Satellite X-Ray Lines and KLL Auger Electrons from Fluorine Compounds

ABSTRACTOptical and photoelectron spectroscopies using VUV and Soft X-ray photons are powerful tools for studies of elemental and compound actinides. Large changes in the relative atomic cross sections of the 5f, 6d and sp electrons allow decomposition of the character of the valence bands using photoemission. Resonant enhancement of photoelectrons and Auger electrons at the 5d core threshold further aids the decomposition and gives a measure of elemental specificity. Angle-resolved photoemission can be used to map the momentum dependence of the electronic states. The large changes in relative cross section with photon energy yields further details when the mapping is done at equivalent points in multiple zones. Spectra for well understood rare earth materials will be presented to establish spectral characteristics for known atomic character initial states. These signatures will be applied to the case of USb to investigate f-d hybridization near the Fermi level.

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Energy Spectra of Photo- and Auger Electrons Generated by a Soft X-Ray Laser and Xe Cluster Interaction

Springer Proceedings in Physics - X-Ray Lasers 2010 ◽

10.1007/978-94-007-1186-0_34 ◽

2011 ◽

pp. 307-311

Author(s):

S. Namba ◽

N. Hasegawa ◽

M. Kishimoto ◽

M. Nishikino ◽

T. Kawachi

Keyword(s):

Energy Spectra ◽

Auger Electrons ◽

X Ray ◽

Cluster Interaction

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Structural Characterization of Thin Metal Overlayers by X-ray Photoelectron and Auger-Electron Forward Scattering

MRS Proceedings ◽

10.1557/proc-83-189 ◽

1986 ◽

Vol 83 ◽

Cited By ~ 9

Author(s):

W. F. Egelhoff

Keyword(s):

Ultrathin Films ◽

Surface Segregation ◽

Metal Films ◽

Epitaxial Films ◽

Forward Scattering ◽

Crystalline Lattice ◽

Auger Electrons ◽

X Ray ◽

Metal Overlayers

ABSTRACTForward scattering of XPS and Auger electrons by atoms in a crystalline lattice produce beams of enhanced intensity radiating out from the surface at angles corresponding to the internuclear axes present in the top few atomic layers. This effect has been applied to analyze the mechanism of surface segregation in ultrathin metal films, to analyze the interdiffusion at the interfaces of ultrathin films, and to assess the effects of substrate contamination on the growth of epitaxial films. The systems studied in this work are Cu, Ni, and Co on Ni(100), however the purpose of this work is not to investigate these particular systems but to use them to illustrate the capabilities of forward scattering.

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THE EFFECTS OF X-RAY-INDUCED AUGER ELECTRONS IN AUGER MICROANALYSIS

Le Journal de Physique Colloques ◽

10.1051/jphyscol:1984276 ◽

1984 ◽

Vol 45 (C2) ◽

pp. C2-337-C2-340

Author(s):

J. Cazaux ◽

D. Gramari ◽

S. Moutou ◽

A. G. Nassiopoulos

Keyword(s):

Auger Electrons ◽

X Ray

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Developments in Scanning Auger Microscopy

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100070059 ◽

1978 ◽

Vol 36 (3) ◽

pp. 280-291

Author(s):

J.A. Venables ◽

A.P. Janssen

Keyword(s):

Auger Electron ◽

Light Element ◽

Mean Free Path ◽

Element Analysis ◽

Auger Electrons ◽

X Ray ◽

Atomic Relaxation ◽

Auger Microscopy ◽

Energy Processes ◽

Inelastic Mean Free Path

In the last decade, Auger Electron Spectroscopy (AES) has become a standard tool of surface physics and chemistry. Under electron bombardment, atoms emit Auger electrons having characteristic energies, so that the atomic species present can be identified after the manner of X-ray spectroscopy. AES is complementary to X-ray spectroscopy in several ways. First, it is much more surface sensitive, since the inelastic mean free path for Auger electrons, whose energies are typically in the range 50 - 1500 eV, is ~ lnm. Second, atomic relaxation following the primary ionization results in either an X-ray or an Auger electron. Auger emission is dominant for low energy processes, so that AES is relatively more favourable for light element analysis than X-ray spectroscopy.

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A Universal Predictive Equation for the Inelastic Mean Free Pathlengths of X-ray Photoelectrons and Auger Electrons

Surface and Interface Analysis ◽

10.1002/(sici)1096-9918(199601)24:1<38::aid-sia84>3.0.co;2-h ◽

1996 ◽

Vol 24 (1) ◽

pp. 38-50 ◽

Cited By ~ 146

Author(s):

W. H. Gries

Keyword(s):

Predictive Equation ◽

Auger Electrons ◽

X Ray

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Electron Spectroscopy for Studying Chemical Bonding

Advances in X-ray Analysis ◽

10.1154/s0376030800011472 ◽

1969 ◽

Vol 13 ◽

pp. 390-405 ◽

Cited By ~ 2

Author(s):

Ragnar Nordberg

Keyword(s):

High Resolution ◽

Chemical Bonding ◽

Electron Spectroscopy ◽

Incident Radiation ◽

X Rays ◽

Auger Electrons ◽

Precise Information ◽

X Ray ◽

Resolution Electron ◽

Vanderbilt University

The results reviewed in this article were obtained by means of the ESCA technique at the Institute of Physics, University of Uppsala, Uppsala, Sweden and at the Department of Physics, Vanderbilt University, Nashville, Tennessee, USA.The ESCA technique is basically the study of induced emission of photo and Auger electrons from a sample irradiated with x-rays. If the incident radiation is monochromatic (e.g. an x-ray emission line) the spectrum of these electrons gives precise information about the energy states of the electrons in the sample. To extract this information, high resolution electron spectroscopy is necessary. Instruments for such spectroscopy have therefore been extensively developed during the last decade.

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Effects of Photoelectrons and Auger Electrons on Contrast and Resolution in X-Ray Lithography

Japanese Journal of Applied Physics ◽

10.1143/jjap.21.l52 ◽

1982 ◽

Vol 21 (Part 2, No. 1) ◽

pp. L52-L54 ◽

Cited By ~ 5

Author(s):

Yasunao Saitoh ◽

Hideo Yoshihara ◽

Iwao Watanabe

Keyword(s):

Auger Electrons ◽

X Ray

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Plasmon Satellites in Auger Spectra

Canadian Journal of Physics ◽

10.1139/p74-086 ◽

1974 ◽

Vol 52 (7) ◽

pp. 624-638 ◽

Cited By ~ 9

Author(s):

T. McMullen ◽

B. Bergersen

Keyword(s):

Perturbation Expansion ◽

Core Hole ◽

Auger Electrons ◽

Fast Electrons ◽

X Ray ◽

Soluble Model ◽

Bulk Plasmon ◽

Initial Excitation ◽

Auger Spectra ◽

Limiting Case

A theory of Auger spectra in light metals, in which a nonequilibrium formalism is used to handle the aspects of the problem associated with energy loss of the fast electrons and decay of the excited core hole, is presented. The Auger electrons are assumed to reach the surface a time τ after the initial excitation. This time is determined by the decay characteristics of the initial core hole, the geometry, and the velocity of the Auger electrons. After τ, it is assumed that no interactions occur. Electron gas correlations are approximated by a bulk plasmon model. The initial excitation may be due to either X-ray or electron bombardment, although we concentrate on the former. Plasmon production by the primary ejected electrons and the suddenly created core hole is considered. The formalism is based on a perturbation expansion in the electron–plasmon interaction after extraction of the energy shifts, and this procedure is justified by comparison with a simple soluble model. It is applied to third-row (K; LL) Auger transitions. The plasmon gain satellite is compared to the main line, and the entire spectrum is computed in detail for the limiting case of a long lived core hole.

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