Nanoscale characterization of CH 3 -terminated Self-Assembled Monolayer on copper by advanced scanning probe microscopy techniques

2015 ◽  
Vol 356 ◽  
pp. 921-926 ◽  
Author(s):  
Tobias Berthold ◽  
Guenther Benstetter ◽  
Werner Frammelsberger ◽  
Rosana Rodríguez ◽  
Montserrat Nafría
Keyword(s):  
Scanning Probe Microscopy ◽  
Scanning Probe ◽  
Self Assembled Monolayer ◽  
Probe Microscopy ◽  
Nanoscale Characterization ◽  
Self Assembled ◽  
Microscopy Techniques

scholarly journals Nanoscale Characterization of Silicon-On-Insulator Nanowires by Multimode Scanning Probe Microscopy

2013 ◽  
Vol 38 (2) ◽  
pp. 265-268
Author(s):  
Leonid Bolotov ◽  
Tetsuya Tada ◽  
Yukinori Morita ◽  
Vladimir Poborchii ◽  
Toshihiko Kanayama
Keyword(s):  
Scanning Probe Microscopy ◽  
Silicon On Insulator ◽  
Scanning Probe ◽  
Probe Microscopy ◽  
Nanoscale Characterization
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