A Generalized Matrix Correction Approach for Energy-Dispersive X-Ray Fluorescence Analysis of Paint Using Fundamental Parameters and Scattered Silver Kα Peaks

1982 ◽  
pp. 377-384
Author(s):  
Leif Højslet Christensen ◽  
Iver Drabœk
1982 ◽  
Vol 26 ◽  
pp. 377-384
Author(s):  
Leif Højslet Christensen ◽  
Iver Drabæk

AbstractAn energy-dispersive x-ray fluorescence method has been developed for the direct determination of major and minor elements in infinitely thick samples of paint. Matrix absorption and enhancement corrections are iteratively calculated from a knowledge of tabulated fundamental parameters and the unknown weight fractions. An estimate of the significant light element fraction of the bulk sample required for the calculation of matrix attenuation is obtained using the scatter peaks of the silver secondary target. Relative elemental calibration constants and calibration factors for the coherent and incoherent peaks are determined experimentally using either thin-film standards or standards of known total composition. For routine analysis only one absolute standard is required. The method has been applied to different types of paint with a relative standard deviation better than 5% provided the counting statistics are not the limiting factor. The accuracy has been tested by comparing own results with those obtained either from the formulation or from, instrumental neutron activation analysis.


1976 ◽  
Vol 20 ◽  
pp. 515-528 ◽  
Author(s):  
Daniel Laguitton ◽  
Michael Mantler

A comprehensive Fortran IV program designed to perform the matrix correction in x-ray fluorescence analysis is described. Specimens and standards can be in bulk or film form. All necessary fundamental parameters are provided by internal routines thereby requiring a minimum of input data.


2014 ◽  
Vol 29 (2) ◽  
pp. 127-132 ◽  
Author(s):  
Michael Mantler

This paper summarizes an oral presentation of the same title presented at the occasion of recognizing the “The 100th Anniversary of X-ray Spectroscopy” at DXC 2013. It gives an overview of the development in electronics with focus on (mainly) energy-dispersive X-ray detectors and related data processing. Naturally this has its origin in the early transistors and the first semiconductor junction detectors of the late 1940s. It was followed by refinement of semiconductor detector technology in general and particularly by the invention of Li-drifting and employment of low-noise field effect transistors until such devices matured sufficiently to be marketed by the late 1960s. Further improvement followed in resolution, speed, operability at room temperature, and development of junction arrays with imaging capabilities. An important aspect is the development of related software requiring affordable laboratory computers, programming languages, and databases of fundamental parameters. Today x-ray fluorescence analysis (and not only the energy-dispersive variant) is widely employed as an analytical tool for the traditional technical and industrial applications but notably also, at an expanding rate as well as variety, in other fields including environmental, medical, archaeological, space, arts, and many more.


1979 ◽  
Vol 23 ◽  
pp. 71-76
Author(s):  
Peggy Dalheim

The elemental analysis of geologic samples such as rocks, minerals and coal ash is a complicated task because of their wide, complex compositional range. Energy dispersive x-ray fluorescence (EDXRF) can provide a rapid, accurate and precise way of analyzing geologic samples. Two approaches to reducing EDXRF intensity data to elemental concentrations are the empirical approach and the fundamental parameters (theoretical) approach. Empirical methods require numerous standards within restricted compositional ranges so can become complex, time consuming and, therefore, expensive if diverse suites of samples are to be analyzed for many elements. Fundamental parameters, on the other hand, requires knowledge of physical constants such as mass absorption coefficients, jump ratios and fluorescent yields, and only one matrix independent standard to calculate a calibration constant for each element making it an ideal approach to the analysis of diverse geologic samples.


2020 ◽  
Vol 86 (10) ◽  
pp. 5-9
Author(s):  
D. G. Filatova ◽  
A. A. Arkhipenko ◽  
M. A. Statkus ◽  
V. V. Es’kina ◽  
V. B. Baranovskaya ◽  
...  

An approach to sorptive separation of Se (IV) from solutions on a novel S,N-containing sorbent with subsequent determination of the analyte in the sorbent phase by micro-x-ray fluorescence method is presented. The sorbent copolymethylenesulfide-N-alkyl-methylenamine (CMA) was synthesized using «snake in the cage» procedure and proven to be stable in acid solutions. Conditions for quantitative extraction of Se (IV) were determined: sorption in 5 M HCl or 0.05 M HNO3 solutions when heated to 60°C, phase contact time being 1 h. The residual selenium content in the solution was determined by inductively coupled plasma mass spectrometry (ICP-MS) using 82Se isotope. The absence of selenium losses is proved and the mechanism of sorption interaction under specified conditions is proposed. The method of micro-x-ray fluorescence analysis (micro-RFA) with mapping revealed a uniform distribution of selenium on the sorbent surface. The possibility of determining selenium in the sorbent phase by micro-RFA is shown. When comparing the obtained results with the results of calculations by the method of fundamental parameters, it is shown the necessity of using standard samples of sorbates to obtain correct results of RFA determination of selenium in the sorbent phase.


1983 ◽  
Vol 19 (2) ◽  
pp. 201-211 ◽  
Author(s):  
A. B. Cormie ◽  
D. E. Nelson

AbstractThe use of energy-dispersive X-ray fluorescence analysis (XES) for the routine identification of three tephras (Mazama, Bridge River, Mount St. Helens Yn) commonly found in archeological sites in British Columbia has been investigated. Researchers have often assumed that chemical analysis of bulk samples of glass separates would be hampered by contamination and weathering effects. Our results indicate that XES of bulk glass separates provides a very reliable method for rapidly identifying the three tephras in question, even with a very simple sample preparation. This should enable persons not skilled in geology or in tephrochronology to collect and to identify samples of these tephras. Finally, as a part of the study, similar measurements were made on the separated glass portions of these three tephras and of three others (Glacier Peak B and G, White River) from northwest North America. The results suggest that this method may provide tephrochronologists with a useful additional tool for studying tephras in other regions.


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