Advances in X-Ray Analysis
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TOTAL DOCUMENTS

63

(FIVE YEARS 0)

H-INDEX

3

(FIVE YEARS 0)

Published By Springer US

9781461337294, 9781461337270

Latest Documents Most Cited Documents Contributed Authors Related Sources Related Keywords

Elemental Analysis of Geological Samples Using a Multichannel, Simultaneous X-Ray Spectrometer

Advances in X-Ray Analysis ◽

10.1007/978-1-4613-3727-0_62 ◽

1982 ◽

pp. 451-456

Author(s):

J. B. Cross ◽

L. V. Wilson

Keyword(s):

Elemental Analysis ◽

Geological Samples ◽

X Ray

Precision and Reproducibility of Lattice Parameters from Guinier Powder Patterns: Follow-Up and Assessment

Advances in X-Ray Analysis ◽

10.1007/978-1-4613-3727-0_6 ◽

1982 ◽

pp. 53-62 ◽

Cited By ~ 1

Author(s):

A. Brown ◽

C. M. Foris

Keyword(s):

Lattice Parameters

FPT: An Integrated Fundamental Parameters Program for Broadband EDXRF Analysis without a Set of Similar Standards

Advances in X-Ray Analysis ◽

10.1007/978-1-4613-3727-0_49 ◽

1982 ◽

pp. 355-368 ◽

Cited By ~ 6

Author(s):

D. A. Gedcke ◽

L. G. Byars ◽

N. C. Jacobus

Keyword(s):

Fundamental Parameters ◽

Edxrf Analysis

A New Technique for Radioisotope-Excited X-Ray Fluorescence

Advances in X-Ray Analysis ◽

10.1007/978-1-4613-3727-0_45 ◽

1982 ◽

pp. 337-340

Author(s):

J. J. LaBrecque ◽

W. C. Parker

Keyword(s):

New Technique ◽

X Ray ◽

A New Technique

Energy Resolution Measurements of Mercuric Iodide Detectors Using a Cooled Fet Preamplifier

Advances in X-Ray Analysis ◽

10.1007/978-1-4613-3727-0_43 ◽

1982 ◽

pp. 325-330 ◽

Cited By ~ 3

Author(s):

Lawrence Ames ◽

William Drummond ◽

Jan Iwanczyk ◽

Andrzej Dabrowski

Keyword(s):

Energy Resolution ◽

Mercuric Iodide

X-Ray Diffraction Study of Shape Memory in Uranium-Niobium Alloys

Advances in X-Ray Analysis ◽

10.1007/978-1-4613-3727-0_41 ◽

1982 ◽

pp. 307-312

Author(s):

D. A. Carpenter ◽

R. A. Vandermeer

Keyword(s):

Shape Memory ◽

Diffraction Study ◽

X Ray Diffraction ◽

Niobium Alloys ◽

X Ray

X-Ray Diffraction Observation of Fracture Surfaces of Ductile Cast Iron

Advances in X-Ray Analysis ◽

10.1007/978-1-4613-3727-0_39 ◽

1982 ◽

pp. 291-298

Author(s):

Zenjiro Yajima ◽

Yukio Hirose ◽

Keisuke Tanaka

Keyword(s):

Cast Iron ◽

Ductile Cast Iron ◽

X Ray Diffraction ◽

X Ray ◽

Fracture Surfaces

Direct Determination of Stress in a Thin Film Deposited On a Single-Crystal Substrate from an X-Ray Topographic Image

Advances in X-Ray Analysis ◽

10.1007/978-1-4613-3727-0_34 ◽

1982 ◽

pp. 255-258 ◽

Cited By ~ 1

Author(s):

Wayne S. Berry

Keyword(s):

Thin Film ◽

Single Crystal ◽

Direct Determination ◽

Single Crystal Substrate ◽

Topographic Image ◽

X Ray ◽

Crystal Substrate

On The X-Ray Diffraction Method of Measurement of Triaxial Stresses with Particular Reference to the Angle 2θo

Advances in X-Ray Analysis ◽

10.1007/978-1-4613-3727-0_33 ◽

1982 ◽

pp. 245-253

Author(s):

S. Torbaty ◽

J. M. Sprauel ◽

G. Maeder ◽

P. H. Markho

Keyword(s):

Diffraction Method ◽

X Ray Diffraction ◽

X Ray ◽

Triaxial Stresses ◽

Method Of Measurement

Application of a Position Sensitive Scintillation Detector for Nondestructive Residual Stress Measurements inside Stainless Steel Piping

Advances in X-Ray Analysis ◽

10.1007/978-1-4613-3727-0_32 ◽

1982 ◽

pp. 233-243

Author(s):

C. O. Ruud ◽

P. S. DiMascio ◽

D. M. Melcher

Keyword(s):

Residual Stress ◽

Stainless Steel ◽

Scintillation Detector ◽

Stress Measurements ◽

Position Sensitive ◽

Steel Piping