scanning Auger microscopy

Author(s):  
R. Schlögl
1988 ◽  
Vol 11 (5) ◽  
pp. 251-265 ◽  
Author(s):  
M. M. El Gomati ◽  
M. Prutton ◽  
B. Lamb ◽  
C. G. Tuppen

1982 ◽  
Vol 127 (1) ◽  
pp. 105-118 ◽  
Author(s):  
M. Prutton ◽  
D. C. Peacock

1983 ◽  
Vol 29 (9) ◽  
pp. 1704-1704
Author(s):  
A Lanir ◽  
J Boss ◽  
J E Naschitz ◽  
D Yeshurum

1989 ◽  
Vol 167 ◽  
Author(s):  
D. A. Sluzewski ◽  
Y. A. Chang ◽  
V. C. Marcotte

AbstractAir oxidized Pb-Sn and Pb-Sn-In single phase alloys have been studied with scanning Auger microscopy. Line scans across grain boundaries combined with argon ion sputter etching revealed grain boundary oxidation. In the Pb-Sn samples, tin is preferentially oxidized with the grain boundary regions having a much higher percentage of tin oxide than the bulk surface oxide. In the Pb-Sn-In alloys, both tin and indium are preferentially oxidized with the grain boundary regions being enriched with tin and indium oxides.


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