Nanoscale characterization of charged/discharged lithium-rich thin film cathode by scanning probe microscopy techniques

2017 ◽  
Vol 352 ◽  
pp. 9-17 ◽  
Author(s):  
Shan Yang ◽  
Jiaxiong Wu ◽  
Binggong Yan ◽  
Liu Li ◽  
Yao Sun ◽  
...  
Keyword(s):  
Thin Film ◽  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Probe Microscopy ◽  
Nanoscale Characterization ◽  
Microscopy Techniques

scholarly journals Nanoscale Characterization of Silicon-On-Insulator Nanowires by Multimode Scanning Probe Microscopy

2013 ◽  
Vol 38 (2) ◽  
pp. 265-268
Author(s):  
Leonid Bolotov ◽  
Tetsuya Tada ◽  
Yukinori Morita ◽  
Vladimir Poborchii ◽  
Toshihiko Kanayama
Keyword(s):  
Scanning Probe Microscopy ◽  
Silicon On Insulator ◽  
Scanning Probe ◽  
Probe Microscopy ◽  
Nanoscale Characterization

scholarly journals Grain boundary effects on Li-ion diffusion in a Li1.2Co0.13Ni0.13Mn0.54O2 thin film cathode studied by scanning probe microscopy techniques

RSC Advances ◽  
2016 ◽  
Vol 6 (96) ◽  
pp. 94000-94009 ◽  
Author(s):  
Shan Yang ◽  
Binggong Yan ◽  
Li Lu ◽  
Kaiyang Zeng
Keyword(s):  
Thin Film ◽  
Grain Boundary ◽  
Scanning Probe Microscopy ◽  
Boundary Effects ◽  
Scanning Probe ◽  
Ion Diffusion ◽  
Probe Microscopy ◽  
Grain Boundary Effects ◽  
Li Ion ◽  
Microscopy Techniques

This paper presents the results of in situ characterization of grain boundary effects on Li-ion diffusion in Li1.2Co0.13Ni0.13Mn0.54O2 thin film cathode by using various Scanning Probe Microscopy (SPM) techniques.

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