Accurate Structural Characterization of ZrN Coatings and Epitaxial Layers by X-Ray Diffraction Using the DOSOPHATEX System
1991 ◽
pp. 1-8
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Keyword(s):
2005 ◽
Vol 66
(1)
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pp. 81-90
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2012 ◽
Vol 190
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pp. 24-28
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