Lama I - A General Fortrah Program for Quantitative X-ray Fluorescence Analysis

1976 ◽  
Vol 20 ◽  
pp. 515-528 ◽  
Author(s):  
Daniel Laguitton ◽  
Michael Mantler

A comprehensive Fortran IV program designed to perform the matrix correction in x-ray fluorescence analysis is described. Specimens and standards can be in bulk or film form. All necessary fundamental parameters are provided by internal routines thereby requiring a minimum of input data.

2020 ◽  
Vol 86 (10) ◽  
pp. 5-9
Author(s):  
D. G. Filatova ◽  
A. A. Arkhipenko ◽  
M. A. Statkus ◽  
V. V. Es’kina ◽  
V. B. Baranovskaya ◽  
...  

An approach to sorptive separation of Se (IV) from solutions on a novel S,N-containing sorbent with subsequent determination of the analyte in the sorbent phase by micro-x-ray fluorescence method is presented. The sorbent copolymethylenesulfide-N-alkyl-methylenamine (CMA) was synthesized using «snake in the cage» procedure and proven to be stable in acid solutions. Conditions for quantitative extraction of Se (IV) were determined: sorption in 5 M HCl or 0.05 M HNO3 solutions when heated to 60°C, phase contact time being 1 h. The residual selenium content in the solution was determined by inductively coupled plasma mass spectrometry (ICP-MS) using 82Se isotope. The absence of selenium losses is proved and the mechanism of sorption interaction under specified conditions is proposed. The method of micro-x-ray fluorescence analysis (micro-RFA) with mapping revealed a uniform distribution of selenium on the sorbent surface. The possibility of determining selenium in the sorbent phase by micro-RFA is shown. When comparing the obtained results with the results of calculations by the method of fundamental parameters, it is shown the necessity of using standard samples of sorbates to obtain correct results of RFA determination of selenium in the sorbent phase.


2021 ◽  
Vol 27 (1) ◽  
pp. 74-89
Author(s):  
Nicholas W.M. Ritchie

AbstractThis, the second in a series of articles present a new framework for considering the computation of uncertainty in electron excited X-ray microanalysis measurements, will discuss matrix correction. The framework presented in the first article will be applied to the matrix correction model called “Pouchou and Pichoir's Simplified Model” or simply “XPP.” This uncertainty calculation will consider the influence of beam energy, take-off angle, mass absorption coefficient, surface roughness, and other parameters. Since uncertainty calculations and measurement optimization are so intimately related, it also provides a starting point for optimizing accuracy through choice of measurement design.


2021 ◽  
pp. 124-131
Author(s):  
A.V. Alekseev ◽  
◽  
G.V. Orlov ◽  
P.S. Petrov ◽  
A.V. Slavin ◽  
...  

The determination of the elements Cu, Ni, Sb, Bi, Pb, Zn and Fe in the tin-based solder VPr35, as well as the elements Sn, Ni, Sb, Bi and In in the lead-based VPr40 solder by the method of х-ray fluorescence spectroscopy has been carried out. The calibration dependences are corrected taking into account the superposition of signals from interfering elements on the analytical signal and changes in intensity caused by inter-element influences in the matrix. The analysis was carried out by the method of fundamental parameters without using standard samples. The correctness of the results obtained was confirmed by their comparative analysis by atomic emission spectroscopy and high-resolution mass spectrometry with a glow discharge.


1991 ◽  
Vol 35 (B) ◽  
pp. 749-754
Author(s):  
V. I. Karmanov ◽  
V. V. Zagorodny

AbstractThe fundamental parameters method (FPM) enables one to determine with high accuracy the chemical composition of homogeneous samples, having only one reference sample. However, the reference sample composition should be similar to that of the samples analyzed.The x-ray fluorescence analysis of multicomponent heterogeneous materials (ores, minerals, their mixtures, welding electrode coating mixtures, fluxes, etc.) is made by the Δμ-correction method based on the combined use of the fundamental and empirical correlations maintaining all the advantages of the FPM. Sample composition is calculated on the basis of the element intensities measured in the sample and in the reference specimen and is corrected for the disturbing effect of excitation conditions and heterogeneity as well as the calculated values of one of the fundamental parameters (μ1). At the preliminary stage of calibration, the coefficients are determined using regression and the absolute fundamental expression for the element fluorescence intensity.


1991 ◽  
Vol 35 (B) ◽  
pp. 737-742
Author(s):  
V. I. Smolniakov

AbstractSome x-ray fluorescence - concentration relationships in the framework of XRF were researched. Fundamental calculation approaches for primary fluorescence and incoherent scattering were realized for evaluation of matrix influence. A new binary approach was produced for the cases considered, and its unification was related to the empirical and regression types of the “standard background” technique, widely used in the analytical practice of XRF. It is confirmed that application of the calculations by fundamental parameters (FP) in combination with the empirical approach allows the reduction of the set of standards (to as few as one) in the analysis procedure with wide variations in matrices and concentrations, without loss of accuracy.


1991 ◽  
Vol 35 (B) ◽  
pp. 1205-1209
Author(s):  
I. A. Kondurov ◽  
P. A. Sushkov ◽  
T. M. Tjukavina ◽  
G. I. Shulyak

In multielement EDXRF analysis of very complex unknowns, some problems in data evaluation may be simplified if one can take into account a priori information on the properties of the incident and detected radiations, and also available data on the matrix of the sample. The number of variables can be drastically shortened in the LSM procedures in this case. One of the best examples of complex unknowns is the determination of the rare earth element content of ores, and most recently in samples of high temperature superconductors (HiTc).


1968 ◽  
Vol 12 ◽  
pp. 546-562
Author(s):  
R. Tertian

AbstractThe double dilution method has many important advantages. For any element to be determined, let us say A, It enables us to control or calculate the matrix factor (sum of the absorption end enhancement effects) for the sample being Investigated towards A radiation, and it furnishes corrected Intensities which are strictly proportional to A concentration. Thus the results are exact, whatever the general composition of the sample, their accuracy depending only on the quality of measurement and preparation. Another major practical advantage is that the method does not require systematic calibration but only a few permanent standards consisting of a pure compound or of an accurately known sample.The procedure has been tested successfully for accurate determination of rare earth elements using, for solid materials such as ores and oxide mixtures, the borax fusion technique. It also can be readily applied to liquids. All the rare earth elements can be titrated by that method, as well as yttrium, thorium and, if necessary, all the elements relevant to X-ray fluorescence analysis. The concentration range considered for solids is of one comprised between 0.5 and 100 % and, with a lesser accuracy, between 0.1 and 0-5 % Examples are given relative to the analysis of various ores. Finally it rcust be pointed out that the method is universal and applies to the analysis of every solid, especially ores, provided that they can be converted to solid or liquid solutions. It appears that most industrial analyses can be worked on In this way.


1979 ◽  
Vol 23 ◽  
pp. 93-97 ◽  
Author(s):  
J. W. Criss

Fundamental-parameters calculations can be made on a laboratory microcomputer fo r automatic treatment of interelement absorption and enhancement effects in x-ray fluorescence analysis. A new software package, called XRF-11, uses an efficient combination of fundamental parameters and alpha factors to compensate for any lack of measured reference materials, while taking full advantage of whatever standards are available, even just pure elements. In many cases, one multi-element standard is enough for accurate analysis.The new XRF-11 software uses the same data base of absorption coefficients, fluorescence yields, etc. as the big-computer program NRLXRF, and combines theory with experiment in a consis tent way that is similar to, but more efficient than, the treatment used in NRLXRF.


1984 ◽  
Vol 28 ◽  
pp. 203-208
Author(s):  
Jim Parker

The use of diatomaceous earth in industry as filtering aids, mineral fillers, catalyst carriers, chromatographic supports, and paint additives is well documented. The diatomite matrix is well suited to x-ray analysis, but this application has not been cited in the literature. In our laboratory, x-ray fluorescence spectrometry has been used to support the analytical needs of diatomite product development. Lithium borate fusion and pressed powder techniques have been used to determine major, minor, and trace elements in diatomite and synthetic silicate samples. Conventional matrix correction models and fundamental parameters have been used to reduce x-ray measurements to accurate chemical analyses.


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