scholarly journals JECP—a Java Electron Crystallography Project

2006 ◽  
Vol 14 (5) ◽  
pp. 32-35
Author(s):  
X.Z. Li
Keyword(s):  
Electron Diffraction ◽  
Computer Programs ◽  
Public Domain ◽  
Experimental Results ◽  
Electron Crystallography ◽  
Teaching Tools ◽  
Diffraction Patterns ◽  
Diffraction Microscopy ◽  
Electron Diffraction Microscopy ◽  
Research Tools

JECP stands for a java electron crystallography project that includes a series of practical java stand-alone programs for electron diffraction/microscopy and crystallography applications. The aim of the JECP project is twofold, i) as teaching tools to show students the principles of electron diffraction/microscopy and crystallography, ii) as research tools to analyze experimental results. Although there are commercial and public domain computer programs available that allow a user to simulate electron diffraction patterns or processingHREMimages, there are always situations when we need to perform operations that are not a feature of any of the existing programs. The programs in the JECP can bemodified and extended tomeet the need in experiments.

scholarly journals Texture and Phase Analysis in Nanocrystalline Ni Thin Films by Precession Electron Diffraction Microscopy

2015 ◽  
Vol 21 (S3) ◽  
pp. 1457-1458
Author(s):  
Szu-Tung Hu ◽  
Lauren Morganti ◽  
Shreyas Rajasekhara ◽  
Khalid Hattar ◽  
Paulo Ferreira
Keyword(s):  
Thin Films ◽  
Electron Diffraction ◽  
Phase Analysis ◽  
Precession Electron Diffraction ◽  
Diffraction Microscopy ◽  
Electron Diffraction Microscopy

A “filmless” method of acquiring and measuring electron diffraction patterns

1996 ◽  
Vol 54 ◽  
pp. 594-595 ◽  
Author(s):  
D. C. Dufner
Keyword(s):  
Electron Diffraction ◽  
User Interaction ◽  
Computer Programs ◽  
Specific Aspect ◽  
Convenient Means ◽  
Standard Procedures ◽  
Measurement And Analysis ◽  
Diffraction Patterns

Electron diffraction is one of most widely used techniques in the characterization of specimens in the TEM. With the advent of computerization, there is a growing trend toward automation of the measurement and analysis of electron diffraction patterns (EDPs). There are a number of computer programs used for measuring, indexing, and simulating EDPs, some of which are now commercially available. Many of these programs are stand-alone programs which either perform a specific aspect of EDP analysis or require significant user interaction, particularly in the measurement phase. In some cases, the lack of suitable algorithms for measuring EDPs usually limit these programs to the extent that users still have to perform standard procedures of measuring EDPs from negatives or prints to obtain the necessary values needed to complete the execution of these programs. Here, a more convenient means for online acquisition and measurement of EDPs is presented.

scholarly journals The Influence of Film Thickness on the Microstructure of Nanocrystalline Nickel Films: A Precession Electron Diffraction Microscopy Study

2011 ◽  
Vol 17 (S2) ◽  
pp. 1080-1081
Author(s):  
S Rajasekhara ◽  
K Ganesh ◽  
K Hattar ◽  
J Knapp ◽  
P Ferreira
Keyword(s):  
Electron Diffraction ◽  
Film Thickness ◽  
Microscopy Study ◽  
Nanocrystalline Nickel ◽  
Nickel Films ◽  
Precession Electron Diffraction ◽  
Diffraction Microscopy ◽  
Electron Diffraction Microscopy

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

scholarly journals Three-dimensional electron crystallography of protein microcrystals

eLife ◽  
2013 ◽  
Vol 2 ◽  
Author(s):  
Dan Shi ◽  
Brent L Nannenga ◽  
Matthew G Iadanza ◽  
Tamir Gonen
Keyword(s):  
Electron Diffraction ◽  
Protein Structures ◽  
Three Dimensional ◽  
Electron Diffraction Data ◽  
Electron Crystallography ◽  
Electron Dose ◽  
Tilt Series ◽  
Diffraction Patterns ◽  
A New Technique

We demonstrate that it is feasible to determine high-resolution protein structures by electron crystallography of three-dimensional crystals in an electron cryo-microscope (CryoEM). Lysozyme microcrystals were frozen on an electron microscopy grid, and electron diffraction data collected to 1.7 Å resolution. We developed a data collection protocol to collect a full-tilt series in electron diffraction to atomic resolution. A single tilt series contains up to 90 individual diffraction patterns collected from a single crystal with tilt angle increment of 0.1–1° and a total accumulated electron dose less than 10 electrons per angstrom squared. We indexed the data from three crystals and used them for structure determination of lysozyme by molecular replacement followed by crystallographic refinement to 2.9 Å resolution. This proof of principle paves the way for the implementation of a new technique, which we name ‘MicroED’, that may have wide applicability in structural biology.

Computer-Aided Indexing and Simulation of Transmission Electron Diffraction Patterns

1975 ◽  
Vol 33 ◽  
pp. 222-223
Author(s):  
Prakash Rao ◽  
R. P. Goehner
Keyword(s):  
Crystal Structure ◽  
Electron Diffraction ◽  
Computer Programs ◽  
Transmission Electron Diffraction ◽  
Lattice Constants ◽  
Transmission Electron ◽  
Computer Aided ◽  
Flow Diagrams ◽  
Diffraction Patterns ◽  
Orientation Determination

The process of indexing electron diffraction patterns is well established and reasonably straightforward. However, in the more complicated crystal systems (e.g. hexagonal, rhombohedral, orthorhombic and monoclinic), indexing and orientation determination is not always simple. In order to considerably ease the tedium of routinely indexing such electron diffraction patterns, automation of the procedure has been carried out in our laboratory by the use of two computer programs written in conversational Fortran.Simplified flow diagrams of the two programs are shown in Figure 1. The first program (Figure 1a) indexes diffraction spots whose x and y coordinates are obtained from an experimental pattern and supplied, along with crystal structure, lattice constants, space group restrictions, camera constant, and the position and angle errors allowable.

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