This work examines the degradation of photovoltaic modules. It assesses the structural defects of amorphous silicon solar cells, which result from mechanical stress at nanoscale level. Firstly, it analyses the interface morphology, deformation, and internal delamination of a single junction amorphous silicon solar module. Secondly, it explores the interface deformation of the layers of the defective region of the module with some statistical tools including root mean root (RSM) and arithmetic mean (Rq). It used the aforementioned tools to demonstrate the effect of microstructural defects on the mechanical behaviour of the entire layers of the module. The study established that the defect observed in the module, emanated from long-term degradation of the a-Si solar cells after years of exposure to various light and temperature conditions. It tested the mechanism of mechanical degradation and its effect on the reliability and stability of the defective and non-defective regions of the module with adhesion force characterisation.
Automatized analysis of
IR
‐images of photovoltaic modules and its use for quality control of solar cells