Probing Structure Modification of Palladium Nanomaterials during Chemical Synthesis by using In Situ X-ray Diffraction: Electrochemical Properties

2015 ◽  
Vol 2 (4) ◽  
pp. 592-599 ◽  
Author(s):  
Yaovi Holade ◽  
Teko W. Napporn ◽  
Claudia Morais ◽  
Karine Servat ◽  
K. Boniface Kokoh
2013 ◽  
Vol 21 (1) ◽  
pp. 254-258 ◽  
Author(s):  
Jocenir Boita ◽  
Maria do Carmo Martins Alves ◽  
Jonder Morais

The use ofin situtime-resolved dispersive X-ray absorption spectroscopy (DXAS) to monitor the formation of Cu2(OH)3Cl particles in an aqueous solution is reported. The measurements were performed using a dedicated reaction cell, which enabled the evolution of the CuK-edge X-ray absorption near-edge spectroscopy to be followed during mild chemical synthesis. The formed Cu2(OH)3Cl particles were also characterized by synchrotron-radiation-excited X-ray photoelectron spectroscopy, X-ray diffraction and scanning electron microscopy. The influence of polyvinylpyrrolidone (PVP) on the electronic and structural properties of the formed particles was investigated. The results indicate clearly the formation of Cu2(OH)3Cl, with or without the use of PVP, which presents very similar crystalline structures in the long-range order. However, depending on the reaction, dramatic differences were observed byin situDXAS in the vicinities of the Cu atoms.


2013 ◽  
Vol 569 ◽  
pp. 76-81 ◽  
Author(s):  
Jeongbae Yoon ◽  
Shoaib Muhammad ◽  
Donghyuk Jang ◽  
N. Sivakumar ◽  
Jaeyoon Kim ◽  
...  

2016 ◽  
Vol 16 (2) ◽  
pp. 834-841 ◽  
Author(s):  
Peter Nørby ◽  
Martin Roelsgaard ◽  
Martin Søndergaard ◽  
Bo B. Iversen

Author(s):  
R. E. Herfert

Studies of the nature of a surface, either metallic or nonmetallic, in the past, have been limited to the instrumentation available for these measurements. In the past, optical microscopy, replica transmission electron microscopy, electron or X-ray diffraction and optical or X-ray spectroscopy have provided the means of surface characterization. Actually, some of these techniques are not purely surface; the depth of penetration may be a few thousands of an inch. Within the last five years, instrumentation has been made available which now makes it practical for use to study the outer few 100A of layers and characterize it completely from a chemical, physical, and crystallographic standpoint. The scanning electron microscope (SEM) provides a means of viewing the surface of a material in situ to magnifications as high as 250,000X.


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