Experimental detection limits in scanning auger microscopy at high lateral resolution

Surface and Interface Analysis ◽

10.1002/sia.740120110 ◽

1988 ◽

Vol 12 (1) ◽

pp. 45-48 ◽

Author(s):

J. Chazelas ◽

J. Cazaux ◽

G. Gillmann ◽

J. Lynch ◽

R. Szymanski

Keyword(s):

Detection Limits ◽

Lateral Resolution ◽

Scanning Auger Microscopy ◽

Experimental Detection ◽

High Lateral Resolution ◽

Auger Microscopy

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Minimum detectable dimension, resolving power and quantification of scanning Auger microscopy at high lateral resolution

Surface and Interface Analysis ◽

10.1002/sia.740140612 ◽

1989 ◽

Vol 14 (6-7) ◽

pp. 354-366 ◽

Author(s):

J. Cazaux

Keyword(s):

Resolving Power ◽

Lateral Resolution ◽

Scanning Auger Microscopy ◽

High Lateral Resolution ◽

Auger Microscopy

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On the influence of backscattered electrons on the lateral resolution in scanning auger microscopy

Applied Physics ◽

10.1007/bf00883438 ◽

1977 ◽

Vol 14 (4) ◽

pp. 351-354 ◽

Author(s):

J. Kirschner

Keyword(s):

Lateral Resolution ◽

Backscattered Electrons ◽

Scanning Auger Microscopy ◽

Auger Microscopy

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Local compositional analysis of self-assembled GeSi/Si nanoclusters by scanning auger microscopy with nanometre lateral resolution

Microscopy of Semiconducting Materials 2003 ◽

10.1201/9781351074636-58 ◽

2018 ◽

pp. 251-254

Author(s):

G A Maximov ◽

D E Nikolitchev ◽

D O Filatov

Keyword(s):

Compositional Analysis ◽

Lateral Resolution ◽

Scanning Auger Microscopy ◽

Self Assembled ◽

Auger Microscopy

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LASER MICROPROBE MASS ANALYSIS DETECTION LIMITS AND LATERAL RESOLUTION

Le Journal de Physique Colloques ◽

10.1051/jphyscol:1984258 ◽

1984 ◽

Vol 45 (C2) ◽

pp. C2-261-C2-264

Author(s):

P. Wieser ◽

R. Wurster ◽

H. Seiler

Keyword(s):

Detection Limits ◽

Lateral Resolution ◽

Mass Analysis ◽

Laser Microprobe ◽

Laser Microprobe Mass Analysis ◽

Laser Microprobe Mass

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Use of High Lateral Resolution Secondary Ion Mass Spectrometry to Characterize Self-Assembled Monolayers on Microfabricated Structures

10.21236/ada245797 ◽

1992 ◽

Author(s):

C. D. Frisbie ◽

J. R. Martin ◽

R. R. Duff ◽

Wrighton Jr. ◽

M. S.

Keyword(s):

Mass Spectrometry ◽

Secondary Ion Mass Spectrometry ◽

Lateral Resolution ◽

Self Assembled Monolayers ◽

High Lateral Resolution ◽

Ion Mass Spectrometry ◽

Assembled Monolayers ◽

Self Assembled ◽

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Edge effects and image contrast in scanning Auger microscopy: A theory/experiment comparison

Surface and Interface Analysis ◽

10.1002/sia.740110506 ◽

1988 ◽

Vol 11 (5) ◽

pp. 251-265 ◽

Author(s):

M. M. El Gomati ◽

M. Prutton ◽

B. Lamb ◽

C. G. Tuppen

Keyword(s):

Edge Effects ◽

Image Contrast ◽

Scanning Auger Microscopy ◽

Auger Microscopy

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White-light interference microscopy: a way to obtain high lateral resolution over an extended range of heights

Optics Express ◽

10.1364/oe.14.006788 ◽

2006 ◽

Vol 14 (15) ◽

pp. 6788 ◽

Author(s):

Maitreyee Roy ◽

Colin J. R. Sheppard ◽

Guy Cox ◽

Parameswaran Hariharan

Keyword(s):

White Light ◽

Interference Microscopy ◽

Lateral Resolution ◽

Light Interference ◽

High Lateral Resolution ◽

Extended Range ◽

White Light Interference

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Stress Determination with High Lateral Resolution Using Neutron Diffraction

Materials Science Forum ◽

10.4028/www.scientific.net/msf.426-432.3975 ◽

2003 ◽

Vol 426-432 ◽

pp. 3975-3980 ◽

Author(s):

Thilo Pirling

Keyword(s):

Neutron Diffraction ◽

Lateral Resolution ◽

Stress Determination ◽

High Lateral Resolution

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Surface and interface microchemistry of archaeological objects studied with x ray photoemission spectroscopy and scanning Auger microscopy

Journal of Electron Spectroscopy and Related Phenomena ◽

10.1016/0368-2048(95)02429-8 ◽

1995 ◽

Vol 76 ◽

pp. 653-658 ◽

Author(s):

E. Paparazzo ◽

L. Moretto

Keyword(s):

Photoemission Spectroscopy ◽

X Ray ◽

Surface And Interface ◽

Scanning Auger Microscopy ◽

Auger Microscopy ◽

Archaeological Objects

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Monte-Carlo simulations of the point-to-point resolution in scanning Auger microscopy and x-ray microanalysis of thin overlayers

Surface and Interface Analysis ◽

10.1002/sia.740190178 ◽

1992 ◽

Vol 19 (1-12) ◽

pp. 419-422 ◽

Author(s):

E. Valamontes ◽

A. G. Nassiopoulos ◽

N. Glezos

Keyword(s):

Monte Carlo ◽

Monte Carlo Simulations ◽

X Ray ◽

Scanning Auger Microscopy ◽

Point To Point ◽

Auger Microscopy

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