Simultaneous estimation of the phase content and lamellar thickness in isotactic polypropylene by the simulated annealing of wide-angle X-ray scattering data

2010 ◽  
Vol 117 (4) ◽  
pp. 2386-2394 ◽  
Author(s):  
Gopinath Subramanian ◽  
Rahmi Ozisik

2014 ◽  
Vol 47 (3) ◽  
pp. 922-930 ◽  
Author(s):  
Raita Hirose ◽  
Taiyo Yoshioka ◽  
Hiroko Yamamoto ◽  
Kummetha Raghunatha Reddy ◽  
Daisuke Tahara ◽  
...  

An in-house X-ray scattering system, which can simultaneously measure small-angle X-ray scattering (SAXS) and wide-angle X-ray diffraction (WAXD) data, as well Raman scattering data, has been developed to study the phase transitions of polymeric materials. To date, these types of measurements have been limited to synchrotron radiation. The present system is an in-house SAXS system combined with a WAXD detector and a Raman spectrometer. A rotating-anode X-ray generator and multilayer optic are employed to provide a high-flux X-ray beam. Two two-dimensional hybrid pixel detectors are utilized for the rapid-scan time-resolved SAXS and WAXD measurements. The Raman unit consists of a compact probe with a near-infrared excitation laser operating at a wavelength of 1064 nm. This long-wavelength laser produces less fluorescence than conventional excitation lasers with wavelengths of 532 or 785 nm. The performance of this system was tested by investigating the thermally induced ferroelectric phase transition of vinylidene fluoride–trifluoroethylene (VDF-TrFE) copolymers. It has been demonstrated that the combination of SAXS, WAXD and Raman techniques gives useful information for revealing the relationship between the structural change in the crystal lattice and the morphological change in the lamellar stacking mode in polymer samples of complicated hierarchical structure.





2014 ◽  
Vol 47 (6) ◽  
pp. 2090-2099 ◽  
Author(s):  
Anna K. Hailey ◽  
Anna M. Hiszpanski ◽  
Detlef-M. Smilgies ◽  
Yueh-Lin Loo

TheDPCtoolkit is a simple-to-use computational tool that helps users identify the unit-cell lattice parameters of a crystal structure that are consistent with a set of two-dimensional grazing-incidence wide-angle X-ray scattering data. The input data requirements are minimal and easy to assemble from data sets collected with any position-sensitive detector, and the user is required to make as few initial assumptions about the crystal structure as possible. By selecting manual or automatic modes of operation, the user can either visually match the positions of the experimental and calculated reflections by individually tuning the unit-cell parameters or have the program perform this process for them. Examples that demonstrate the utility of this program include determining the lattice parameters of a polymorph of a fluorinated contorted hexabenzocoronene in a blind test and refining the lattice parameters of the thin-film phase of 5,11-bis(triethylsilylethynyl)anthradithiophene with the unit-cell dimensions of its bulk crystal structure being the initial inputs.



Polymer ◽  
2018 ◽  
Vol 142 ◽  
pp. 387-393 ◽  
Author(s):  
Baobao Chang ◽  
Konrad Schneider ◽  
Nilesh Patil ◽  
Stephan Roth ◽  
Gert Heinrich




Polymer ◽  
2013 ◽  
Vol 54 (7) ◽  
pp. 1867-1875 ◽  
Author(s):  
Håvard Granlund ◽  
Jostein Bø Fløystad ◽  
Morteza Esmaeili ◽  
Eirik Torbjørn Bakken ◽  
Martin Bech ◽  
...  




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