scholarly journals Use of WetSEM® capsules for convenient multimodal scanning electron microscopy, energy dispersive X-ray analysis, and micro Raman spectroscopy characterisation of technetium oxides

2021 ◽  
Author(s):  
D. J. Bailey ◽  
M. C. Stennett ◽  
J. Heo ◽  
N. C. Hyatt
Keyword(s):  
Raman Spectroscopy ◽  
Low Cost ◽  
Powder Materials ◽  
Spectroscopy Analysis ◽  
X Ray ◽  
Micro Raman Spectroscopy ◽  
Hazard And Risk ◽  
Sem Imaging ◽  
General User ◽  
532 Nm

AbstractSEM–EDX and Raman spectroscopy analysis of radioactive compounds is often restricted to dedicated instrumentation, within radiological working areas, to manage the hazard and risk of contamination. Here, we demonstrate application of WetSEM® capsules for containment of technetium powder materials, enabling routine multimodal characterisation with general user instrumentation, outside of a controlled radiological working area. The electron transparent membrane of WetSEM® capsules enables SEM imaging of submicron non-conducting technetium powders and acquisition of Tc Lα X-ray emission, using a low cost desktop SEM–EDX system, as well as acquisition of good quality μ-Raman spectra using a 532 nm laser.

Raman spectroscopy and X-ray photo-spectroscopy analysis of graphite media irradiated at low doses

2019 ◽  
Vol 147 ◽  
pp. 105-112 ◽  
Author(s):  
D.A. Bradley ◽  
Z. Siti Rozaila ◽  
M.U. Khandaker ◽  
K.S. Almugren ◽  
Worawat Meevasana ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
Low Doses ◽  
Spectroscopy Analysis ◽  
X Ray

Combined synchrotron x-ray diffraction and micro-Raman for following in situ the growth of solution-deposited YBa2Cu3O7 thin films

2005 ◽  
Vol 20 (12) ◽  
pp. 3270-3273 ◽  
Author(s):  
F. Berberich ◽  
H. Graafsma ◽  
B. Rousseau ◽  
A. Canizares ◽  
R. Ramy Ratiarison ◽  
...  
Keyword(s):  
Raman Spectroscopy ◽  
X Ray Diffraction ◽  
X Ray ◽  
Additional Information ◽  
Micro Raman Spectroscopy ◽  
High Temperature Process ◽  
Structural Growth ◽  
Metal Organic ◽  
Insight Into

A unique combination of in situ synchrotron x-ray diffraction and in situ micro-Raman spectroscopy was used to study the growth process of YBa2Cu3O6+x films obtained by metal organic decomposition using trifluoroacetate precursor on LaAlO3 substrates. The techniques give complementary information: x-ray diffraction gives insight into the structural growth, whereas micro-Raman spectroscopy gives information of the chemical composition with additional information on the texture. To perform both experiments in situ, a special high-temperature process chamber was designed.

Enhanced yield strength in iron nanocomposite with in situ grown single-wall carbon nanotubes

2006 ◽  
Vol 21 (2) ◽  
pp. 522-528 ◽  
Author(s):  
A. Goyal ◽  
D.A. Wiegand ◽  
F.J. Owens ◽  
Z. Iqbal
Keyword(s):  
Carbon Nanotubes ◽  
Raman Spectroscopy ◽  
Yield Strength ◽  
Vapor Deposition ◽  
Single Wall Carbon Nanotubes ◽  
Iron Matrix ◽  
Single Wall Carbon ◽  
X Ray ◽  
Micro Raman Spectroscopy

The yield strength of iron-carbon nanotube composites fabricated by in situ chemical vapor deposition of 2.2 vol% single-wall carbon nanotubes (SWNTs) inside an iron matrix showed substantial enhancement up to 45%, relative to that of similarly treated pure iron samples without carbon nanotubes of the same piece density. The work hardening coefficient and the Vickers hardness coefficient also significantly increased in these composites relative to the reference samples. X-ray diffraction together with energy dispersive x-ray measurements and micro-Raman spectroscopy indicated no concomitant formation of carbides and very little amorphous carbon during the vapor deposition process. Micro-Raman spectroscopy and scanning and transmission electron microscopy showed spectral signatures and images, respectively, indicating the formation and dispersion of SWNTs within the cavities of the iron matrix. It is suggested that the increased strength of the nanocomposites was due to the mechanical support provided to these cavities by the extremely strong SWNTs.

Metal Deposition on Laser Modified Teflon Surfaces

1995 ◽  
Vol 385 ◽  
Author(s):  
Stefan Lätsch ◽  
Hiroyuki Hiraoka ◽  
Joachim Bargon
Keyword(s):  
Raman Spectroscopy ◽  
Photoelectron Spectroscopy ◽  
Deposition Process ◽  
Metal Deposition ◽  
Polymer Surfaces ◽  
Good Adhesion ◽  
X Ray ◽  
Micro Raman Spectroscopy ◽  
Polymer Adhesion ◽  
Secondary Ion

ABSTRACTCu, Ni, and Au were deposited with defined patterns and good adhesion by electroless plating, e-beam evaporation, and sputtering onto Teflon (polytetrafluoroethylene, PTFE), Teflon ET (PTFE-co-ethylene), Teflon FEP (PTFE-co-hexafluoropropylene) and Teflon PFA (PTFE-coperfluoroalkoxy vinyl ether) surfaces. The polymers had been irradiated in a tetramethyl – ammonium hydoxide solution (TMAH) by a Nd:YAG laser at 266 rim and by an excimer laser at 248 nrm prior to the metal deposition process. Both, the treated and virgin polymer surfaces were characterized by x-ray photoelectron spectroscopy (XPS), secondary ion mass spectroscopy (SIMS) and Micro-Raman spectroscopy. The increased metal to polymer adhesion at the interface was found to be due to chemical changes and is in the order Ni > Cu ≅ Au.

Blue halite colour centre aggregates studied by micro-Raman spectroscopy and X-ray diffraction

2012 ◽  
Vol 60 ◽  
pp. 124-128 ◽  
Author(s):  
Aleksandra Wesełucha-Birczyńska ◽  
Sylwia Zelek ◽  
Katarzyna Stadnicka
Keyword(s):  
Raman Spectroscopy ◽  
X Ray Diffraction ◽  
Colour Centre ◽  
X Ray ◽  
Micro Raman Spectroscopy
Sign in / Sign up

Export Citation Format

Share Document