There has been an increase in awareness in low voltage scanning electron microscopy (LVSEM) of polymers in recent years because not only is it possible to use uncoated or very lightly coated (1-5nm) polymer samples but also due to an inherent advantage of limited beam damage of polymer samples by low energy beams. A steady increase in the use of low accelerating voltages for characterizing polymers has been made possible due to some major developments, such as high brightness field emission source, better lens and column design to minimize lens aberrations, and newer and improved detector systems with higher collection efficiency, incorporated by instrument manufacturers in their newer commercial models in recent years. Although there is still room for further improvements, the described instrumental changes have made possible the appreciation of LVSEM in characterization of polymers and non-conducting, beam sensitive materials.