The Use of Mn-Kα X-Rays and a New Model of PSPC in Stress Analysis of Stainless Steel

1982 ◽  
Vol 26 ◽  
pp. 209-216 ◽  
Author(s):  
Yasuo Yoshioka ◽  
Ken-ichi Hasegawa ◽  
Koh-ichi Mochiki
Keyword(s):  
Stainless Steel ◽  
Stress Analysis ◽  
High Precision ◽  
Proportional Counter ◽  
Stress Measurement ◽  
X Rays ◽  
New Model ◽  
Major Disadvantage ◽  
Position Sensitive

The authors previously reported stress measurement in stainless steel by the use of monochromatic Cr-Kβ X-rays and a position sensitive proportional counter. Results indicated that a stress value can be obtained with high precision on account of the subtraction of background and the elimination of αFe(211) peak by Cr-Kα X-rays. The major disadvantage of this method, however, is that the intensity of Kβ X-rays monochromatized is essentially weak and it is complicated to eliminate Kα X-rays for practical use.

The Use of Mn-Ka X-Rays and a New Model of PSPC in Stress Analysis of Stainless Steel

1982 ◽  
pp. 209-216
Author(s):  
Yasuo Yoshioka ◽  
Ken-ichi Hasegawa ◽  
Koh-ichi Mochiki
Keyword(s):  
Stainless Steel ◽  
Stress Analysis ◽  
X Rays ◽  
New Model

Use of Cr K-Beta X-Rays and Position Sensitive Detector for Residual Stress Measurement in Stainless Steel Pipe

1978 ◽  
Vol 22 ◽  
pp. 247-249 ◽  
Author(s):  
C. O. Ruud ◽  
C. S. Barrett
Keyword(s):  
Stainless Steel ◽  
Stress Measurement ◽  
Steel Pipe ◽  
X Rays ◽  
University Of Denver ◽  
Stainless Steel Pipe ◽  
Position Sensitive ◽  
The University ◽  
Research Institute

Residual stresses on the inner surface of stainless steel pipe used in nuclear reactors are of exceptional importance. Apparatus for measuring these in situ, in welded lengths of 10-inch diameter austenitic (304) stainless pipe has been developed at the University of Denver Research Institute under the sponsorship of the Electric Power Research Institute.

A Position-Sensitive Proportinal Counter for Residual Stress Measurement by means of Microbeam X-Rays

1979 ◽  
Vol 23 ◽  
pp. 325-330 ◽  
Author(s):  
Yasuo Yoshioka ◽  
Kert-ichi Hasegawa ◽  
Koh-ichi Mochiki
Keyword(s):  
Residual Stress ◽  
Fatigue Crack ◽  
Proportional Counter ◽  
Stress Measurement ◽  
Small Region ◽  
Counting Efficiency ◽  
X Rays ◽  
Low Intensity ◽  
Position Sensitive ◽  
Short Time

AbstractA position-sensitive proportional counter (PSPC) with high counting efficiency has been made for stress analysis with low intensity X-rays such as microbeam X-rays.This PSPC system has made it possible to measure the residual stress in a small region such as a fatigue crack tip in very short time compared with the measurement by standard diffractometer or film methods.

Stress Measurement in Stainless Steel by use of Monochromatic Cr-Kβ X-Rays and a Position Sensitive Detector

1980 ◽  
Vol 24 ◽  
pp. 167-172 ◽  
Author(s):  
Yasuo Yoshioka ◽  
Ken-ichi Hasegawa ◽  
Koh-ichi Mochiki
Keyword(s):  
Residual Stress ◽  
Stainless Steel ◽  
Stress Measurement ◽  
Diffraction Peak ◽  
X Rays ◽  
High Contrast ◽  
Sensitive Detector ◽  
X Ray ◽  
Position Sensitive ◽  
Martensite Structure

X-ray stress analysis in austenltic stainless steel is generally carried out on the ϒFe(311) diffraction line produced by Cr- Kβ X-rays. However, it is often pointed out that not much reliance can be placed on the precision of the stress because the contrast between a diffraction peak and its background is poor. In addition, to measure the stress is sometimes impossible on a specimen which has martensite structure produced by thes train induced transformation, because the ϒFe(211) line appears in the neighborhood of the desired ϒFe(311) line, since Cr-K6 X-rays accompany Cr-Ka from a conventional X-ray source. If Cr-Ka X-rays can be eliminated and only Cr-KB X-rays directed on the specimen, only the λe(311) line with high contrast will be obtained and one can expect to measure the residual stress with high precision.

A new high-resolution small-angle X-ray scattering apparatus using a fine-focus rotating anode, point-focusing collimation and a position-sensitive proportional counter

1984 ◽  
Vol 17 (5) ◽  
pp. 337-343 ◽  
Author(s):  
O. Yoda
Keyword(s):  
High Resolution ◽  
Small Angle ◽  
Proportional Counter ◽  
Anisotropic Scattering ◽  
Photon Flux ◽  
X Rays ◽  
X Ray ◽  
X Ray Scattering ◽  
Position Sensitive ◽  
Ray Scattering

A high-resolution small-angle X-ray scattering camera has been built, which has the following features. (i) The point collimation optics employed allows the scattering cross section of the sample to be directly measured without corrections for desmearing. (ii) A small-angle resolution better than 0.5 mrad is achieved with a camera length of 1.6 m. (iii) A high photon flux of 0.9 photons μs−1 is obtained on the sample with the rotating-anode X-ray generator operated at 40 kV–30 mA. (iv) Incident X-rays are monochromated by a bent quartz crystal, which makes the determination of the incident X-ray intensity simple and unambiguous. (v) By rotation of the position-sensitive proportional counter around the direct beam, anisotropic scattering patterns can be observed without adjusting the sample. Details of the design and performance are presented with some applications.

Study on X-Ray Stress Analysis Using a New Position-Sensitive Proportional Counter

1978 ◽  
Vol 22 ◽  
pp. 233-240 ◽  
Author(s):  
Yasuo Yoshioka ◽  
Ken-ichi Hasegawa ◽  
Koh-ichi Mochiki
Keyword(s):  
Residual Stresses ◽  
Proportional Counter ◽  
Counting Rate ◽  
Angular Resolution ◽  
Stress Measurement ◽  
Over The Counter ◽  
X Ray ◽  
Position Sensitive ◽  
The Mean ◽  
Time Required

A position-sensitive proportional counter suitable for the X-ray stress measurement has been developed and residual stresses were measured with an apparatus that uses this PSD system. The counter was designed to have a good angular resolution over the counter length for the diffracted X-ray beam and high counting rates. The mean angular resolution measured was about 0.2° in 2θ (FWHM) at 200 mm, and the maximum allowable counting rate reached about 40,000 cps.The time required for the data accumulation was shown to be 1/10 to 1/30 of the time required with a standard diffractometer.

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