scholarly journals Nanoscale Characterization of Electronic and Electrical Properties of III-Nitrides by Scanning Probe Microscopy

2007 ◽  
pp. 690-714 ◽  
Author(s):  
B. J. Rodriguez ◽  
A. Gruverman ◽  
R. J. Nemanich
Keyword(s):  
Electrical Properties ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Probe Microscopy ◽  
Nanoscale Characterization

scholarly journals Nanoscale Characterization of Silicon-On-Insulator Nanowires by Multimode Scanning Probe Microscopy

2013 ◽  
Vol 38 (2) ◽  
pp. 265-268
Author(s):  
Leonid Bolotov ◽  
Tetsuya Tada ◽  
Yukinori Morita ◽  
Vladimir Poborchii ◽  
Toshihiko Kanayama
Keyword(s):  
Scanning Probe Microscopy ◽  
Silicon On Insulator ◽  
Scanning Probe ◽  
Probe Microscopy ◽  
Nanoscale Characterization
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