Direct observation of a silicon-sapphire hetero-epitaxial interface by high resolution transmission electron microscopy
2017 ◽
Vol 17
(9)
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pp. 6991-6996
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1989 ◽
Vol 224
(1-3)
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pp. L956-L964
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1999 ◽
Vol 20
(5)
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pp. 245-250
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