scholarly journals Texture and Phase Analysis in Nanocrystalline Ni Thin Films by Precession Electron Diffraction Microscopy

2015 ◽  
Vol 21 (S3) ◽  
pp. 1457-1458
Author(s):  
Szu-Tung Hu ◽  
Lauren Morganti ◽  
Shreyas Rajasekhara ◽  
Khalid Hattar ◽  
Paulo Ferreira
Keyword(s):  
Thin Films ◽  
Electron Diffraction ◽  
Phase Analysis ◽  
Precession Electron Diffraction ◽  
Diffraction Microscopy ◽  
Electron Diffraction Microscopy

scholarly journals The Influence of Film Thickness on the Microstructure of Nanocrystalline Nickel Films: A Precession Electron Diffraction Microscopy Study

2011 ◽  
Vol 17 (S2) ◽  
pp. 1080-1081
Author(s):  
S Rajasekhara ◽  
K Ganesh ◽  
K Hattar ◽  
J Knapp ◽  
P Ferreira
Keyword(s):  
Electron Diffraction ◽  
Film Thickness ◽  
Microscopy Study ◽  
Nanocrystalline Nickel ◽  
Nickel Films ◽  
Precession Electron Diffraction ◽  
Diffraction Microscopy ◽  
Electron Diffraction Microscopy

Extended abstract of a paper presented at Microscopy and Microanalysis 2011 in Nashville, Tennessee, USA, August 7–August 11, 2011.

scholarly journals JECP—a Java Electron Crystallography Project

2006 ◽  
Vol 14 (5) ◽  
pp. 32-35
Author(s):  
X.Z. Li
Keyword(s):  
Electron Diffraction ◽  
Computer Programs ◽  
Public Domain ◽  
Experimental Results ◽  
Electron Crystallography ◽  
Teaching Tools ◽  
Diffraction Patterns ◽  
Diffraction Microscopy ◽  
Electron Diffraction Microscopy ◽  
Research Tools

JECP stands for a java electron crystallography project that includes a series of practical java stand-alone programs for electron diffraction/microscopy and crystallography applications. The aim of the JECP project is twofold, i) as teaching tools to show students the principles of electron diffraction/microscopy and crystallography, ii) as research tools to analyze experimental results. Although there are commercial and public domain computer programs available that allow a user to simulate electron diffraction patterns or processingHREMimages, there are always situations when we need to perform operations that are not a feature of any of the existing programs. The programs in the JECP can bemodified and extended tomeet the need in experiments.

scholarly journals A Precession Electron Diffraction and EELS Study of Beta-phase Evolution in Nano-crystalline Mg-9 wt.% Al Thin Films during Heat Treatment

2015 ◽  
Vol 21 (S3) ◽  
pp. 1463-1464
Author(s):  
Karen Kruska ◽  
Daniel J Edwards ◽  
Rama S Vemuri ◽  
Libor Kovarik ◽  
Aashish Rohatgi ◽  
...  
Keyword(s):  
Thin Films ◽  
Heat Treatment ◽  
Electron Diffraction ◽  
Phase Evolution ◽  
Beta Phase ◽  
Nano Crystalline ◽  
Precession Electron Diffraction

scholarly journals Low-Dose Scanning Electron Diffraction Microscopy of Mechanochemically Nanostructured Pharmaceuticals

2019 ◽  
Vol 25 (S2) ◽  
pp. 1746-1747 ◽  
Author(s):  
Duncan N. Johnstone ◽  
Christopher S. Allen ◽  
Mohsen Danaie ◽  
Royston C.B. Copley ◽  
Jeffrey Brum ◽  
...  
Keyword(s):  
Electron Diffraction ◽  
Low Dose ◽  
Diffraction Microscopy ◽  
Electron Diffraction Microscopy ◽  
Scanning Electron

Precession electron diffraction tomography on twinned crystals: application to CaTiO3 thin films

2019 ◽  
Vol 52 (3) ◽  
pp. 626-636 ◽  
Author(s):  
Gwladys Steciuk ◽  
Adrian David ◽  
Václav Petříček ◽  
Lukáš Palatinus ◽  
Bernard Mercey ◽  
...  
Keyword(s):  
Thin Films ◽  
Electron Diffraction ◽  
Structural Changes ◽  
Structural Information ◽  
Structure Refinement ◽  
Diffraction Theory ◽  
Strain Engineering ◽  
Diffraction Tomography ◽  
Epitaxial Thin Films ◽  
Precession Electron Diffraction

Strain engineering via epitaxial thin-film synthesis is an efficient way to modify the crystal structure of a material in order to induce new features or improve existing properties. One of the challenges in this approach is to quantify structural changes occurring in these films. While X-ray diffraction is the most widely used technique for obtaining accurate structural information from bulk materials, severe limitations appear in the case of epitaxial thin films. This past decade, precession electron diffraction tomography has emerged as a relevant technique for the structural characterization of nano-sized materials. While its usefulness has already been demonstrated for solving the unknown structure of materials deposited in the form of thin films, the frequent existence of orientation variants within the film introduces a severe bias in the structure refinement, even when using the dynamical diffraction theory to calculate diffracted intensities. This is illustrated here using CaTiO3 films deposited on SrTiO3 substrates as a case study. By taking into account twinning in the structural analysis, it is shown that the structure of the CaTiO3 films can be refined with an accuracy comparable to that obtained by dynamical refinement from non-twinned data. The introduction of the possibility to handle twin data sets is undoubtedly a valuable add-on and, notably, paves the way for a successful use of precession electron diffraction tomography for accurate structural analyses of thin films.

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