Micro-Raman spectroscopy and SEM/EDX applied to improve the zircon fission track method used for dating geological formations

2009 ◽  
Vol 40 (1) ◽  
pp. 101-106 ◽  
Author(s):  
Airton Natanael Coelho Dias ◽  
Carlos Alberto Tello Saenz ◽  
Carlos José Leopoldo Constantino ◽  
Cleber José Soares ◽  
Felipe Ponciano Novaes ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
Fission Track ◽  
Micro Raman Spectroscopy ◽  
Track Method ◽  
Zircon Fission Track ◽  
Geological Formations

Effects of Etching on Zircon Grains and its Implications for the Fission Track Method

2012 ◽  
Vol 66 (5) ◽  
pp. 545-551 ◽  
Author(s):  
Carlos Alberto Tello Sáenz ◽  
Eduardo Augusto Campos Curvo ◽  
Airton Natanael Coelho Dias ◽  
Cleber José Soares ◽  
Carlos José Leopoldo Constantino ◽  
...  
Keyword(s):  
Chemical Composition ◽  
Crystal Lattice ◽  
Fission Track ◽  
Surface Characteristics ◽  
Optical Microscope ◽  
Etching Time ◽  
X Ray ◽  
Track Method ◽  
Zircon Fission Track ◽  
Natural Zircon

Studies of zircon grains using optical microscopy, micro-Raman spectroscopy, and scanning electron microscopy (SEM) have been carried out to characterize the surface of natural zircon as a function of etching time. According to the surface characteristics observed using an optical microscope after etching, the zircon grains were classified as: (i) homogeneous; (ii) anomalous, and (iii) hybrid. Micro-Raman results showed that, as etching time increases, the crystal lattice is slightly altered for homogeneous grains, it is completely damaged for anomalous grains, and it is altered in some areas for hybrid grains. The SEM (energy dispersive X-ray spectroscopy, EDS) results indicated that, independent of the grain types, where the crystallinity remains after etching, the chemical composition of zircon is approximately 33% SiO2:65% ZrO2 (standard natural zircon), and for areas where the grain does not have a crystalline structure, there are variations of ZrO2 and, mainly, SiO2. In addition, it is possible to observe a uniform surface density of fission tracks in grain areas where the determined crystal lattice and chemical composition are those of zircon. Regarding hybrid grains, we discuss whether the areas slightly altered by the chemical etching can be analyzed by the fission track method (FTM) or not. Results of zircon fission track and U-Pb dating show that hybrid and homogeneous grains can be used for dating, and not only homogeneous grains. More than 50 sedimentary samples from the Bauru Basin (southeast Brazil) were analyzed and show that only a small amount of grains are homogeneous (10%), questioning the validity of the rest of the grains for thermo-chronological evolution studies using zircon FTM dating.

Raman Spectroscopy and Scanning Electron Microscopy Characterizations of Fission Track Method Datable Zircon Grains

2014 ◽  
Vol 68 (5) ◽  
pp. 549-556 ◽  
Author(s):  
Rosana Silveira Resende ◽  
Carlos Alberto Tello Sáenz ◽  
Eduardo Augusto Campos Curvo ◽  
Carlos José Leopoldo Constantino ◽  
Ricardo F. Aroca ◽  
...  
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Raman Spectroscopy ◽  
Fission Track ◽  
Track Method ◽  
Scanning Electron

scholarly journals Dating pseudotachylyte of the Nojima fault using the zircon fission-track method

2004 ◽  
Vol 31 (12) ◽  
pp. n/a-n/a ◽  
Author(s):  
Masaki Murakami ◽  
Takahiro Tagami
Keyword(s):  
Fission Track ◽  
Track Method ◽  
Zircon Fission Track ◽  
Nojima Fault

Micro-Raman Spectroscopy Evaluation of the Local Mechanical Stress in Shallow Trench Isolation CMOS Structures: Correlation with Defect Generation and Diode Leakage

1998 ◽  
Author(s):  
I. De Wolf ◽  
G. Groeseneken ◽  
H.E. Maes ◽  
M. Bolt ◽  
K. Barla ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
Mechanical Stress ◽  
Defect Formation ◽  
Active Area ◽  
Wet Oxidation ◽  
Leakage Currents ◽  
Shallow Trench Isolation ◽  
Micro Raman Spectroscopy ◽  
Silicon Devices ◽  
Trench Isolation

Abstract It is shown, using micro-Raman spectroscopy, that Shallow Trench Isolation introduces high stresses in the active area of silicon devices when wet oxidation steps are used. These stresses result in defect formation in the active area, leading to high diode leakage currents. The stress levels are highest near the outer edges of line structures and at square structures. They also increase with decreasing active area dimensions.

Micro-Raman spectroscopy of Shang oracle bone inscriptions

2021 ◽  
Vol 37 ◽  
pp. 102910
Author(s):  
Jhih-Huei Liu ◽  
Weiying Ke ◽  
Ming-chorng Hwang ◽  
Kuang Yu Chen
Keyword(s):  
Raman Spectroscopy ◽  
Micro Raman Spectroscopy

scholarly journals Use of WetSEM® capsules for convenient multimodal scanning electron microscopy, energy dispersive X-ray analysis, and micro Raman spectroscopy characterisation of technetium oxides

2021 ◽  
Author(s):  
D. J. Bailey ◽  
M. C. Stennett ◽  
J. Heo ◽  
N. C. Hyatt
Keyword(s):  
Raman Spectroscopy ◽  
Low Cost ◽  
Powder Materials ◽  
Spectroscopy Analysis ◽  
X Ray ◽  
Micro Raman Spectroscopy ◽  
Hazard And Risk ◽  
Sem Imaging ◽  
General User ◽  
532 Nm

AbstractSEM–EDX and Raman spectroscopy analysis of radioactive compounds is often restricted to dedicated instrumentation, within radiological working areas, to manage the hazard and risk of contamination. Here, we demonstrate application of WetSEM® capsules for containment of technetium powder materials, enabling routine multimodal characterisation with general user instrumentation, outside of a controlled radiological working area. The electron transparent membrane of WetSEM® capsules enables SEM imaging of submicron non-conducting technetium powders and acquisition of Tc Lα X-ray emission, using a low cost desktop SEM–EDX system, as well as acquisition of good quality μ-Raman spectra using a 532 nm laser.

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