scholarly journals Analysis of GaAs compound semiconductors and the semiconductor laser diode using electron holography, Lorentz microscopy, electron diffraction microscopy and differential phase contrast STEM

2016 ◽  
pp. 719-720
Author(s):  
Hirokazu Sasaki ◽  
Shinya Otomo ◽  
Ryuichiro Minato ◽  
Kazuo Yamamoto ◽  
Tsukasa Hirayama ◽  
...  
Keyword(s):  
Electron Diffraction ◽  
Laser Diode ◽  
Phase Contrast ◽  
Compound Semiconductors ◽  
Electron Holography ◽  
Lorentz Microscopy ◽  
Semiconductor Laser Diode ◽  
Differential Phase Contrast ◽  
Diffraction Microscopy ◽  
Electron Diffraction Microscopy

scholarly journals JECP—a Java Electron Crystallography Project

2006 ◽  
Vol 14 (5) ◽  
pp. 32-35
Author(s):  
X.Z. Li
Keyword(s):  
Electron Diffraction ◽  
Computer Programs ◽  
Public Domain ◽  
Experimental Results ◽  
Electron Crystallography ◽  
Teaching Tools ◽  
Diffraction Patterns ◽  
Diffraction Microscopy ◽  
Electron Diffraction Microscopy ◽  
Research Tools

JECP stands for a java electron crystallography project that includes a series of practical java stand-alone programs for electron diffraction/microscopy and crystallography applications. The aim of the JECP project is twofold, i) as teaching tools to show students the principles of electron diffraction/microscopy and crystallography, ii) as research tools to analyze experimental results. Although there are commercial and public domain computer programs available that allow a user to simulate electron diffraction patterns or processingHREMimages, there are always situations when we need to perform operations that are not a feature of any of the existing programs. The programs in the JECP can bemodified and extended tomeet the need in experiments.

User Access to Lorentz Microscopy at the NCEM, LBNL, Berkeley.

1998 ◽  
Vol 4 (S2) ◽  
pp. 472-473
Author(s):  
K. Verbist ◽  
C. Nelson ◽  
K. Krishnan
Keyword(s):  
Electron Microscope ◽  
Phase Contrast ◽  
Limited Range ◽  
Objective Lens ◽  
Image Filter ◽  
Lorentz Microscopy ◽  
Differential Phase ◽  
Free Sample ◽  
User Access ◽  
Differential Phase Contrast

A standard Philips CM200FEG electron microscope, without the special Lorentz lens, has been optimized for Lorentz imaging. The necessary field-free sample region is obtained by switching off the objective lens in the free lens mode. The limited range of magnification is compensated for by a post-column Gatan image filter (GIF) which magnifies by a factor of _ 20. Fresnel imaging is performed by defocusing with the diffraction lens. The use of low angle diffraction, in combination with the apertures located at the selected area aperture plane, allow Foucault imaging. The TEM analog of differential phase contrast (DPC) imaging has been implemented. This method makes it possible to obtain quantitave induction maps of the in-plane magnetization. TEM DPC is based on a series of Foucault images, recorded with different incremental beam tilts, which are processed to yield images equivalent to the quadrant signals obtained by the STEM DPC technique.

scholarly journals Texture and Phase Analysis in Nanocrystalline Ni Thin Films by Precession Electron Diffraction Microscopy

2015 ◽  
Vol 21 (S3) ◽  
pp. 1457-1458
Author(s):  
Szu-Tung Hu ◽  
Lauren Morganti ◽  
Shreyas Rajasekhara ◽  
Khalid Hattar ◽  
Paulo Ferreira
Keyword(s):  
Thin Films ◽  
Electron Diffraction ◽  
Phase Analysis ◽  
Precession Electron Diffraction ◽  
Diffraction Microscopy ◽  
Electron Diffraction Microscopy

scholarly journals The Influence of Film Thickness on the Microstructure of Nanocrystalline Nickel Films: A Precession Electron Diffraction Microscopy Study

2011 ◽  
Vol 17 (S2) ◽  
pp. 1080-1081
Author(s):  
S Rajasekhara ◽  
K Ganesh ◽  
K Hattar ◽  
J Knapp ◽  
P Ferreira
Keyword(s):  
Electron Diffraction ◽  
Film Thickness ◽  
Microscopy Study ◽  
Nanocrystalline Nickel ◽  
Nickel Films ◽  
Precession Electron Diffraction ◽  
Diffraction Microscopy ◽  
Electron Diffraction Microscopy

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

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