Physical Vapor Transport of CuPc Organic Thin Films in High Gravity

2001 ◽  
pp. 99-106 ◽  
Author(s):  
Khasan Karimov ◽  
Stefano Bellingeri ◽  
Yoshiyuki Abe
Keyword(s):  
Thin Films ◽  
Organic Thin Films ◽  
Vapor Transport ◽  
Physical Vapor Transport ◽  
High Gravity

On Physical Vapor Deposition of CuPc Organic Thin Films in High Gravity

2008 ◽  
Author(s):  
Kh. S. Karimov ◽  
S. Bellingeri ◽  
B. F. Irgaziev ◽  
I. Qazi ◽  
T. A. Khan ◽  
...  
Keyword(s):  
Thin Films ◽  
Vapor Deposition ◽  
Physical Vapor Deposition ◽  
Organic Thin Films ◽  
High Gravity

scholarly journals Vapor transport of organic thin films in microgravity and unit gravity

2000 ◽  
Vol 56 (s1) ◽  
pp. s228-s228
Author(s):  
M. Ittu Zugrav ◽  
W. E. Carswell ◽  
G. B. Haulenbeek ◽  
F. C. Wessling
Keyword(s):  
Thin Films ◽  
Organic Thin Films ◽  
Vapor Transport

X-Ray Topographic Studies of Defects in PVT 6H-SiC Substrates and Epitaxial 6H-SiC Thin Films

1994 ◽  
Vol 339 ◽  
Author(s):  
S. Wang ◽  
M. Dudley ◽  
C. H. Carter ◽  
H. S. Kong
Keyword(s):  
Thin Films ◽  
Basal Plane ◽  
Vapor Transport ◽  
Physical Vapor Transport ◽  
Epitaxial Thin Films ◽  
Defect Structures ◽  
Screw Dislocations ◽  
X Ray ◽  
Back Reflection ◽  
White Beam

ABSTRACTSynchrotron white beam X-ray topography has been used to characterize defect structures in (0001) 6H-SiC substrates grown by the sublimation physical vapor transport (PVT) technique as well as in 6H-SiC epitaxial thin films grown on these substrates. Defects revealed in 6H-SiC substrates include super screw dislocations and basal plane dislocations. It has been found that back-reflection topographs are particularly suitable for imaging such super screw dislocations as well as basal plane dislocations whenever transmission topography is not applicable. Epitaxial 6H-SiC thin films grown on such (0001) substrates (tilted a few degrees towards the a-axis) were also examined by using surface sensitive grazing Bragg-Laue topography. It has been shown that super screw dislocations were replicated in the epitaxial thin films but no basal plane dislocations were revealed in the thin films. Results from various topographic techniques are discussed.

Characterization of facial and meridional Alq3 thin films fabricated from physical vapor transport at high substrate temperatures

2015 ◽  
Vol 154 ◽  
pp. 100-106 ◽  
Author(s):  
Shang-Yu Hung ◽  
Ruei-Lin Kao ◽  
Ku-Yen Lin ◽  
Chun-Chuen Yang ◽  
Kuen-Song Lin ◽  
...  
Keyword(s):  
Thin Films ◽  
Vapor Transport ◽  
Physical Vapor Transport ◽  
High Substrate ◽  
Substrate Temperatures

The effects of metallic contacts on the lasing characteristics of organic thin films

2020 ◽  
Vol 13 (4) ◽  
pp. 866-872
Author(s):  
HAO Ya-ru ◽  
◽  
◽  
DENG Zhao-qi
Keyword(s):  
Thin Films ◽  
Organic Thin Films ◽  
Metallic Contacts

Knoop Hardness on the (0001) Plane of 4H and 6H SiC Single Crystals Fabricated by Physical Vapor Transport

2014 ◽  
Author(s):  
Jeffrey J. Swab ◽  
James W. McCauley ◽  
Brady Butler ◽  
Daniel Snoha ◽  
Donovan Harris ◽  
...  
Keyword(s):  
Single Crystals ◽  
Knoop Hardness ◽  
Vapor Transport ◽  
Physical Vapor Transport
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