Nanoscale Characterization of CDC Supercapacitors by In Situ Scanning Probe Microscopy Methods

Silicon On Insulator ◽

Scanning Probe ◽

Probe Microscopy ◽

Nanoscale characterization of solid electrolyte by Scanning Probe Microscopy techniques

Electrochimica Acta ◽

10.1016/j.electacta.2019.135553 ◽

2020 ◽

Vol 334 ◽

pp. 135553 ◽

Cited By ~ 2

Author(s):

Zhongting Wang ◽

Masashi Kotobuki ◽

Li Lu ◽

Kaiyang Zeng

Keyword(s):

Solid Electrolyte ◽

Scanning Probe ◽

Probe Microscopy ◽

Microscopy Techniques

Nanoscale characterization of CH 3 -terminated Self-Assembled Monolayer on copper by advanced scanning probe microscopy techniques

Applied Surface Science ◽

10.1016/j.apsusc.2015.08.182 ◽

2015 ◽

Vol 356 ◽

pp. 921-926 ◽

Cited By ~ 3

Author(s):

Tobias Berthold ◽

Guenther Benstetter ◽

Werner Frammelsberger ◽

Rosana Rodríguez ◽

Montserrat Nafría

Keyword(s):

Scanning Probe ◽

Self Assembled Monolayer ◽

Probe Microscopy ◽

Self Assembled ◽

Microscopy Techniques

Nanoscale Characterization of an Electron Emitting Tip by Scanning Probe Microscopy

e-Journal of Surface Science and Nanotechnology ◽

10.1380/ejssnt.2014.377 ◽

2014 ◽

Vol 12 (0) ◽

pp. 377-379 ◽

Cited By ~ 3

Author(s):

Norimichi Watanabe ◽

Miyuki Tanaka ◽

Tetsuo Shimizu

Keyword(s):

Scanning Probe ◽

Probe Microscopy ◽

In situ characterization of domain structure and local elasticity in Nb-doped Bi4Ti3O12 ceramics by Scanning Probe Microscopy

Materials Letters ◽

10.1016/j.matlet.2005.01.017 ◽

2005 ◽

Vol 59 (12) ◽

pp. 1538-1541 ◽

Cited By ~ 7

Author(s):

H.F. Yu ◽

H.R. Zeng ◽

L.N. Zhang ◽

R.Q. Chu ◽

G.R. Li ◽

...

Keyword(s):

Domain Structure ◽

Scanning Probe ◽

In Situ Characterization ◽

Probe Microscopy ◽

Bi4ti3o12 Ceramics

Nanoscale Characterization of Nanostructures and Nanodevices by Scanning Probe Microscopy

Micromachines as Tools for Nanotechnology - Microtechnology and MEMS ◽

10.1007/978-3-642-55503-9_8 ◽

2003 ◽

pp. 191-211

Author(s):

Takuji Takahashi

Keyword(s):

Scanning Probe ◽

Probe Microscopy ◽

Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena ◽

Nanoscale characterization of an electron emitting tip by field emission microscopy and scanning probe microscopy

10.1116/1.4930308 ◽

2015 ◽

Vol 33 (5) ◽

pp. 051809 ◽

Cited By ~ 1

Author(s):

Norimichi Watanabe ◽

Miyuki Tanaka ◽

Tetsuo Shimizu

Keyword(s):

Field Emission ◽

Scanning Probe ◽

Probe Microscopy ◽

Field Emission Microscopy ◽

Emission Microscopy

Scanning Probe Microscopy of Silicone Treated Cellulose Fibers: A Comparison of In-Situ, LFM, and Phase Imaging for Characterization of Adsorbed vs. Covalently Bonded Silicone Coatings

Microscopy and Microanalysis ◽

10.1017/s1431927602106660 ◽

2002 ◽

Vol 8 (S02) ◽

pp. 772-773

Author(s):

Julie Teetsov ◽

Matthew Butts ◽

Steven Stoessel ◽

Kathryn Shaffer ◽

Mike Burrell

Keyword(s):

Cellulose Fibers ◽

Scanning Probe ◽

Phase Imaging ◽

Probe Microscopy ◽

Covalently Bonded ◽

Silicone Coatings

Nanoscale characterization of charged/discharged lithium-rich thin film cathode by scanning probe microscopy techniques

Journal of Power Sources ◽

10.1016/j.jpowsour.2017.03.082 ◽

2017 ◽

Vol 352 ◽

pp. 9-17 ◽

Cited By ~ 18

Author(s):

Shan Yang ◽

Jiaxiong Wu ◽

Binggong Yan ◽

Liu Li ◽

Yao Sun ◽

...

Keyword(s):

Thin Film ◽

Scanning Probe ◽

Probe Microscopy ◽

Microscopy Techniques

Nanoscale Characterization of Electronic and Electrical Properties of III-Nitrides by Scanning Probe Microscopy

10.1007/978-0-387-28668-6_26 ◽

2007 ◽

pp. 690-714 ◽

Cited By ~ 1

Author(s):

B. J. Rodriguez ◽

A. Gruverman ◽

R. J. Nemanich

Keyword(s):

Electrical Properties ◽

Scanning Probe ◽

Probe Microscopy ◽