AbstractRecent developments in X-ray optics have allowed the development of a range
of commercially available benchtop micro-XRF (μ-XRF) instruments that can
produce X-ray spot sizes of 20–30 μm on the sample, allowing major- and
trace-element analysis on a range of sample types and sizes with minimal
sample preparation. Such instruments offer quantitative analysis using
fundamental parameter based 'standardless' quantification algorithms. The
accuracy and precision of this quantitative analysis on geological
materials, and application of micro-XRF to wider geological problems is
assessed using a single benchtop micro-XRF instrument. Quantitative analysis
of internal reference materials and international standards shows that such
instruments can provide highly reproducible data but that, for many silicate
materials, standardless quantification is not accurate.Accuracy can be
improved, however, by using a simple type-calibration against a reference
material of similar matrix and composition. Qualitative analysis with
micro-XRF can simplify and streamline sample characterization and processing
for subsequent geochemical and isotopic analysis.
Application of handheld X-ray fluorescence spectrometer for major element analysis and characterization of geological samples in Southern Thailand