Comparison of Dual-Channel Wavelength and Secondary-Target Energy-Dispersive X-Ray Spectrometers

1987 ◽  
pp. 225-236
Author(s):  
John F. Croke ◽  
Joseph A. Nicolosi
Keyword(s):  
Energy Dispersive ◽  
X Ray ◽  
Secondary Target ◽  
Dual Channel ◽  
Target Energy ◽  
Channel Wavelength

Comparison of Dual-Channel Wavelength and Secondary-Target Energy-Dispersive X-Ray Spectrometers

1986 ◽  
Vol 30 ◽  
pp. 225-236
Author(s):  
John F. Croke ◽  
Joseph A. Nicolosi
Keyword(s):  
List Type ◽  
Qualitative And Quantitative Analysis ◽  
X Ray ◽  
Qualitative And Quantitative ◽  
The Past ◽  
Dual Channel ◽  
Target Energy ◽  
Overall Performance ◽  
Channel Wavelength ◽  
Speed Accuracy

Over the past 30 years, X-ray fluorescence spectrometry has become one of the more valuable methods for the qualitative and quantitative analysis of materials. Today, there are many methods of instrumental analysis available, and among the factors that will be taken into account in the method of selection are: -Accuracy-Range of application-Speed-Sensitivity-ReliabilityNo one technique can provide all of the features that a given analyst requires. XRF does offer good overall performance over the widest range of elements. Speed, accuracy, and versatility are among the features that have made XRF the method of choice for over 15,000 laboratories worldwide.

Monte Carlo simulation of backscattered peaks in secondary target energy-dispersive x-ray spectra

1986 ◽  
Vol 15 (4) ◽  
pp. 231-238 ◽  
Author(s):  
Peter Van Dyck ◽  
Szabina Török ◽  
René Van Grieken
Keyword(s):  
Monte Carlo Simulation ◽  
Monte Carlo ◽  
Energy Dispersive ◽  
X Ray ◽  
Secondary Target ◽  
Target Energy

A Comparison of the XRF11 and EXACT Fundamental Parameters Programs when Using Filtered Direct and Secondary Target Excitation in EDXRF

1982 ◽  
Vol 26 ◽  
pp. 369-376 ◽  
Author(s):  
Ronald A. Vane
Keyword(s):  
Energy Dispersive ◽  
Fluorescence Spectrometry ◽  
X Ray ◽  
Fundamental Parameters ◽  
Secondary Target ◽  
Direct Excitation

The XRF11 program by John Criss and the EXACT program are two commercially available fundamental parameters programs for energy dispersive x-ray fluorescence spectrometry (EDXRF). These programs are both based on the same underlying equations but use different approaches to the calculations. The EXACT program assumes monochromatic excitation, and the XEF11 program models polychromatic excitation sources. There are also great differences in how the two programs approach the iterations in the calculations and in how the data from standards are used in the two programs for calibration.To produce the monochromatic excitation neeiled by the EXACT program, secondary targets have been the preferred method. But it is also possible to approximate monochromatic excitation by using filtered direct excitation. The purpose of this study is to compare the data obtained from both secondary targets and direct filtered excitation as processed through both XRF11 and EXACT.

Backscatter/Fundamental-Parameters Analysis of Unweighed Samples using Multi-Target, Multi-Crystal Regions of Interest from WDXRF and EDXRF

1991 ◽  
Vol 35 (B) ◽  
pp. 1101-1106
Author(s):  
Richard J. Arthur ◽  
Ronald W. Sanders
Keyword(s):  
Matrix Effects ◽  
Computer Code ◽  
Total Sample ◽  
Regions Of Interest ◽  
Energy Dispersive ◽  
Fundamental Parameter ◽  
Accurate Analysis ◽  
X Ray ◽  
Fundamental Parameters ◽  
Target Energy

AbstractA method has been developed to simultaneously compute matrix corrections from a composite spectrum of multi-target energy-dispersive (EDXRF) and multicrystal wavelength—dispersive (WDXRF) x-ray fluorescence systems, A serial line installed between the WDXRF and EDXRF spectrometers via a PDF 11/34a computer allows acquired wavelength data to be digitally transformed into an energy spectrum. The low-energy x-ray information from the WDXRF unit is then coupled with the backscatter coherent/incoherent information from the EDXRF unit, enabling enhanced quantitative analysis for low-atomic-number (low-Z) elements. The peak resolution obtainable from the WDXRF spectra often removes the necessity for peak-overlap corrections.Backscatter intensities obtained from the EDXRF unit are used to provide information on total sample mass and to correct for matrix effects. The resulting backscatter fundamental-parameter (BFP) calculations generally provide an accurate analysis of samples without prior knowledge of the sample matrix. Such an approach is particularly useful for samples in which quantities of carbon, oxygen, and other low-Z constituents cannot be explicitly determined.Regions of interest (ROI) are created by the computer code “PREP” and processed by the BFP code "MSAP" an extension of the “SAP3” computer program for quantitative multielement analysis by energy-dispersive x-ray fluorescence,

Applications of Room Temperature Energy Dispersive X-Ray Spectrometry Using a Mercuric Iodide Detector

1983 ◽  
Vol 27 ◽  
pp. 527-537 ◽  
Author(s):  
D.E. Leyden ◽  
A.R. Harding ◽  
K. Goldbach
Keyword(s):  
Room Temperature ◽  
Energy Dispersive ◽  
Mercuric Iodide ◽  
X Ray ◽  
Secondary Target ◽  
Excitation Conditions

Energy dispensive X-ray spectrometry has been used extensively for the rapid, simultaneous deterninaion of elements in a variety of sample types. Excitation of the analytical sample can be by either X-ray tube, secondary targets, or radioactive isotopic sources. Tube sources have the advantages of convenient control of the excitation conditions, whereas an isotopic source or secondary target must be physically replaced by another to affect an excitation change. The use of primary filters between the sample and X-ray tube can greatly enhance the flexibilitty of the excitation conditions.

Analysis of Refractory Metals and WC-Based Hard Metals by Energy Dispersive X-Ray Fluorescence

1980 ◽  
Vol 24 ◽  
pp. 383-392
Author(s):  
Wolfhard Wegscheider ◽  
Kurt Müller ◽  
Hugo M. Ortner
Keyword(s):  
Refractory Metals ◽  
Energy Dispersive ◽  
Lower Sensitivity ◽  
Precision Data ◽  
X Ray ◽  
Secondary Target ◽  
Direct Excitation ◽  
Photon Excitation ◽  
Hard Metals ◽  
Characteristic Lines

AbstractThe potential of energy-dispersive X-ray fluorescence spectrometry for analysis of refractory metals and WC-based hard metals is investigated. Both, photon excitation by filtered tube radiation and by the characteristic, lines of a secondary target are employed. Both excitation systems give good results. If the counting times are adjusted to account for the lower sensitivity of energy dispersive as opposed to wavelength dispersive X-ray spectrometry the detection limit and precision data are comparable. The multielement analyses of interest in these applications that comprise an energy range of 5 keV or more are better handled by direct excitation with filtered tube radiations than either by secondary target excitation or by wavelength dispersive X-ray spectrometry.

scholarly journals Direct Analysis of Plutonium Metal for Gallium, Iron and Nickel by Energy Dispersive X-Ray Spectrometry

1981 ◽  
Vol 25 ◽  
pp. 163-168
Author(s):  
H. L. Bramlet ◽  
J. H. Doyle
Keyword(s):  
Chemical Analysis ◽  
Direct Analysis ◽  
Energy Dispersive ◽  
X Ray ◽  
Secondary Target ◽  
Wet Chemical ◽  
Plutonium Metal

AbstractAn x-ray secondary target method for routine determination of gallium, iron, and nickel in plutonium metal is described that has significant advantages over wet chemical analysis. Coupons requiring minimal preparation for analysis are produced as a breakaway tab on the plutonium ingot. All three elements are determined on the same coupon. Gallium is determined using an arsenic secondary target followed by iron and nickel using a zinc target. The analysis times are 5 minutes for gallium and 15 minutes for the combined iron and nickel. The method of analysis was evaluated in the range of from 0.5 to 1.5% gallium. Iron was investigated over the range of 67 to 3000 ppm and nickel from 64 to 110 ppm.

The Comparison of Three Excitation Modes in the Energy Dispersive X-Ray Fluorescence Analysis

1991 ◽  
Vol 35 (B) ◽  
pp. 1001-1007
Author(s):  
Birgit Kanngieβer ◽  
Burkhard Bockboff ◽  
Jens Scheer ◽  
Walter Swoboda
Keyword(s):  
Bragg Reflection ◽  
Fluorescence Analysis ◽  
Energy Dispersive ◽  
Excitation Spectra ◽  
Excitation Mode ◽  
X Ray ◽  
Secondary Target ◽  
Irradiation Chamber

AbstractWith a new irradiation chamber a comparison of three excitation modes under same conditions and with the same material has been done. The results of this comparison are presented in the following manner: - Barltla scattering (graphite) versus Bragg reflection (HOPS) - Bragg reflection (Mo) versus secondary target fluorescence (Mo) - secondary target fluorescence (Sn) versus Barkla scattering (graphite) Excitation spectra and detection sensitivities of a NBS standard will be discussed for the different modes. The Barkla scattering was found to be the best excitation mode for a wide elemental range.

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