64‐1: Separating Specular Reflection from Diffuse Haze for ePaper Using the Extended Variable‐Aperture Source Method

2020 ◽  
Vol 51 (1) ◽  
pp. 949-952
Author(s):  
Dirk Hertel ◽  
Edward F. Kelley ◽  
John Penczek
Keyword(s):  
Specular Reflection ◽  
Source Method ◽  
Variable Aperture

78‐1: Specular Reflection Measurements on Reflective E‐paper Using a Variable Aperture Source

2019 ◽  
Vol 50 (1) ◽  
pp. 1118-1121 ◽  
Author(s):  
Dirk Hertel ◽  
Edward F. Kelley
Keyword(s):  
Specular Reflection ◽  
Variable Aperture

Forensic applications of IR infrared microscopic internal reflection spectroscopy

1992 ◽  
Vol 50 (2) ◽  
pp. 1528-1529
Author(s):  
Edward G. Bartick ◽  
John A. Reffner
Keyword(s):  
Specular Reflection ◽  
Forensic Analysis ◽  
Attenuated Total Reflection ◽  
Internal Reflection ◽  
Standard Size ◽  
Ir Microscopy ◽  
Ir Analysis ◽  
Plastic Explosives ◽  
Internal Reflection Spectroscopy ◽  
Reflectance Measurements

Since the introduction of commercial Fourier transform infrared (FTIR) microscopic systems in 1983, IR microscopy has developed as an important analytical tool in research, industry and forensic analysis. Because of the frequent encounter of small quantities of physical evidence found at crime scenes, spectroscopic IR microscopes have proven particularly valuable for forensic applications. Transmittance and reflectance measurements have proven very useful. Reflection-absorption, specular reflection, and diffuse reflection have all been applied. However, it has been only very recently that an internal reflection (IRS) objective has been commercially introduced.The IRS method, also known as attenuated total reflection (ATR), has proven very useful for IR analysis of standard size samples. The method has been applied to adhesive tapes, plastic explosives, and general applications in the analysis of opaque materials found as evidence. The small quantities or uncontaminated areas of specimens frequently found requiring forensic analysis will often be directly applicable to microscopic IRS analysis.

Valence electron energy loss spectroscopy in reflection geometry

1989 ◽  
Vol 47 ◽  
pp. 378-379
Author(s):  
J. Liu ◽  
J. M. Cowley
Keyword(s):  
Energy Loss ◽  
Valence Electron ◽  
Interband Transition ◽  
Specular Reflection ◽  
Three Dimensional ◽  
Electron Excitation ◽  
Transmission Electron ◽  
Yield Information ◽  
Valence Bands ◽  
Excitation Processes

The low energy loss region of a EELS spectrum carries information about the valence electron excitation processes (e.g., collective excitations for free electron like materials and interband transitions for insulators). The relative intensities and the positions of the interband transition energy loss peaks observed in EELS spectra are determined by the joint density of states (DOS) of the initial and final states of the excitation processes. Thus it is expected that EELS in reflection mode could yield information about the perturbation of the DOS of the conduction and valence bands of the bulk crystals caused by the termination of the three dimensional periodicity at the crystal surfaces. The experiments were performed in a Philipps 400T transmission electron microscope operated at 120 kV. The reflection EELS spectra were obtained by a Gatan 607 EELS spectrometer together with a Tracor data acquisition system and the resolution of the spectrometer was about 0.8 eV. All the reflection spectra are obtained from the specular reflection spots satisfying surface resonance conditions.

Measurement of Refractive Index of Thermal Barrier Coating using Reflection of Terahertz Waves and Variable Aperture

2014 ◽  
Vol 134 (8) ◽  
pp. 478-484
Author(s):  
Tetsuo Fukuchi ◽  
Norikazu Fuse ◽  
Maya Mizuno ◽  
Kaori Fukunaga
Keyword(s):  
Refractive Index ◽  
Thermal Barrier Coating ◽  
Thermal Barrier ◽  
Terahertz Waves ◽  
Barrier Coating ◽  
Variable Aperture

Enhancement of Single-Walled Carbon Nanotube Formation Using Aluminum Oxide Buffer Layer in Alcohol Gas Source Method

2008 ◽  
Author(s):  
Takahiro Maruyama ◽  
Tomoyuki Shiraiwa ◽  
Kuninori Sato ◽  
Shigeya Naritsuka
Keyword(s):  
Carbon Nanotube ◽  
Aluminum Oxide ◽  
Buffer Layer ◽  
Single Walled Carbon Nanotube ◽  
Single Walled Carbon ◽  
Source Method ◽  
Gas Source

Beam Commissioning Data Acquisition for the Iris Variable Aperture Collimator of CyberKnife VSI

2017 ◽  
Vol 5 (1) ◽  
Author(s):  
Hu Hongbo ◽  
Deng Chaohui ◽  
Piao Junjie ◽  
Shao Gaofeng
Keyword(s):  
Data Acquisition ◽  
Variable Aperture ◽  
Beam Commissioning

scholarly journals Specular Reflection Image Enhancement Based on a Dark Channel Prior

2021 ◽  
Vol 13 (1) ◽  
pp. 1-11
Author(s):  
Ye Xin ◽  
Zhenhong Jia ◽  
Jie Yang ◽  
Nikola K. Kasabov
Keyword(s):  
Image Enhancement ◽  
Specular Reflection ◽  
Dark Channel Prior ◽  
Dark Channel ◽  
Reflection Image

Real-time Approximation of Photometric Polygonal Lights

2020 ◽  
Vol 3 (1) ◽  
pp. 1-18
Author(s):  
Christian Luksch ◽  
Lukas Prost ◽  
Michael Wimmer
Keyword(s):  
Real Time ◽  
Specular Reflection ◽  
Near Field ◽  
Measurement Data ◽  
Data Sets ◽  
Photometric Measurement ◽  
Integration Technique ◽  
Time Approximation ◽  
Light Emitter ◽  
Selection Of

We present a real-time rendering technique for photometric polygonal lights. Our method uses a numerical integration technique based on a triangulation to calculate noise-free diffuse shading. We include a dynamic point in the triangulation that provides a continuous near-field illumination resembling the shape of the light emitter and its characteristics. We evaluate the accuracy of our approach with a diverse selection of photometric measurement data sets in a comprehensive benchmark framework. Furthermore, we provide an extension for specular reflection on surfaces with arbitrary roughness that facilitates the use of existing real-time shading techniques. Our technique is easy to integrate into real-time rendering systems and extends the range of possible applications with photometric area lights.

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