Ultra‐Sensitive Cubic‐ITO/Silicon Photodiode via Interface Engineering of Native SiO x and Lattice‐Strain‐Assisted Atomic Oxidation

2022 ◽  
pp. 2109794
Yibo Zhang ◽  
Joel Y. Y. Loh ◽  
Andrew G. Flood ◽  
Chengliang Mao ◽  
Geetu Sharma ◽  
J. B. Warren

Electron diffraction intensity profiles have been used extensively in studies of polycrystalline and amorphous thin films. In previous work, diffraction intensity profiles were quantitized either by mechanically scanning the photographic emulsion with a densitometer or by using deflection coils to scan the diffraction pattern over a stationary detector. Such methods tend to be slow, and the intensities must still be converted from analog to digital form for quantitative analysis. The Instrumentation Division at Brookhaven has designed and constructed a electron diffractometer, based on a silicon photodiode array, that overcomes these disadvantages. The instrument is compact (Fig. 1), can be used with any unmodified electron microscope, and acquires the data in a form immediately accessible by microcomputer.Major components include a RETICON 1024 element photodiode array for the de tector, an Analog Devices MAS-1202 analog digital converter and a Digital Equipment LSI 11/2 microcomputer. The photodiode array cannot detect high energy electrons without damage so an f/1.4 lens is used to focus the phosphor screen image of the diffraction pattern on to the photodiode array.

2019 ◽  
pp. 105-110
Mikhail Yongon Lee ◽  
Sergei V. Fedorov

The article describes the structure and the operation principle of the spectrophotometer developed on the basis of a compact rapid monochromator with one input port and two output ports and a radiometric unit where upwelling radiation radiance and sea surface irradiance channels are located. A new approach to measurements of spectral characteristics of upwelling radiation of sea based on combination of advantages of a double beam photometer with a photomultiplier and a directreading photometer with a highstability silicon photodiode for its absolute adjustment in energy units is implemented.

2016 ◽  
Vol 8 (29) ◽  
pp. 19158-19167 ◽  
Zhimin Liang ◽  
Pingyang Zeng ◽  
Pengyi Liu ◽  
Chuanxi Zhao ◽  
Weiguang Xie ◽  

ACS Nano ◽  
2021 ◽  
Xunuo Lou ◽  
Shuang Li ◽  
Xiang Chen ◽  
Qingtang Zhang ◽  
Houquan Deng ◽  

2018 ◽  
Vol 2 (1) ◽  
Aurélien Debelle ◽  
Jean-Paul Crocombette ◽  
Alexandre Boulle ◽  
Alain Chartier ◽  
Thomas Jourdan ◽  

Sign in / Sign up

Export Citation Format

Share Document