Monte Carlo simulation of backscattered peaks in secondary target energy-dispersive x-ray spectra

1986 ◽  
Vol 15 (4) ◽  
pp. 231-238 ◽  
Author(s):  
Peter Van Dyck ◽  
Szabina Török ◽  
René Van Grieken
Keyword(s):  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Energy Dispersive ◽  
X Ray ◽  
Secondary Target ◽  
Target Energy

A general Monte Carlo simulation of energy-dispersive X-ray fluorescence spectrometers — Part 6. Quantification through iterative simulations

2013 ◽  
Vol 82 ◽  
pp. 36-41 ◽  
Author(s):  
Tom Schoonjans ◽  
Vicente Armando Solé ◽  
Laszlo Vincze ◽  
Manuel Sanchez del Rio ◽  
Karen Appel ◽  
...  
Keyword(s):  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Energy Dispersive ◽  
X Ray

Monte Carlo simulation of conventional and synchrotron energy-dispersive x-ray spectrometers

1993 ◽  
Vol 22 (4) ◽  
pp. 234-243 ◽  
Author(s):  
K. Janssens ◽  
L. Vincze ◽  
P. Van Espen ◽  
F. Adams
Keyword(s):  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Energy Dispersive ◽  
X Ray

Microanalysis Techniques for the Investigation of Interphases Formed between Thermoset and Thermoplastic Polymers: Scanning Electron Microscopy and Energy Dispersive X-Ray Analysis

2011 ◽  
Vol 471-472 ◽  
pp. 309-314 ◽  
Author(s):  
Michael T. Heitzmann ◽  
Meng Hou ◽  
Martin Veidt ◽  
Rowan Paton ◽  
Ron Rasch
Keyword(s):  
Electron Microscopy ◽  
Scanning Electron Microscopy ◽  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Spatial Resolution ◽  
Energy Dispersive ◽  
Polymer Interfaces ◽  
X Ray ◽  
Acceleration Voltage ◽  
Scanning Electron

Prepreg resin systems are typically of complex composition and require very specific manufacturing conditions. These characteristics restrict the use of some commonly used micro analysis techniques. This paper investigates the use of low acceleration voltage scanning electron microscopy and energy dispersive x-ray analysis for the characterization of diffused polymer interfaces. It is shown that, by operating at the dynamic charge balance, high resolution secondary electron images of polymer interfaces can be obtained and that conductive coating is not required. In addition, the effect of acceleration voltage on the interaction volume in EDX analysis is discussed using Monte Carlo simulation. X-ray intensity measurements in combination with afore mentioned Monte Carlo simulation is used to define practically obtainable spatial resolution limits. It is shown that by reducing the acceleration voltage below 5kV spatial resolution higher the 500nm can be obtained.

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