A Study of Diffusion by High-temperature Electron Probe Microanalysis

1992 ◽  
Vol 27 (8) ◽  
pp. 1079-1086
Author(s):  
P. Gorfu ◽  
G. Blasek ◽  
S. Däbritz
Keyword(s):  
High Temperature ◽  
Electron Probe Microanalysis ◽  
Electron Probe ◽  
Temperature Electron

Study on Interaction among Cerium-Arsenic-Iron

2012 ◽  
Vol 482-484 ◽  
pp. 1281-1284
Author(s):  
Yuan Zhi Lin ◽  
Xiao Dong Liu ◽  
Jin Zhu Zhang
Keyword(s):  
Diffusion Coefficient ◽  
High Temperature ◽  
Electron Probe Microanalysis ◽  
Electron Probe ◽  
Main Product ◽  
Atomic Ratio ◽  
X Ray Diffraction ◽  
Bright Field ◽  
Gray Phase ◽  
X Ray

The interaction in the Cerium-Arsenic-Iron system at high temperature were studied by means of electron probe microanalysis, optical microscopy and X-ray diffraction. The results show that the CeAs is the main product when the atomic ratio of Cerium to Arsenic is 1:2, and a light gray phase in bright field might be a ternary compound Ce12Fe57.5As41. The diffusion coefficient of Arsenic in iron was calculated as 1.606×10-13m2/S.

Microstructure and Compound Developed from Ce-As-Fe System at High Temperature

2012 ◽  
Vol 460 ◽  
pp. 103-106
Author(s):  
Sheng Tao Dou ◽  
Jin Zhu Zhang ◽  
Jun Huang
Keyword(s):  
High Temperature ◽  
Optical Microscopy ◽  
Electron Probe Microanalysis ◽  
Electron Probe ◽  
Main Product ◽  
Binary Compound ◽  
Atomic Ratio ◽  
X Ray Diffraction ◽  
X Ray

The interaction among Cerium, Arsenic and Iron at high temperature in a pressure-tight reactor were studied by means of electron probe microanalysis, optical microscopy and X-ray diffraction to understand what compounds could be developed and how about their stability chemically should be. The result shows that the binary compound CeAs is the main product on condition that the atomic ratio of Cerium to Arsenic is 2:1. There are some Fe2Ce, Ce4As3 and Fe17Ce2 compounds developed meanwhile. The amount of Fe17Ce2 phase by the base of steel increased with time prolonging at high temperature

Study on Interaction between Cerium and Arsenic

2011 ◽  
Vol 194-196 ◽  
pp. 1231-1234 ◽  
Author(s):  
Jin Zhu Zhang ◽  
Sheng Tao Dou
Keyword(s):  
High Temperature ◽  
Electron Probe Microanalysis ◽  
Electron Probe ◽  
Binary Compound ◽  
Atomic Ratio ◽  
X Ray Diffraction ◽  
Bright Field ◽  
Gray Phase ◽  
Interaction Product ◽  
X Ray

The interaction among Cerium, Arsenic and Iron at high temperature were studied by means of electron probe microanalysis, optical microscopy and X-ray diffraction. The result shows that the binary compound CeAs is the main interaction product when the atomic ratio of Ce to As is 1:2. The eutectic compound Fe2As can be precipitated from ferrite with the temperature decreasing, and the gray phase in bright field might be a ternary compound Ce12Fe57.5As41.

Electron Probe Microanalysis of Frozen Hydrated Kidneys, Isolated Cells, and Cultured Cells

1982 ◽  
Vol 40 ◽  
pp. 402-403 ◽  
Author(s):  
Claude Lechene
Keyword(s):  
Liquid Nitrogen ◽  
Electron Probe Microanalysis ◽  
Electron Probe ◽  
Cultured Cells ◽  
Liquid Nitrogen Temperature ◽  
Elemental Content ◽  
Isolated Cells ◽  
Renal Tubular Cells ◽  
Diamond Saw ◽  
Saw Blade

Electron probe microanalysis of frozen hydrated kidneysThe goal of the method is to measure on the same preparation the chemical elemental content of the renal luminal tubular fluid and of the surrounding renal tubular cells. The following method has been developed. Rat kidneys are quenched in solid nitrogen. They are trimmed under liquid nitrogen and mounted in a copper holder using a conductive medium. Under liquid nitrogen, a flat surface is exposed by sawing with a diamond saw blade at constant speed and constant pressure using a custom-built cryosaw. Transfer into the electron probe column (Cameca, MBX) is made using a simple transfer device maintaining the sample under liquid nitrogen in an interlock chamber mounted on the electron probe column. After the liquid nitrogen is evaporated by creating a vacuum, the sample is pushed into the special stage of the instrument. The sample is maintained at close to liquid nitrogen temperature by circulation of liquid nitrogen in the special stage.

Analysis of completed commercial semiconductors using EPMA

1996 ◽  
Vol 54 ◽  
pp. 502-503
Author(s):  
R. Packwood ◽  
M.W. Phaneuf ◽  
V. Weatherall ◽  
I. Bassignana
Keyword(s):  
Electron Probe Microanalysis ◽  
Electron Probe ◽  
Semiconductor Industry ◽  
Detection Limits ◽  
High Technology ◽  
Depth Resolution ◽  
Analytical Instruments ◽  
Wide Range ◽  
Numerous Element ◽  
Choice Method

The development of specialized analytical instruments such as the SIMS, XPS, ISS etc., all with truly incredible abilities in certain areas, has given rise to the notion that electron probe microanalysis (EPMA) is an old fashioned and rather inadequate technique, and one that is of little or no use in such high technology fields as the semiconductor industry. Whilst it is true that the microprobe does not possess parts-per-billion sensitivity (ppb) or monolayer depth resolution it is also true that many times these extremes of performance are not essential and that a few tens of parts-per-million (ppm) and a few tens of nanometers depth resolution is all that is required. In fact, the microprobe may well be the second choice method for a wide range of analytical problems and even the method of choice for a few.The literature is replete with remarks that suggest the writer is confusing an SEM-EDXS combination with an instrument such as the Cameca SX-50. Even where this confusion does not exist, the literature discusses microprobe detection limits that are seldom stated to be as low as 100 ppm, whereas there are numerous element combinations for which 10-20 ppm is routinely attainable.

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