Investigation of the Effect of the Substrate Position Relative to the Source on the Optoelectrical and Structural Properties of Pure Nanostructured Tin Oxide by APCVD

2014 ◽  
Vol 20 (10-11-12) ◽  
pp. 352-355 ◽  
Author(s):  
Masoudeh Maleki ◽  
Seyed Mohammad Rozati
2017 ◽  
Vol 43 (13) ◽  
pp. 10386-10391 ◽  
Author(s):  
A. Panimaya Selvi Isabel ◽  
Chyuan Haur Kao ◽  
Rama Krushna Mahanty ◽  
Yew Chung Sermon Wu ◽  
Chung Yi Li ◽  
...  

Langmuir ◽  
2003 ◽  
Vol 19 (9) ◽  
pp. 3762-3769 ◽  
Author(s):  
J. Németh ◽  
I. Dékány ◽  
K. Süvegh ◽  
T. Marek ◽  
Z. Klencsár ◽  
...  

1987 ◽  
Vol 12 (3) ◽  
pp. 191-200 ◽  
Author(s):  
G. Beensh-Marchwicka ◽  
L. Król-Stępniewska ◽  
A. Misiuk

Undoped and Sb-doped tin oxide films were prepared by d.c. reactive ion sputtering in an argon atmosphere with oxygen partial pressures ranging from 0 to 50%. The films were anneled in oxygen in the temperature range 360 - 893℃. The effect of thermal annealing on the changes in electrical and structural properties is described.


2006 ◽  
pp. 477-482
Author(s):  
Andreia M. Lopes ◽  
Patricia Nunes ◽  
Paula Vilarinho ◽  
Regina Monteiro ◽  
Elvira Fortunato ◽  
...  

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