack resistance. Besides, high resolution of this newly developed two-layer film enabled the formation of SR opening (SRO) as small as 40 μm. From the above results, the newly developed two-layer SR film with low young’s modulus is beneficial for the next generation high-density package, especially for the outermost layer of FC-BGA packages and interposers that require higher reliability.

Heat transfer and deformation analysis of flexible printed circuit board under thermal and flow effects

Purpose The purpose of this study is to investigate heat transfer and deformation of flexible printed circuit board (FPCB) under thermal and flow effects by using fluid structure interaction. This study simulate the electronic cooling process when electronic devices are generating heat during operation at FPCB under force convection. Design/methodology/approach The thermal and flow effects on FPCB with attached ball grid array (BGA) packages have been investigated in the simulation. Effects of Reynolds number (Re), number of BGA packages attached, power supplied to the BGA packages and size of FPCB were studied. The responses in the present study are the deflection/length of FPCB (δ/L) and Nusselt number (Nu). Findings It is important to consider both thermal and flow effects at the same time for understanding the characteristic of FPCB attached with BGA under operating condition. Empirical correlation equations of Re, Prandtl number (Pr), δ/L and Nu have been established, in which the highest effect is of Re, followed by Pr and δ/L. The δ/L and Nu¯ were found to be significantly affected by most of the parametric factors. Practical implications This study provides a better understanding of the process control in FPCB assembly. Originality/value This study provides fundamental guidelines and references for the thermal coupling modelling to address reliability issues in FPCB design. It also increases the understanding of FPCB and BGA joint issues to achieve high reliability in microelectronic design.