Nanoscale Characterization of Silicon-On-Insulator Nanowires by Multimode Scanning Probe Microscopy

Transactions of the Materials Research Society of Japan ◽

10.14723/tmrsj.38.265 ◽

2013 ◽

Vol 38 (2) ◽

pp. 265-268

Author(s):

Leonid Bolotov ◽

Tetsuya Tada ◽

Yukinori Morita ◽

Vladimir Poborchii ◽

Toshihiko Kanayama

Keyword(s):

Scanning Probe Microscopy ◽

Silicon On Insulator ◽

Scanning Probe ◽

Probe Microscopy ◽

Nanoscale Characterization

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Nanoscale Characterization of CDC Supercapacitors by In Situ Scanning Probe Microscopy Methods

ECS Meeting Abstracts ◽

10.1149/ma2012-02/6/603 ◽

2012 ◽

Keyword(s):

Scanning Probe Microscopy ◽

Scanning Probe ◽

Probe Microscopy ◽

Nanoscale Characterization

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Nanoscale characterization of solid electrolyte by Scanning Probe Microscopy techniques

Electrochimica Acta ◽

10.1016/j.electacta.2019.135553 ◽

2020 ◽

Vol 334 ◽

pp. 135553 ◽

Author(s):

Zhongting Wang ◽

Masashi Kotobuki ◽

Li Lu ◽

Kaiyang Zeng

Keyword(s):

Solid Electrolyte ◽

Scanning Probe Microscopy ◽

Scanning Probe ◽

Probe Microscopy ◽

Nanoscale Characterization ◽

Microscopy Techniques

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Nanoscale characterization of CH 3 -terminated Self-Assembled Monolayer on copper by advanced scanning probe microscopy techniques

Applied Surface Science ◽

10.1016/j.apsusc.2015.08.182 ◽

2015 ◽

Vol 356 ◽

pp. 921-926 ◽

Author(s):

Tobias Berthold ◽

Guenther Benstetter ◽

Werner Frammelsberger ◽

Rosana Rodríguez ◽

Montserrat Nafría

Keyword(s):

Scanning Probe Microscopy ◽

Scanning Probe ◽

Self Assembled Monolayer ◽

Probe Microscopy ◽

Nanoscale Characterization ◽

Self Assembled ◽

Microscopy Techniques

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Nanoscale Characterization of an Electron Emitting Tip by Scanning Probe Microscopy

e-Journal of Surface Science and Nanotechnology ◽

10.1380/ejssnt.2014.377 ◽

2014 ◽

Vol 12 (0) ◽

pp. 377-379 ◽

Author(s):

Norimichi Watanabe ◽

Miyuki Tanaka ◽

Tetsuo Shimizu

Keyword(s):

Scanning Probe Microscopy ◽

Scanning Probe ◽

Probe Microscopy ◽

Nanoscale Characterization

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Nanoscale Characterization of Nanostructures and Nanodevices by Scanning Probe Microscopy

Micromachines as Tools for Nanotechnology - Microtechnology and MEMS ◽

10.1007/978-3-642-55503-9_8 ◽

2003 ◽

pp. 191-211

Author(s):

Takuji Takahashi

Keyword(s):

Scanning Probe Microscopy ◽

Scanning Probe ◽

Probe Microscopy ◽

Nanoscale Characterization

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Nanoscale characterization of an electron emitting tip by field emission microscopy and scanning probe microscopy

Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena ◽

10.1116/1.4930308 ◽

2015 ◽

Vol 33 (5) ◽

pp. 051809 ◽

Author(s):

Norimichi Watanabe ◽

Miyuki Tanaka ◽

Tetsuo Shimizu

Keyword(s):

Field Emission ◽

Scanning Probe Microscopy ◽

Scanning Probe ◽

Probe Microscopy ◽

Nanoscale Characterization ◽

Field Emission Microscopy ◽

Emission Microscopy

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Nanoscale characterization of charged/discharged lithium-rich thin film cathode by scanning probe microscopy techniques

Journal of Power Sources ◽

10.1016/j.jpowsour.2017.03.082 ◽

2017 ◽

Vol 352 ◽

pp. 9-17 ◽

Author(s):

Shan Yang ◽

Jiaxiong Wu ◽

Binggong Yan ◽

Liu Li ◽

Yao Sun ◽

...

Keyword(s):

Thin Film ◽

Scanning Probe Microscopy ◽

Scanning Probe ◽

Probe Microscopy ◽

Nanoscale Characterization ◽

Microscopy Techniques

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Nanoscale Characterization of Electronic and Electrical Properties of III-Nitrides by Scanning Probe Microscopy

Scanning Probe Microscopy ◽

10.1007/978-0-387-28668-6_26 ◽

2007 ◽

pp. 690-714 ◽

Author(s):

B. J. Rodriguez ◽

A. Gruverman ◽

R. J. Nemanich

Keyword(s):

Electrical Properties ◽

Scanning Probe Microscopy ◽

Scanning Probe ◽

Probe Microscopy ◽

Nanoscale Characterization

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Characterization of periodically poled ferroelectric crystals using scanning probe microscopy

Technical Digest. Summaries of papers presented at the Conference on Lasers and Electro-Optics. Postconference Technical Digest (IEEE Cat. No.01CH37170) ◽

10.1109/cleo.2001.947615 ◽

2001 ◽

Author(s):

R. Clemens ◽

F. Laurell ◽

H. Karlsson ◽

J. Wittborn ◽

C. Canalias ◽

...

Keyword(s):

Scanning Probe Microscopy ◽

Scanning Probe ◽

Periodically Poled ◽

Probe Microscopy ◽

Ferroelectric Crystals

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Characterization of CVD-synthesized graphene films transferred on different substrates using the scanning probe microscopy electrical techniques

Physica E Low-dimensional Systems and Nanostructures ◽

10.1016/j.physe.2021.115101 ◽

2021 ◽

pp. 115101

Author(s):

Yu.V. Korkh ◽

A.B. Rinkevich ◽

A.S. Klepikova ◽

E.A. Tolmacheva ◽

E.A. Pankrushina

Keyword(s):

Scanning Probe Microscopy ◽

Scanning Probe ◽

Probe Microscopy ◽

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